Prof Colin Humphreys

Colin Humphreys
School of Engineering and Materials Science
Queen Mary University of London

Publications

solid heart iconPublications of specific relevance to the Centre for Sustainable Engineering

2024

Relevant PublicationMemristors with Monolayer Graphene Electrodes Grown Directly on Sapphire Wafers
Weng Z, Wingfield B, Evans P, Baginski P, Kainth J, Nikolaenko A, Lee LY, Baginska J, Gillin W, Guiney I, Humphreys C and Fenwick O
Acs Applied Electronic Materials, American Chemical Society 
16-09-2024

2023

Relevant PublicationWafer-scale transfer-free graphene as an ITO replacement for OLEDs
Weng Z, Dixon S, Lee LY, Humphreys CJ, Guiney I, Fenwick O and Gillin WP
2023 IEEE Nanotechnology Materials and Devices Conference (NMDC). vol. 00, 94-95.  
25-10-2023

2022

bullet iconFrom John Spence's Postdoc Time in Oxford to my Research on GaN and Graphene
Humphreys C
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 28 (S1), 2736-2737.  
01-08-2022
Relevant PublicationGraphene on silicon: Effects of the silicon surface orientation on the work function and carrier density of graphene
Sun YW, Holec D, Gehringer D, Li L, Fenwick O, Dunstan DJ and Humphreys CJ
Physical Review B, American Physical Society vol. 105 (16) 
13-04-2022
Relevant PublicationWafer‐Scale Graphene Anodes Replace Indium Tin Oxide in Organic Light‐Emitting Diodes (Advanced Optical Materials 3/2022)
Weng Z, Dixon SC, Lee LY, Humphreys CJ, Guiney I, Fenwick O and Gillin WP
Advanced Optical Materials vol. 10 (3), 2270012-2270012.  
05-02-2022
bullet iconElectron beam damage in titanium dioxide films
Saifullah MSM, Boothroyd CB, Botton GA and Humphreys CJ
 
05-01-2022
bullet icon‘Nano-machining’ using a focused ion beam
Campbell LCI, Foord DT and Humphreys CJ
 
05-01-2022
bullet iconModelling of electron energy-loss spectroscopy detection limits
Natusch MKH, Botton GA, Humphreys CJ and Krivanek OL
 
05-01-2022
bullet iconMartensitic transformation and characterisation of the structure of a NiAl - Ni3Al alloy
Pekarskaya E, Botton GA, Jones CN and Humphreys CJ
 
05-01-2022
bullet iconElectron microscopy and analysis: the future
Humphreys C
 
05-01-2022
bullet iconQuantification of the composition of silicon germanium / silicon structures by high-angle annular dark field imaging
Walther T and Humphreys CJ
 
05-01-2022
bullet iconObservation of the mixed dynamic form factor in the Ag M4,5-edge
Hölzl M, Bottond GA, Nelhiebel M, Humphreys CJ, Jouffrey B, Grogger W, Hofer F and Schattschneider P
 
05-01-2022
Relevant PublicationSignificant interlayer coupling in bilayer graphene and double-walled carbon nanotubes: A refinement of obtaining strain in low-dimensional materials
Sun YW, Gehringer D, Holec D, Papageorgiou DG, Fenwick O, Qureshi SM, Humphreys CJ and Dunstan DJ
Physical Review B, American Physical Society vol. 105 (2) 
05-01-2022
bullet iconThe relationship between epitaxial growth, defect microstructure and luminescence in GaN
Tricker DM, Brown PD, Xin Y, Cheng TS, Foxon CT and Humphreys CJ
In Electron Microscopy and Analysis 1997, Taylor & Francis 429-432.  
05-01-2022

2021

Relevant PublicationWafer‐Scale Graphene Anodes Replace Indium Tin Oxide in Organic Light‐Emitting Diodes
Weng Z, Dixon SC, Lee LY, Humphreys CJ, Guiney I, Fenwick O and Gillin WP
Advanced Optical Materials, Wiley, 2101675-2101675.  
20-12-2021
bullet iconX-ray characterisation of the basal stacking fault densities of (112̄2) GaN
Pristovsek M, Frentrup M, Zhu T, Kusch G and Humphreys CJ
Crystengcomm, Royal Society of Chemistry vol. 23 (35), 6059-6069.  
03-08-2021
bullet iconMechanical Properties of Graphene
Sun YW, Papageorgiou D, Puech P, Proctor JE, Machon D, Bousige C, San-Miguel A, Humphreys C and Dunstan DJ
Applied Physics Reviews, Aip Publishing 
19-04-2021
bullet iconErratum: Unexpected softness of bilayer graphene and softening of A-A stacked graphene layers [Phys. Rev. B 101, 125421 (2020)]
Sun YW, Holec D, Gehringer D, Fenwick O, Dunstan DJ and Humphreys CJ
Physical Review B vol. 103 (11), 119901-119901.  
01-03-2021
bullet iconHeteroepitaxial strains and interface structure of Ge–Si alloy layers on Si (100)
Kvam EP, Eaglesham DJ, Humphreys CJ, Maher DM, Bean JC and Eraser HL
In Microscopy of Semiconducting Materials, 1987, Taylor & Francis 165-168.  
31-01-2021

2020

bullet iconNanomechanics of Graphene Oxide-bacteriophage based Self-assembled Porous Composites
Sun Y, Passaretti P, Hernandez I, Gonzalez J, Rodriguez F, Liu W, Dunstan DJ, Oppenheimer PG and Humphreys CJ
Scientific Reports, Nature Publishing Group vol. 10 
24-09-2020
Relevant PublicationSolution-Processed Epitaxial Growth of Arbitrary Surface Nanopatterns on Hybrid Perovskite Monocrystalline Thin Films.
Zhang J, Guo Q, Li X, Li C, Wu K, Abrahams I, Yan H, Knight MM, Humphreys CJ and Su L
Acs Nano, American Chemical Society 
27-08-2020
bullet iconAu-free recessed Ohmic contacts to AlGaN/GaN high electron mobility transistor: Study of etch chemistry and metal scheme
S N, Guiney I, Humphreys CJ, Sen P, Muralidharan R and Nath DN
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, American Vacuum Society vol. 38 (3) 
09-04-2020
Relevant PublicationUnexpected softness of bilayer graphene and softening of A-A stacked graphene layers
Sun Y, Holec D, Gehringer D, Fenwick O, Dunstan D and Humphreys C
Physical Review B: Condensed Matter and Materials Physics, American Physical Society vol. 101 
20-03-2020
bullet iconDetermination of carrier concentration and quantum efficiency in InGaN/GaN quantum wells using photomodulated reflectivity (Conference Presentation)
Halsall MP, Crowe I, Oliver R, Kappers MJ and Humphreys CJ
Gallium Nitride Materials and Devices XV
10-03-2020

2019

bullet iconA Novel Technique to Investigate the Role of Traps in the Off‐State Performance of AlGaN/GaN High Electron Mobility Transistor on Si Using Substrate Bias
Remesh N, Kumar S, Guiney I, Humphreys CJ, Raghavan S, Muralidharan R and Nath DN
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 217 (7) 
29-12-2019
bullet iconInGaN as a substrate for AC photoelectrochemical imaging
Zhou B, Das A, Kappers M, Oliver R, Humphreys C and Krause S
Sensors, Mdpi 
11-10-2019
bullet iconEffect of Size on the Luminescent Efficiency of Perovskite Nanocrystals
Griffiths JT, Rivarola FWR, Davis NJLK, Ahumada-Lazo R, Alanis JA, Parkinson P, Binks DJ, Fu WY, De La Pena F, Price MB, Howkins A, Boyd I, Humphreys CJ, Greenham NC and Ducati C
Acs Applied Energy Materials, American Chemical Society (Acs) vol. 2 (10), 6998-7004.  
07-10-2019
bullet icon3D strain in 2D materials: to what extent is monolayer graphene graphite?
Sun YW, Liu W, Hernandez I, Gonzalez J, Rodriguez F, Dunstan DJ and Humphreys C
Physical Review Letters, American Physical Society vol. 123, 135501-135501.  
25-09-2019
bullet iconInsight into the impact of atomic- and nano-scale indium distributions on the optical properties of InGaN/GaN quantum well structures grown on m-plane freestanding GaN substrates
Tang F, Zhu T, Fu W-Y, Oehler F, Zhang S, Griffiths JT, Humphreys C, Martin TL, Bagot PAJ, Moody MP, Patra SK, Schulz S, Dawson P, Church S, Jacobs J and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 125 (22) 
11-06-2019
bullet iconOptical and structural properties of dislocations in InGaN
Massabuau FC-P, Horton MK, Pearce E, Hammersley S, Chen P, Zielinski MS, Weatherley TFK, Divitini G, Edwards PR, Kappers MJ, McAleese C, Moram MA, Humphreys CJ, Dawson P and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 125 (16) 
23-04-2019
bullet iconOptical properties of c-Plane InGaN/GaN single quantum wells as a function of total electric field strength
Christian GM, Schulz S, Hammersley S, Kappers MJ, Frentrup M, Humphreys CJ, Oliver RA and Dawson P
Japanese Journal of Applied Physics vol. 58 
23-04-2019
bullet iconEffect of humidity on the interlayer interaction of bilayer graphene
Qadir A, Sun YW, Liu W, Oppenheimer PG, Xu Y, Humphreys CJ and Dunstan DJ
Physical Review B vol. 99 (4) 
02-01-2019

2018

bullet iconVertical Current Transport in AlGaN/GaN HEMTs on Silicon: Experimental Investigation and Analytical Model
Remesh N, Mohan N, Kumar S, Prabhu S, Guiney I, Humphreys CJ, Raghavan S, Muralidharan R and Nath DN
Ieee Transactions On Electron Devices, Institute of Electrical and Electronics Engineers (Ieee) vol. 66 (1), 613-618.  
07-12-2018
bullet iconWhat is red? On the chromaticity of orange-red InGaN/GaN based LEDs
Robin Y, Pristovsek M, Amano H, Oehler F, Oliver RA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 124 (18) 
09-11-2018
bullet iconPhotomodulated Reflectivity Measurement of Free-Carrier Dynamics in InGaN/GaN Quantum Wells
Halsall MP, Crowe IF, Mullins J, Oliver RA, Kappers MJ and Humphreys CJ
Acs Photonics, American Chemical Society (Acs) vol. 5 (11), 4437-4446.  
17-10-2018
bullet iconRecombination from polar InGaN/GaN quantum well structures at high excitation carrier densities
Christian GM, Schulz S, Kappers MJ, Humphreys CJ, Oliver RA and Dawson P
Physical Review B, American Physical Society (Aps) vol. 98 (15) 
01-10-2018
bullet iconEffects of a Si-doped InGaN Underlayer on the Optical Properties of InGaN/GaN Quantum Well Structures with Different Numbers of Quantum Wells
Christian G, Kappers M, Massabuau F, Humphreys C, Oliver R and Dawson P
Materials, Mdpi vol. 11 (9) 
15-09-2018
bullet iconEffect of growth temperature and V/III-ratio on the surface morphology of MOVPE-grown cubic zincblende GaN
Lee LY, Frentrup M, Kappers MJ, Oliver RA, Humphreys CJ and Wallis DJ
Journal of Applied Physics, Aip Publishing vol. 124 (10) 
11-09-2018
bullet iconVertical leakage mechanism in GaN on Si high electron mobility transistor buffer layers
Choi FS, Griffiths JT, Ren C, Lee KB, Zaidi ZH, Houston PA, Guiney I, Humphreys CJ, Oliver RA and Wallis DJ
Journal of Applied Physics, Aip Publishing vol. 124 (5) 
03-08-2018
bullet iconResponse to letter from Wayne Osborn
Humphreys C and Waddington G
Astronomy and Geophysics vol. 59 (4) 
01-08-2018
bullet iconAtomic Resolution Imaging of Dislocations in AlGaN and the Efficiency of UV LEDs
Humphreys CJ, Massabuau FC-P, Rhode SL, Horton MK, O’Hanlon TJ, Kovacs A, Zielinski MS, Kappers MJ, Dunin-Borkowski RE and Oliver RA
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 24 (S1), 4-5.  
01-08-2018
bullet iconImpact of stress in ICP‐CVD SiNx passivation films on the leakage current in AlGaN/GaN HEMTs
Cho S, Li X, Guiney I, Floros K, Hemakumara D, Wallis DJ, Humphreys C and Thayne IG
Electronics Letters, Institution of Engineering and Technology (Iet) vol. 54 (15), 947-949.  
01-07-2018
bullet iconEffects of surface plasma treatment on threshold voltage hysteresis and instability in metal-insulator-semiconductor (MIS) AlGaN/GaN heterostructure HEMTs
Zaidi ZH, Lee KB, Roberts JW, Guiney I, Qian H, Jiang S, Cheong JS, Li P, Wallis DJ, Humphreys CJ, Chalker PR and Houston PA
Journal of Applied Physics, Aip Publishing vol. 123 (18) 
14-05-2018
bullet iconEffect of stacking faults on the photoluminescence spectrum of zincblende GaN
Church SA, Hammersley S, Mitchell PW, Kappers MJ, Lee LY, Massabuau F, Sahonta SL, Frentrup M, Shaw LJ, Wallis DJ, Humphreys CJ, Oliver RA, Binks DJ and Dawson P
Journal of Applied Physics, Aip Publishing vol. 123 (18) 
10-05-2018
bullet iconResonant photoluminescence studies of carrier localisation in c-plane InGaN/GaN quantum well structures
Blenkhorn WE, Schulz S, Tanner DSP, Oliver RA, Kappers MJ, Humphreys CJ and Dawson P
Journal of Physics Condensed Matter, Iop Publishing vol. 30 (17) 
09-04-2018
bullet iconAlloy fluctuations at dislocations in III-nitrides: identification and impact on optical properties
Massabuau FC-P, Chen P, Rhode SL, Horton MK, O'Hanlon TJ, Kovács A, Zielinski MS, Kappers MJ, Dunin-Borkowski RE, Humphreys CJ and Oliver RA
Gallium Nitride Materials and Devices XIII. vol. 10532 
23-02-2018
bullet iconIlluminating theory on early solar eclipse
Humphreys C and Waddington G
Astronomy and Geophysics vol. 59 (1) 
01-02-2018
bullet iconMoon village: show us the money
Nixon D, Humphreys C and Waddington G
Astronomy & Geophysics, Oxford University Press (Oup) vol. 59 (1), 1.8-1.8.  
01-02-2018
bullet iconSEM doping contrast at a Si pn junction
Elliott SL, Broom RF and Humphreys CJ
 
18-01-2018
bullet iconEnergy-loss spectroscopy of GaN alloys and quantum wells
Keast VJ, Sharma N and Humphreys CJ
 
18-01-2018
bullet iconChemical mapping of InGaN/GaN LEDs
Sharma N, Kappers M, Barnard J, Vickers M and Humphreys C
 
18-01-2018
bullet iconEffects of AIN and GaN low-temperature interlayers on the dislocation behaviour of AlGaN and GaN grown by MOCVD
Makaronidis G, McAleese C, Barnard JS and Humphreys CJ
 
10-01-2018
bullet iconElectrostatic fields in InGaN/GaN single quantum wells and their variation with indium content, using off-axis holography and energy filtered TEM
Barnard JS, Kappers MJ, Thrush EJ and Humphreys CJ
 
10-01-2018
bullet iconA comparative study of the structural properties of InGaN/GaN quantum wells determined by X-ray diffraction, high-angle annular dark-field imaging and energy-filtered TEM
Barnard JS, Vickers ME, Kappers MJ, Thrush EJ and Humphreys CJ
 
10-01-2018
bullet iconQuantitative doping contrast profiling of p-n junctions in Si with the scanning electron microscope
Kazemian P, Schönjahn C and Humphreys CJ
 
10-01-2018
bullet iconNanoscale structural and chemical analysis of F-implanted enhancement-mode InAlN/GaN heterostructure field effect transistors
Tang F, Lee KB, Guiney I, Frentrup M, Barnard JS, Divitini G, Zaidi ZH, Martin TL, Bagot PA, Moody MP, Humphreys CJ, Houston PA, Oliver RA and Wallis DJ
Journal of Applied Physics, Aip Publishing vol. 123 (2) 
09-01-2018
bullet iconQuantitative doping contrast profiling of p-n junctions in Si with the scanning electron microscope
Kazemian P, Schönjahn C and Humphreys CJ
In Microscopy of Semiconducting Materials 2003 593-596.  
01-01-2018

2017

bullet iconThe ABC model of recombination reinterpreted: Impact on understanding carrier transport and efficiency droop in InGaN/GaN light emitting diodes
Hopkins MA, Allsopp DWE, Kappers MJ, Oliver RA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 122 (23) 
21-12-2017
bullet iconDegradation of in GaN/GaN Laser Diodes Investigated By Cross-Sectional Electron Beam Induced Current Imaging
Xiu H, Thrush EJ, Zhao L, Phillips A and Humphreys CJ
2017 14th China International Forum on Solid State Lighting: International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)., 38-44.  
01-11-2017
bullet iconTemperature and Bias Dependent Trap Capture Cross Section in AlGaN/GaN HEMT on 6-in Silicon With Carbon-Doped Buffer
Kumar S, Gupta P, Guiney I, Humphreys CJ, Raghavan S, Muralidharan R and Nath DN
Ieee Transactions On Electron Devices, Institute of Electrical and Electronics Engineers (Ieee) vol. 64 (12), 4868-4874.  
11-10-2017
bullet iconSolar eclipse of 1207 BC helps to date pharaohs
Humphreys C and Waddington G
Astronomy & Geophysics, Oxford University Press (Oup) vol. 58 (5), 5.39-5.42.  
01-10-2017
bullet iconMachine Learning Predicts Laboratory Earthquakes
Rouet-Leduc B, Hulbert C, Lubbers N, Barros K, Humphreys CJ and Johnson PA
Geophysical Research Letters vol. 44 (18), 9276-9282.  
28-09-2017
bullet iconX-ray diffraction analysis of cubic zincblende III-nitrides
Frentrup M, Lee LY, Sahonta S-L, Kappers MJ, Massabuau F, Gupta P, Oliver RA, Humphreys CJ and Wallis DJ
Journal of Physics D, Iop Publishing vol. 50 (43) 
26-09-2017
bullet iconAhmed Zewail — A Towering Visionary
Humphreys C
In Personal and Scientific Reminiscences, World Scientific Publishing 137-139.  
04-08-2017
bullet iconAutomatized convergence of optoelectronic simulations using active machine learning
Rouet-Leduc B, Hulbert C, Barros K, Lookman T and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 111 (4) 
24-07-2017
bullet iconDual barrier InAlN/AlGaN/GaN‐on‐silicon high‐electron‐mobility transistors with Pt‐ and Ni‐based gate stacks
Floros K, Li X, Guiney I, Cho S, Hemakumara D, Wallis DJ, Wasige E, Moran DAJ, Humphreys CJ and Thayne IG
physica status solidi (a) – applications and materials science. vol. 214 (8) 
20-07-2017
bullet iconDislocations in AlGaN: Core Structure, Atom Segregation, and Optical Properties
Massabuau FC-P, Rhode SL, Horton MK, O’Hanlon TJ, Kovács A, Zielinski MS, Kappers MJ, Dunin-Borkowski RE, Humphreys CJ and Oliver RA
Nano Letters, American Chemical Society (Acs) vol. 17 (8), 4846-4852.  
18-07-2017
bullet iconPassive Components Technology for THz-Monolithic Integrated Circuits (THz-MIC)
Eblabla A, Benakaprasad B, Li X, Wallis DJ, Guiney I, Humphreys C and Elgaid K
2017 18th International Radar Symposium (IRS)., 1-7.  
01-06-2017
bullet iconMechanisms preventing trench defect formation in InGaN/GaN quantum well structures using hydrogen during GaN barrier growth
Massabuau F, Kappers M, Humphreys C and Oliver R
physica status solidi (b). vol. 254 (8) 
22-05-2017
bullet iconStructural impact on the nanoscale optical properties of InGaN core-shell nanorods
Griffiths JT, Ren CX, Coulon P-M, Le Boulbar ED, Bryce CG, Girgel I, Howkins A, Boyd I, Martin RW, Allsopp DWE, Shields PA, Humphreys CJ and Oliver RA
Applied Physics Letters, Aip Publishing vol. 110 (17) 
24-04-2017
bullet iconPhotoluminescence studies of cubic GaN epilayers
Church SA, Hammersley S, Mitchell PW, Kappers MJ, Sahonta SL, Frentrup M, Nilsson D, Ward PJ, Shaw LJ, Wallis DJ, Humphreys CJ, Oliver RA, Binks DJ and Dawson P
physica status solidi (b). vol. 254 (8) 
21-02-2017
bullet iconAll-GaN-Integrated Cascode Heterojunction Field Effect Transistors
Jiang S, Lee KB, Guiney I, Miaja PF, Zaidi ZH, Qian H, Wallis DJ, Forsyth AJ, Humphreys CJ and Houston PA
Ieee Transactions On Power Electronics, Institute of Electrical and Electronics Engineers (Ieee) vol. 32 (11), 8743-8750.  
17-02-2017
bullet iconSingle-step manufacturing process for the production of graphene-V/III LED heterostructures
Guiney I, Thomas S and Humphreys CJ
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI. vol. 10124 
16-02-2017
bullet iconThe atomic structure of polar and non-polar InGaN quantum wells and the green gap problem
Humphreys CJ, Griffiths JT, Tang F, Oehler F, Findlay SD, Zheng C, Etheridge J, Martin TL, Bagot PAJ, Moody MP, Sutherland D, Dawson P, Schulz S, Zhang S, Fu WY, Zhu T, Kappers MJ and Oliver RA
Ultramicroscopy, Elsevier vol. 176, 93-98.  
03-02-2017
bullet iconNovel GaN-based vertical heterostructure field effect transistor structures using crystallographic KOH etching and overgrowth
Qian H, Lee KB, Vajargah SH, Novikov SV, Guiney I, Zaidi ZH, Jiang S, Wallis DJ, Foxon CT, Humphreys CJ and Houston PA
Journal of Crystal Growth, Elsevier vol. 459, 185-188.  
01-02-2017
bullet iconStructural and magnetic properties of ultra-thin Fe films on metal-organic chemical vapour deposited GaN(0001)
Kim J-Y, Ionescu A, Mansell R, Farrer I, Oehler F, Kinane CJ, Cooper JFK, Steinke N-J, Langridge S, Stankiewicz R, Humphreys CJ, Cowburn RP, Holmes SN and Barnes CHW
Journal of Applied Physics, Aip Publishing vol. 121 (4) 
24-01-2017
bullet iconEvolution of the m‑Plane Quantum Well Morphology and Composition within a GaN/InGaN Core–Shell Structure
Coulon P-M, Vajargah SH, Bao A, Edwards PR, Le Boulbar ED, Girgel I, Martin RW, Humphreys CJ, Oliver RA, Allsopp DWE and Shields PA
Crystal Growth & Design, American Chemical Society (Acs) vol. 17 (2), 474-482.  
11-01-2017
bullet iconX‐ray reflectivity method for the characterization of InGaN/GaN quantum well interface
Massabuau F, Piot N, Frentrup M, Wang X, Avenas Q, Kappers M, Humphreys C and Oliver R
physica status solidi (b). vol. 254 (8) 
06-01-2017
bullet iconCarrier localization in the vicinity of dislocations in InGaN
Massabuau FC-P, Chen P, Horton MK, Rhode SL, Ren CX, O'Hanlon TJ, Kovács A, Kappers MJ, Humphreys CJ, Dunin-Borkowski RE and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 121 (1) 
03-01-2017
bullet iconPreventing cracking in the growth of low-cost GaN LEDs on large-area Si
Humphreys CJ
ICF 2017 - 14th International Conference on Fracture. vol. 2, 1280-1282.  
01-01-2017
bullet iconPerspectives on Electronic and Photonic Materials
Smeeton T and Humphreys C
In Springer Handbook of Electronic and Photonic Materials, Springer Nature 1-1.  
01-01-2017

2016

bullet iconImpact of high energy electrons on nitrides for nanocathodoluminescence
Griffiths J, Zhang S, Lhuillier J, Zhu D, Wallis D, Howkins A, Boyd I, Stowe D, Humphreys C and Oliver R
In European Microscopy Congress 2016: Proceedings, Wiley 1044-1045.  
20-12-2016
bullet iconNanocathodoluminescence reveals the mitigation of the Stark shift in InGaN quantum wells by silicon doping
Griffiths J, Zhang S, Rouet‐Leduc B, Fu WY, Zhu D, Wallis D, Howkins A, Boyd I, Stowe D, Humphreys C and Oliver R
In European Microscopy Congress 2016: Proceedings, Wiley 562-563.  
20-12-2016
bullet iconLocal carrier recombination and associated dynamics in m-plane InGaN/GaN quantum wells probed by picosecond cathodoluminescence
Zhu T, Gachet D, Tang F, Fu WY, Oehler F, Kappers MJ, Dawson P, Humphreys CJ and Oliver RA
Applied Physics Letters, Aip Publishing vol. 109 (23) 
05-12-2016
bullet iconGrowth of free-standing bulk wurtzite AlxGa1−xN layers by molecular beam epitaxy using a highly efficient RF plasma source
Novikov SV, Staddon CR, Sahonta S-L, Oliver RA, Humphreys CJ and Foxon CT
Journal of Crystal Growth, Elsevier vol. 456, 151-154.  
01-12-2016
bullet iconDielectric response of wurtzite gallium nitride in the terahertz frequency range
Hibberd MT, Frey V, Spencer BF, Mitchell PW, Dawson P, Kappers MJ, Oliver RA, Humphreys CJ and Graham DM
Solid State Communications, Elsevier vol. 247, 68-71.  
01-12-2016
bullet iconTheoretical and experimental analysis of the photoluminescence and photoluminescence excitation spectroscopy spectra of m-plane InGaN/GaN quantum wells
Schulz S, Tanner DSP, O'Reilly EP, A. M, Tang F, Griffiths JT, Oehler F, Kappers MJ, Oliver RA, Humphreys CJ, Sutherland D, Davies MJ and Dawson P
Applied Physics Letters, Aip Publishing vol. 109 (22) 
28-11-2016
bullet iconA study of the optical and polarisation properties of InGaN/GaN multiple quantum wells grown on a-plane and m-plane GaN substrates.
Kundys D, Sutherland D, Davies MJ, Oehler F, Griffiths J, Dawson P, Kappers MJ, Humphreys CJ, Schulz S, Tang F and Oliver RA
Sci Technol Adv Mater vol. 17 (1), 736-743.  
10-11-2016
bullet iconNano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold
Griffiths JT, Zhang S, Lhuillier J, Zhu D, Fu WY, Howkins A, Boyd I, Stowe D, Wallis DJ, Humphreys CJ and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 120 (16) 
28-10-2016
bullet iconTerahertz Microstrip Elevated Stack Antenna Technology on GaN-on-Low Resistivity Silicon Substrates for TMIC
Benakaprasad B, Eblabla A, Li X, Elgaid K, Wallis DJ, Guiney I and Humphreys C
2016 46th European Microwave Conference (EuMC)., 413-416.  
01-10-2016
bullet iconDetermination of axial and lateral exciton diffusion length in GaN by electron energy dependent cathodoluminescence
Hocker M, Maier P, Jerg L, Tischer I, Neusser G, Kranz C, Pristovsek M, Humphreys CJ, Leute RAR, Heinz D, Rettig O, Scholz F and Thonke K
Journal of Applied Physics, Aip Publishing vol. 120 (8) 
23-08-2016
bullet iconHigh-quality III-nitride films on conductive, transparent (2̅01)-oriented β-Ga2O3 using a GaN buffer layer
Muhammed MM, Roldan MA, Yamashita Y, Sahonta S-L, Ajia IA, Iizuka K, Kuramata A, Humphreys CJ and Roqan IS
Scientific Reports, Springer Nature vol. 6 (1) 
14-07-2016
bullet iconStructural and optical properties of (112̅2) InGaN quantum wells compared to (0001) and (112̅0)
Pristovsek M, Han Y, Zhu T, Oehler F, Tang F, Oliver RA, Humphreys CJ, Tytko D, Choi P-P, Raabe D, Brunner F and Weyers M
Semiconductor Science and Technology, Iop Publishing vol. 31 (8) 
12-07-2016
bullet iconCombined electrical and resonant optical excitation characterization of multi-quantum well InGaN-based light-emitting diodes
Presa S, Maaskant PP, Kappers MJ, Humphreys CJ and Corbett B
Aip Advances, Aip Publishing vol. 6 (7) 
01-07-2016
bullet iconComparative studies of efficiency droop in polar and non-polar InGaN quantum wells
Davies MJ, Dawson P, Hammersley S, Zhu T, Kappers MJ, Humphreys CJ and Oliver RA
Applied Physics Letters, Aip Publishing vol. 108 (25) 
20-06-2016
bullet iconScalable semipolar gallium nitride templates for high-speed LEDs
Corbett B, Lymperakis L, Scholz F, Humphreys C, Brunner F and Meyer T
Spie Newsroom, Spie, The International Society For Optics and Photonics 
03-06-2016
bullet iconTerahertz cyclotron resonance spectroscopy of an AlGaN/GaN heterostructure using a high-field pulsed magnet and an asynchronous optical sampling technique
Spencer BF, Smith WF, Hibberd MT, Dawson P, Beck M, Bartels A, Guiney I, Humphreys CJ and Graham DM
Applied Physics Letters, Aip Publishing vol. 108 (21) 
23-05-2016
bullet iconThe nature of carrier localisation in polar and nonpolar InGaN/GaN quantum wells
Dawson P, Schulz S, Oliver RA, Kappers MJ and Humphreys CJ
Journal of Applied Physics vol. 119 (18) 
14-05-2016
bullet iconCharacterization of p-GaN1−x As x /n-GaN PN junction diodes
Qian H, Lee KB, Vajargah SH, Novikov SV, Guiney I, Zhang S, Zaidi ZH, Jiang S, Wallis DJ, Foxon CT, Humphreys CJ and Houston PA
Semiconductor Science and Technology, Iop Publishing vol. 31 (6) 
12-05-2016
bullet iconThe microstructure of non-polar a-plane (11 2 ¯0) InGaN quantum wells
Griffiths JT, Oehler F, Tang F, Zhang S, Fu WY, Zhu T, Findlay SD, Zheng C, Etheridge J, Martin TL, Bagot PAJ, Moody MP, Sutherland D, Dawson P, Kappers MJ, Humphreys CJ and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 119 (17) 
02-05-2016
bullet iconToward defect‐free semi‐polar GaN templates on pre‐structured sapphire (Phys. Status Solidi B 5/2016)
Han Y, Caliebe M, Hage F, Ramasse Q, Pristovsek M, Zhu T, Scholz F and Humphreys C
Physica Status Solidi (B), Wiley vol. 253 (5), 1024-1024.  
01-05-2016
bullet iconOptimisation of GaN LEDs and the reduction of efficiency droop using active machine learning
Rouet-Leduc B, Barros K, Lookman T and Humphreys CJ
Scientific Reports, Springer Nature vol. 6 (1) 
26-04-2016
bullet iconComparative study of (0001) and InGaN based light emitting diodes
Pristovsek M, Humphreys CJ, Bauer S, Knab M, Thonke K, Kozlowski G, O’Mahony D, Maaskant P and Corbett B
Japanese Journal of Applied Physics. vol. 55 (5S) 
15-04-2016
bullet iconEffect of QW growth temperature on the optical properties of blue and green InGaN/GaN QW structures
Hammersley S, Kappers MJ, Massabuau FC, Sahonta S, Dawson P, Oliver RA and Humphreys CJ
Physica Status Solidi (C) 
14-04-2016
bullet iconImpact of Buffer Charge on the Reliability of Carbon Doped AIGaN/GaN-on-Si HEMTs
Chatterjee I, Uren MJ, Pooth A, Karboyan S, Martin-Horcajo S, Kuball M, Lee KB, Zaidi Z, Houston PA, Wallis DJ, Guiney I and Humphreys CJ
2016 IEEE International Reliability Physics Symposium (IRPS)
01-04-2016
bullet iconInfluence of trench period and depth on MOVPE grown (112¯2) GaN on patterned r-plane sapphire substrates.
Caliebe M, Tandukar S, Cheng Z, Hocker M, Han Y, Meisch T, Heinz D, Huber F, Bauer S, Plettl A, Humphreys C, Thonke K and Scholz F
Journal of Crystal Growth, Elsevier vol. 440, 69-75.  
01-04-2016
bullet iconSubthreshold Mobility in AlGaN/GaN HEMTs
Waller WM, Uren MJ, Lee KB, Houston PA, Wallis DJ, Guiney I, Humphreys CJ, Pandey S, Sonsky J and Kuball M
Ieee Transactions On Electron Devices, Institute of Electrical and Electronics Engineers (Ieee) vol. 63 (5), 1861-1865.  
30-03-2016
bullet iconStructural and Optical Emission Uniformity of m‑Plane InGaN Single Quantum Wells in Core–Shell Nanorods
Le Boulbar ED, Edwards PR, Vajargah SH, Griffiths I, Gîrgel I, Coulon P-M, Cherns D, Martin RW, Humphreys CJ, Bowen CR, Allsopp DWE and Shields PA
Crystal Growth & Design, American Chemical Society (Acs) vol. 16 (4), 1907-1916.  
23-03-2016
bullet iconDislocation core structures in (0001) InGaN
Rhode SL, Horton MK, Sahonta S-L, Kappers MJ, Haigh SJ, Pennycook TJ, McAleese C, Humphreys CJ, Dusane RO and Moram MA
Journal of Applied Physics, Aip Publishing vol. 119 (10) 
09-03-2016
bullet iconDevelopment of semipolar (11-22) LEDs on GaN templates
Corbett B, Quan Z, Dinh DV, Kozlowski G, O'Mahony D, Akhter M, Schulz S, Parbrook P, Maaskant P, Caliebe M, Hocker M, Thonke K, Scholz F, Pristovsek M, Han Y, Humphreys CJ, Brunner F, Weyers M, Meyer TM and Lymperakis L
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XX. vol. 9768 
08-03-2016
bullet iconInvestigation of indium gallium nitride facet-dependent nonpolar growth rates and composition for core–shell light-emitting diodes
Gîrgel I, Edwards PR, Le Boulbar E, Coulon P-M, Sahonta S-L, Allsopp DWE, Martin RW, Humphreys CJ and Shields PA
Journal of Nanophotonics. vol. 10 (1), 016010-016010.  
07-03-2016
bullet iconMolecular beam epitaxy of free‐standing bulk wurtzite AlxGa1‐xN layers using a highly efficient RF plasma source
Novikov SV, Staddon CR, Sahonta S, Oliver RA, Humphreys CJ and Foxon CT
physica status solidi (c). vol. 13 (5‐6), 217-220.  
25-02-2016
bullet iconEffect of electron blocking layers on the conduction and valence band profiles of InGaN/GaN LEDs
Hammersley S, Dawson P, Kappers MJ, Massabuau FC, Frentrup M, Oliver RA and Humphreys CJ
physica status solidi (c). vol. 13 (5‐6), 262-265.  
17-02-2016
bullet iconControl of threshold voltage in E-mode and D-mode GaN-on-Si metal-insulator-semiconductor heterostructure field effect transistors by in-situ fluorine doping of atomic layer deposition Al2O3 gate dielectrics
Roberts JW, Chalker PR, Lee KB, Houston PA, Cho SJ, Thayne IG, Guiney I, Wallis D and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 108 (7) 
15-02-2016
bullet iconA comparison of the optical properties of InGaN/GaN multiple quantum well structures grown with and without Si-doped InGaN prelayers
Davies MJ, Hammersley S, Massabuau FC-P, Dawson P, Oliver RA, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 119 (5) 
05-02-2016
bullet iconEffect of QW growth temperature on the optical properties of blue and green InGaN/GaN QW structures
Hammersley S, Kappers MJ, Massabuau FC, Sahonta S, Dawson P, Oliver RA and Humphreys CJ
physica status solidi (c). vol. 13 (5‐6), 209-213.  
03-02-2016
bullet iconInvestigating efficiency droop in InGaN/GaN quantum well structures using ultrafast time‐resolved terahertz and photoluminescence spectroscopy
Dunn A, Spencer BF, Hardman SJO, Graham DM, Hammersley S, Davies MJ, Dawson P, Kappers MJ, Oliver RA and Humphreys CJ
physica status solidi (c). vol. 13 (5‐6), 252-255.  
03-02-2016
bullet iconRoom temperature PL efficiency of InGaN/GaN quantum well structures with prelayers as a function of number of quantum wells
Christian GM, Hammersley S, Davies MJ, Dawson P, Kappers MJ, Massabuau FC, Oliver RA and Humphreys CJ
physica status solidi (c). vol. 13 (5‐6), 248-251.  
27-01-2016
bullet iconOrigins of hillock defects on GaN templates grown on Si(111)
Han Y, Zhu D, Zhu T, Humphreys CJ and Wallis DJ
Journal of Crystal Growth, Elsevier vol. 434, 123-127.  
01-01-2016
bullet iconn-Type conductivity bound by the growth temperature: the case of Al 0.72 Ga 0.28 N highly doped by silicon
Kakanakova-Georgieva A, Sahonta S-L, Nilsson D, Trinh XT, Son NT, Janzén E and Humphreys CJ
Journal of Materials Chemistry C, Royal Society of Chemistry (Rsc) vol. 4 (35), 8291-8296.  
01-01-2016
bullet iconSolid-State Lighting Based on Light Emitting Diode Technology
Zhu D and Humphreys CJ
In Optics in Our Time, Springer Nature 87-118.  
01-01-2016
bullet iconModelling the Closely-Coupled Cascode Switching Process
Miaja PF, Jiang S, Lee KB, Guiney I, Wallis DJ, Humphreys CJ, Houston PA and Forsyth AJ
2016 IEEE Energy Conversion Congress and Exposition (ECCE)., 1-8.  
01-01-2016
bullet iconTerahertz Magnetospectroscopy Studies of an AlGaN/GaN Heterostructure
Spencer BF, Hibberd MT, Smith WF, Dawson P, Beck M, Bartels A, Guiney I, Humphreys CJ and Graham DM
2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)., 1-2.  
01-01-2016
bullet iconTransfer printed multi-color integrated devices for visible light communication applications
Rae K, Xie E, Foucher C, Guilhabert B, Ferriera R, Zhu D, Wallis DJ, Humphreys CJ, Oliver RA, Gu E, Laurand N and Dawson MD
Light, Energy and the Environment
01-01-2016
bullet iconTerahertz Monolithic Integrated Circuits (TMICs) Array Antenna Technology on GaN-on-Low Resistivity Silicon Substrates
Benakaprasad B, Eblabla A, Li X, Thayne I, Wallis DJ, Guiney I, Humphreys C and Elgaid K
2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)., 1-2.  
01-01-2016
bullet iconTerahertz magnetospectroscopy studies of an AlGaN/GaN heterostructure
Spencer BF, Hibberd MT, Smith WF, Dawson P, Beck M, Bartels A, Guiney I, Humphreys CJ and Graham DM
Conference on Lasers and Electro-Optics
01-01-2016

2015

bullet iconDislocation core structures in Si-doped GaN
Rhode SL, Horton MK, Fu WY, Sahonta S-L, Kappers MJ, Pennycook TJ, Humphreys CJ, Dusane RO and Moram MA
Applied Physics Letters, Aip Publishing vol. 107 (24) 
14-12-2015
bullet iconToward defect‐free semi‐polar GaN templates on pre‐structured sapphire
Han Y, Caliebe M, Hage F, Ramasse Q, Pristovsek M, Zhu T, Scholz F and Humphreys C
Physica Status Solidi (B), Wiley vol. 253 (5), 834-839.  
12-12-2015
bullet iconStructural, electronic, and optical properties of m-plane InGaN/GaN quantum wells: Insights from experiment and atomistic theory
Schulz S, Tanner DP, O'Reilly EP, A. M, Martin TL, Bagot PAJ, Moody MP, Tang F, Griffiths JT, Oehler F, Kappers MJ, Oliver RA, Humphreys CJ, Sutherland D, Davies MJ and Dawson P
Physical Review B, American Physical Society (Aps) vol. 92 (23) 
01-12-2015
bullet iconDifference in linear polarization of biaxially strained InxGa1−xN alloys on nonpolar a-plane and m-plane GaN
Zhang S, Cui Y, Griffiths JT, Fu WY, Freysoldt C, Neugebauer J, Humphreys CJ and Oliver RA
Physical Review B, American Physical Society (Aps) vol. 92 (24) 
01-12-2015
bullet iconA study of the impact of in-situ argon plasma treatment before atomic layer deposition of Al2O3 on GaN based metal oxide semiconductor capacitor
Cho SJ, Roberts JW, Guiney I, Li X, Ternent G, Floros K, Humphreys CJ, Chalker PR and Thayne IG
Microelectronic Engineering. vol. 147, 277-280.  
01-11-2015
bullet iconNanocathodoluminescence Reveals Mitigation of the Stark Shift in InGaN Quantum Wells by Si Doping
Griffiths JT, Zhang S, Rouet-Leduc B, Fu WY, Bao A, Zhu D, Wallis DJ, Howkins A, Boyd I, Stowe D, Kappers MJ, Humphreys CJ and Oliver RA
Nano Letters, American Chemical Society (Acs) vol. 15 (11), 7639-7643.  
22-10-2015
bullet iconIntegrated Dual-Color Ingan Light-Emitting Diode Array Through Transfer Printing
Rae K, Xie EY, Trindade AJ, Guilhabert B, Ferreira R, McKendry JJD, Zhu D, Laurand N, Gu E, Watson IM, Humphreys CJ, Wallis DJ and Dawson MD
2015 IEEE Photonics Conference (IPC)., 390-391.  
01-10-2015
bullet iconImpact of thermal treatment on the optical performance of InGaN/GaN light emitting diodes
Meneghini M, Zhu D, Humphreys CJ, Berti M, Gasparotto A, Cesca T, Vinattieri A, Bogani F, Meneghesso G and Zanoni E
Aip Advances, Aip Publishing vol. 5 (10) 
01-10-2015
bullet iconEffects of quantum well growth temperature on the recombination efficiency of InGaN/GaN multiple quantum wells that emit in the green and blue spectral regions
Hammersley S, Kappers MJ, Massabuau FC-P, Sahonta S-L, Dawson P, Oliver RA and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 107 (13) 
28-09-2015
bullet iconOptimizing GaN () hetero‐epitaxial templates grown on () sapphire
Pristovsek M, Frentrup M, Han Y and Humphreys CJ
Physica Status Solidi (B), Wiley vol. 253 (1), 61-66.  
31-08-2015
bullet iconEnhancement mode operation in AlInN/GaN (MIS)HEMTs on Si substrates using a fluorine implant
Zaidi ZH, Lee KB, Guiney I, Qian H, Jiang S, Wallis DJ, Humphreys CJ and Houston PA
Semiconductor Science and Technology, Iop Publishing vol. 30 (10) 
18-08-2015
bullet iconGrowth and coalescence studies of oriented GaN on pre‐structured sapphire substrates using marker layers
Caliebe M, Han Y, Hocker M, Meisch T, Humphreys C, Thonke K and Scholz F
Physica Status Solidi (B), Wiley vol. 253 (1), 46-53.  
14-08-2015
bullet iconInterface State Artefact in Long Gate-Length AlGaN/GaN HEMTs
Waller WM, Karboyan S, Uren MJ, Lee KB, Houston PA, Wallis DJ, Guiney I, Humphreys CJ and Kuball M
Ieee Transactions On Electron Devices, Institute of Electrical and Electronics Engineers (Ieee) vol. 62 (8), 2464-2469.  
07-07-2015
bullet iconHeterogeneous integration of gallium nitride light-emitting diodes on diamond and silica by transfer printing
Trindade AJ, Guilhabert B, Xie EY, Ferreira R, McKendry JJD, Zhu D, Laurand N, Gu E, Wallis DJ, Watson IM, Humphreys CJ and Dawson MD
Optics Express, Optica Publishing Group vol. 23 (7), 9329-9338.  
02-04-2015
bullet iconOrigin of faceted surface hillocks on semi-polar (112¯2) GaN templates grown on pre-structured sapphire
Han Y, Caliebe M, Kappers M, Scholz F, Pristovsek M and Humphreys C
Journal of Crystal Growth, Elsevier vol. 415, 170-175.  
01-04-2015
bullet iconEffect of the barrier growth mode on the luminescence and conductivity micron scale uniformity of InGaN light emitting diodes
Wallace MJ, Edwards PR, Kappers MJ, Hopkins MA, Oehler F, Sivaraya S, Oliver RA, Humphreys CJ, Allsopp DWE and Martin RW
Journal of Applied Physics, Aip Publishing vol. 117 (11) 
21-03-2015
bullet iconSCM and SIMS investigations of unintentional doping in III‐nitrides
Kappers MJ, Zhu T, Sahonta S, Humphreys CJ and Oliver RA
physica status solidi (c). vol. 12 (4-5), 403-407.  
18-03-2015
bullet iconEnhancement-mode metal–insulator–semiconductor GaN/AlInN/GaN heterostructure field-effect transistors on Si with a threshold voltage of +3.0 V and blocking voltage above 1000 V
Lee KB, Guiney I, Jiang S, Zaidi ZH, Qian H, Wallis DJ, Uren MJ, Kuball M, Humphreys CJ and Houston PA
Applied Physics Express, Iop Publishing vol. 8 (3) 
19-02-2015
bullet iconSegregation of In to Dislocations in InGaN
Horton MK, Rhode S, Sahonta S-L, Kappers MJ, Haigh SJ, Pennycook TJ, Humphreys CJ, Dusane RO and Moram MA
Nano Letters, American Chemical Society (Acs) vol. 15 (2), 923-930.  
21-01-2015
bullet iconOptical studies of non‐polar m‐plane () InGaN/GaN multi‐quantum wells grown on freestanding bulk GaN
Sutherland D, Zhu T, Griffiths JT, Tang F, Dawson P, Kundys D, Oehler F, Kappers MJ, Humphreys CJ and Oliver RA
physica status solidi (b). vol. 252 (5), 965-970.  
20-01-2015

2014

bullet iconCarrier distributions in InGaN/GaN light‐emitting diodes
Hammersley S, Davies MJ, Dawson P, Oliver RA, Kappers MJ and Humphreys CJ
Physica Status Solidi (B), Wiley vol. 252 (5), 890-894.  
29-12-2014
bullet iconSulfuric acid and hydrogen peroxide surface passivation effects on AlGaN/GaN high electron mobility transistors
Zaidi ZH, Lee KB, Guiney I, Qian H, Jiang S, Wallis DJ, Humphreys CJ and Houston PA
Journal of Applied Physics, Aip Publishing vol. 116 (24) 
22-12-2014
bullet iconInvestigation of unintentional indium incorporation into GaN barriers of InGaN/GaN quantum well structures
Massabuau FC, Davies MJ, Blenkhorn WE, Hammersley S, Kappers MJ, Humphreys CJ, Dawson P and Oliver RA
Physica Status Solidi (B), Wiley vol. 252 (5), 928-935.  
19-12-2014
bullet iconLow defect large area semi‐polar (112) GaN grown on patterned (113) silicon
Pristovsek M, Han Y, Zhu T, Frentrup M, Kappers MJ, Humphreys CJ, Kozlowski G, Maaskant P and Corbett B
physica status solidi (b). vol. 252 (5), 1104-1108.  
05-12-2014
bullet iconGrowth of non-polar (11-20) InGaN quantum dots by metal organic vapour phase epitaxy using a two temperature method
Griffiths JT, Zhu T, Oehler F, Emery RM, Fu WY, Reid BPL, Taylor RA, Kappers MJ, Humphreys CJ and Oliver RA
Apl Materials, Aip Publishing vol. 2 (12) 
01-12-2014
bullet iconEvaluation of growth methods for the heteroepitaxy of non-polar (112¯0) GAN on sapphire by MOVPE
Oehler F, Sutherland D, Zhu T, Emery R, Badcock TJ, Kappers MJ, Humphreys CJ, Dawson P and Oliver RA
Journal of Crystal Growth, Elsevier vol. 408, 32-41.  
01-12-2014
bullet iconA study of the inclusion of prelayers in InGaN/GaN single‐ and multiple‐quantum‐well structures
Davies MJ, Dawson P, Massabuau FC, Le Fol A, Oliver RA, Kappers MJ and Humphreys CJ
Physica Status Solidi (B), Wiley vol. 252 (5), 866-872.  
14-11-2014
bullet iconComparative study of polar and semipolar ( 11 2 ¯ 2 ) InGaN layers grown by metalorganic vapour phase epitaxy
Dinh DV, Oehler F, Zubialevich VZ, Kappers MJ, Alam SN, Caliebe M, Scholtz F, Humphreys CJ and Parbrook PJ
Journal of Applied Physics, Aip Publishing vol. 116 (15) 
16-10-2014
bullet iconCapillary-Bonding of Thin LEDs onto Non-Native Substrates by Transfer-Printing
Trindade AJ, Guilhabert B, Zhu D, Laurand N, Gu E, Watson IM, Humphreys CJ, Wallis DJ and Dawson MD
2014 IEEE Photonics Conference., 504-505.  
01-10-2014
bullet iconDirect Observation of Depth-Dependent Atomic Displacements Associated with Dislocations in Gallium Nitride
Lozano JG, Yang H, Guerrero-Lebrero MP, D'Alfonso AJ, Yasuhara A, Okunishi E, Zhang S, Humphreys CJ, Allen LJ, Galindo PL, Hirsch PB and Nellist PD
Physical Review Letters, American Physical Society (Aps) vol. 113 (13) 
24-09-2014
bullet iconThe impact of trench defects in InGaN/GaN light emitting diodes and implications for the “green gap” problem
Massabuau FC-P, Davies MJ, Oehler F, Pamenter SK, Thrush EJ, Kappers MJ, Kovács A, Williams T, Hopkins MA, Humphreys CJ, Dawson P, Dunin-Borkowski RE, Etheridge J, Allsopp DWE and Oliver RA
Applied Physics Letters, Aip Publishing vol. 105 (11) 
15-09-2014
bullet iconStructure and strain relaxation effects of defects in InxGa1−xN epilayers
Rhode SL, Fu WY, Moram MA, Massabuau FC-P, Kappers MJ, McAleese C, Oehler F, Humphreys CJ, Dusane RO and Sahonta S
Journal of Applied Physics, Aip Publishing vol. 116 (10) 
10-09-2014
bullet iconThe effects of Si-doped prelayers on the optical properties of InGaN/GaN single quantum well structures
Davies MJ, Dawson P, Massabuau FC-P, Oliver RA, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 105 (9) 
01-09-2014
bullet iconElectron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
Trager-Cowan C, Naresh-Kumar G, Allehiani N, Kraeusel S, Hourahine B, Vespucci S, Thomson D, Bruckbauer J, Kusch G, Edwards PR, Martin RW, Mauder C, Day AP, Winkelmann A, Vilalta-Clemente A, Wilkinson AJ, Parbrook PJ, Kappers MJ, Moram MA, Oliver RA, et al.
Microscopy and Microanalysis. vol. 20 (S3), 1024-1025.  
01-08-2014
bullet iconHow Cutting-Edge Atomic Resolution Microscopy Can Help to Solve Some of the World's Energy Problems
Humphreys C
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 20 (S3), xcvii-c.  
01-08-2014
bullet iconHow Cutting-Edge Atomic Resolution Microscopy Can Help to Solve Some of the World’s Energy Problems
Humphreys C and Ford BJ
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 20 (S2), 11-14.  
29-07-2014
bullet iconBias dependence and correlation of the cathodoluminescence and electron beam induced current from an InGaN/GaN light emitting diode
Wallace MJ, Edwards PR, Kappers MJ, Hopkins MA, Oehler F, Sivaraya S, Allsopp DWE, Oliver RA, Humphreys CJ and Martin RW
Journal of Applied Physics, Aip Publishing vol. 116 (3) 
18-07-2014
bullet iconInvestigation of the GaN-on-GaAs interface for vertical power device applications
Möreke J, Uren MJ, Novikov SV, Foxon CT, Vajargah SH, Wallis DJ, Humphreys CJ, Haigh SJ, Al-Khalidi A, Wasige E, Thayne I and Kuball M
Journal of Applied Physics, Aip Publishing vol. 116 (1) 
03-07-2014
bullet iconA dissociation mechanism for the [a+c] dislocation in GaN
Nellist PD, Hirsch PB, Rhode S, Horton MK, Lozano JG, Yasuhara A, Okunishi E, Zhang S, Sahonta S-L, Kappers MJ, Humphreys CJ and Moram MA
Journal of Physics Conference Series. vol. 522 (1) 
11-06-2014
bullet iconObservation of depth-dependent atomic displacements related to dislocations in GaN by optical sectioning in the STEM
Lozano JG, Guerrero-Lebrero MP, Yasuhara A, Okinishi E, Zhang S, Humphreys CJ, Galindo PL, Hirsch PB and Nellist PD
Journal of Physics Conference Series. vol. 522 (1) 
11-06-2014
bullet iconCorrelating electroluminescence characterization and physics-based models of InGaN/GaN LEDs: Pitfalls and open issues
Calciati M, Goano M, Bertazzi F, Vallone M, Zhou X, Ghione G, Meneghini M, Meneghesso G, Zanoni E, Bellotti E, Verzellesi G, Zhu D and Humphreys C
Aip Advances, Aip Publishing vol. 4 (6) 
01-06-2014
bullet iconDislocation-related trap levels in nitride-based light emitting diodes
Venturi G, Castaldini A, Cavallini A, Meneghini M, Zanoni E, Zhu D and Humphreys C
Applied Physics Letters, Aip Publishing vol. 104 (21) 
26-05-2014
bullet iconPolarized photoluminescence excitation spectroscopy of a-plane InGaN/GaN multiple quantum wells grown on r-plane sapphire
Kundys D, Schulz S, Oehler F, Sutherland D, Badcock TJ, Dawson P, Kappers MJ, Oliver RA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 115 (11) 
21-03-2014
bullet iconLow temperature carrier redistribution dynamics in InGaN/GaN quantum wells
Badcock TJ, Dawson P, Davies MJ, Kappers MJ, Massabuau FC-P, Oehler F, Oliver RA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 115 (11) 
18-03-2014
bullet iconCathodoluminescence hyperspectral imaging of trench-like defects in InGaN/GaN quantum well structures
Bruckbauer J, Edwards PR, Sahonta S-L, Massabuau FC-P, Kappers MJ, Humphreys CJ, Oliver RA and Martin RW
Journal of Physics D, Iop Publishing vol. 47 (13) 
11-03-2014
bullet iconCarrier capture efficiency in InGaN/GaN LEDs: Role of high temperature annealing
Vinattieri A, Batignani F, Bogani F, Meneghini M, Meneghesso G, Zanoni E, Zhu D and Humphreys CJ
AIP Conference Proceedings. vol. 1583 (1), 282-286.  
21-02-2014
bullet iconMicroscopic, electrical and optical studies on InGaN/GaN quantum wells based LED devices
Mutta GR, Venturi G, Castaldini A, Cavallini A, Meneghini M, Zanoni E, Meneghesso G, Zhu D and Humphreys C
AIP Conference Proceedings. vol. 1583 (1), 315-318.  
21-02-2014
bullet iconThe impact of growth parameters on trench defects in InGaN/GaN quantum wells
Massabuau FC, Le Fol A, Pamenter SK, Oehler F, Kappers MJ, Humphreys CJ and Oliver RA
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 211 (4), 740-743.  
14-02-2014
bullet iconHigh excitation density recombination dynamics in InGaN/GaN quantum well structures in the droop regime
Davies MJ, Badcock TJ, Dawson P, Oliver RA, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 11 (3‐4), 694-697.  
01-02-2014
bullet iconAn investigation into defect reduction techniques for growth of non‐polar GaN on sapphire
Sutherland D, Oehler F, Zhu T, Griffiths JT, Badcock TJ, Dawson P, Emery RM, Kappers MJ, Humphreys CJ and Oliver RA
physica status solidi (c). vol. 11 (3‐4), 541-544.  
01-02-2014
bullet iconDynamics of carrier redistribution processes in InGaN/GaN quantum well structures
Badcock TJ, Dawson P, Davies MJ, Oliver RA, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 11 (3‐4), 738-741.  
28-01-2014
bullet iconEffects of an InGaN prelayer on the properties of InGaN/GaN quantum well structures
Davies MJ, Massabuau FC, Dawson P, Oliver RA, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 11 (3‐4), 710-713.  
28-01-2014
bullet iconThe effects of varying threading dislocation density on the optical properties of InGaN/GaN quantum wells
Davies MJ, Dawson P, Massabuau FC, Oehler F, Oliver RA, Kappers MJ, Badcock TJ and Humphreys CJ
Physica Status Solidi (C), Wiley vol. 11 (3‐4), 750-753.  
28-01-2014
bullet iconCharacteristics and applications of micro-pixelated GaN-based light emitting diodes on Si substrates
Tian P, McKendry JJD, Gong Z, Zhang S, Watson S, Zhu D, Watson IM, Gu E, Kelly AE, Humphreys CJ and Dawson MD
Journal of Applied Physics, Aip Publishing vol. 115 (3) 
21-01-2014
bullet iconThe impact of substrate miscut on the microstructure and photoluminescence efficiency of (0001) InGaN quantum wells grown by a two-temperature method
Massabuau FC-P, Tartan CC, Traynier R, Blenkhorn WE, Kappers MJ, Dawson P, Humphreys CJ and Oliver RA
Journal of Crystal Growth, Elsevier vol. 386, 88-93.  
01-01-2014

2013

bullet iconElastic constants and critical thicknesses of ScGaN and ScAlN
Zhang S, Fu WY, Holec D, Humphreys CJ and Moram MA
Journal of Applied Physics, Aip Publishing vol. 114 (24) 
28-12-2013
bullet iconInterfacial Structure and Chemistry of GaN on Ge(111)
Zhang S, Zhang Y, Cui Y, Freysoldt C, Neugebauer J, Lieten RR, Barnard JS and Humphreys CJ
Physical Review Letters, American Physical Society (Aps) vol. 111 (25) 
16-12-2013
bullet iconNanoscale-accuracy transfer printing of ultra-thin AlInGaN light-emitting diodes onto mechanically flexible substrates
Trindade AJ, Guilhabert B, Massoubre D, Zhu D, Laurand N, Gu E, Watson IM, Humphreys CJ and Dawson MD
Applied Physics Letters, Aip Publishing vol. 103 (25) 
16-12-2013
bullet iconTowards a better understanding of trench defects in InGaN/GaN quantum wells
Massabuau FC-P, Trinh-Xuan L, Lodié D, Sahonta S-L, Rhode S, Thrush EJ, Oehler F, Kappers MJ, Humphreys CJ and Oliver RA
Journal of Physics Conference Series. vol. 471 (1) 
29-11-2013
bullet iconLow-cost high-efficiency GaN LED on large-area si substrate
Zhu D and Humphreys CJ
2013 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2013., 269-272.  
15-11-2013
bullet iconCoincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN
Naresh-Kumar G, Bruckbauer J, Edwards PR, Kraeusel S, Hourahine B, Martin RW, Kappers MJ, Moram MA, Lovelock S, Oliver RA, Humphreys CJ and Trager-Cowan C
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 20 (1), 55-60.  
12-11-2013
bullet iconSurface morphology of homoepitaxial c-plane GaN: Hillocks and ridges
Oehler F, Zhu T, Rhode S, Kappers MJ, Humphreys CJ and Oliver RA
Journal of Crystal Growth, Elsevier vol. 383, 12-18.  
01-11-2013
bullet iconTunable optoelectronic and ferroelectric properties in Sc-based III-nitrides
Zhang S, Holec D, Fu WY, Humphreys CJ and Moram MA
Journal of Applied Physics, Aip Publishing vol. 114 (13) 
04-10-2013
bullet iconProspects of III-nitride optoelectronics grown on Si
Zhu D, Wallis DJ and Humphreys CJ
Reports On Progress in Physics, Iop Publishing vol. 76 (10) 
01-10-2013
bullet iconThe effect of dislocations on the efficiency of InGaN/GaN solar cells
Zhang Y, Kappers MJ, Zhu D, Oehler F, Gao F and Humphreys CJ
Solar Energy Materials and Solar Cells, Elsevier vol. 117, 279-284.  
01-10-2013
bullet iconThe impact of gross well width fluctuations on the efficiency of GaN-based light emitting diodes
Oliver RA, Massabuau FC-P, Kappers MJ, Phillips WA, Thrush EJ, Tartan CC, Blenkhorn WE, Badcock TJ, Dawson P, Hopkins MA, Allsopp DWE and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 103 (14) 
30-09-2013
bullet iconThe dissociation of the [a + c] dislocation in GaN
Hirsch PB, Lozano JG, Rhode S, Horton MK, Moram MA, Zhang S, Kappers MJ, Humphreys CJ, Yasuhara A, Okunishi E and Nellist PD
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 93 (28-30), 3925-3938.  
30-09-2013
bullet iconPrecision transfer printing of ultra-thin AlInGaN micron-size light-emitting diodes
Trindade AJ, Massoubre D, Guilhabert B, Zhu D, Laurand N, Gu E, Watson IM, Humphreys CJ and Dawson’ MD
2013 IEEE Photonics Conference. vol. 1, 217-218.  
01-09-2013
bullet iconMeasuring the composition of AlGaN layers in GaN based structures grown on 150?mm Si substrates using (2?0?5) reciprocal space maps
Wallis DJ, Zhu D, Oehler F, Westwater SP, Pujol A and Humphreys CJ
Semiconductor Science and Technology, Iop Publishing vol. 28 (9) 
21-08-2013
bullet iconFundamentals of X-ray Diffraction Characterisation of Strain in GaN Based Compounds
Oehler F, Vickers ME, Kappers MJ, Humphreys CJ and Oliver RA
Japanese Journal of Applied Physics, Iop Publishing vol. 52 (8S) 
22-07-2013
bullet iconMg Doping Affects Dislocation Core Structures in GaN
Rhode SK, Horton MK, Kappers MJ, Zhang S, Humphreys CJ, Dusane RO, Sahonta S-L and Moram MA
Physical Review Letters, American Physical Society (Aps) vol. 111 (2) 
09-07-2013
bullet iconElectroluminescence Analysis and Simulation of the Effects of Injection and Temperature on Carrier Distribution in InGaN-Based Light-Emitting Diodes with Color-Coded Quantum Wells
Meneghini M, Vaccari S, Garbujo A, Trivellin N, Zhu D, Humphreys CJ, Calciati M, Goano M, Bertazzi F, Ghione G, Bellotti E, Meneghesso G and Zanoni E
Japanese Journal of Applied Physics, Iop Publishing vol. 52 (8S) 
31-05-2013
bullet iconEvidence for Dark States in the Temperature Dependent Recombination Dynamics of InGaN/GaN Quantum Wells
Badcock TJ, Dawson P, Oliver RA, Kappers MJ and Humphreys CJ
Japanese Journal of Applied Physics, Iop Publishing vol. 52 (8S) 
31-05-2013
bullet iconCarrier Density Dependent Localization and Consequences for Efficiency Droop in InGaN/GaN Quantum Well Structures
Badcock TJ, Hammersley S, Watson-Parris D, Dawson P, Godfrey MJ, Kappers MJ, McAleese C, Oliver RA and Humphreys CJ
Japanese Journal of Applied Physics, Iop Publishing vol. 52 (8S) 
31-05-2013
bullet iconComposition and luminescence studies of InGaN epilayers grown at different hydrogen flow rates
Taylor E, Fang F, Oehler F, Edwards PR, Kappers MJ, Lorenz K, Alves E, McAleese C, Humphreys CJ and Martin RW
Semiconductor Science and Technology, Iop Publishing vol. 28 (6) 
16-05-2013
bullet iconChanges in the Mg profile and in dislocations induced by high temperature annealing of blue LEDs
Meneghini M, Trivellin N, Berti M, Cesca T, Gasparotto A, Vinattieri A, Bogani F, Zhu D, Humphreys CJ, Meneghesso G and Zanoni E
Gallium Nitride Materials and Devices VIII. vol. 8625 
22-02-2013
bullet iconCorrelations between the morphology and emission properties of trench defects in InGaN/GaN quantum wells
Massabuau FC-P, Trinh-Xuan L, Lodié D, Thrush EJ, Zhu D, Oehler F, Zhu T, Kappers MJ, Humphreys CJ and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 113 (7) 
15-02-2013
bullet iconThe impact of substrate miscut on the morphology of InGaN epitaxial layers subjected to a growth interruption
Jouvet N, Kappers MJ, Humphreys CJ and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 113 (6) 
11-02-2013
bullet iconHigh-Speed Substrate-Emitting Micro-Light-Emitting Diodes for Applications Requiring High Radiance
Maaskant PP, Shams H, Akhter M, Henry W, Kappers MJ, Zhu D, Humphreys CJ and Corbett B
Applied Physics Express, Iop Publishing vol. 6 (2) 
01-02-2013
bullet iconHigh excitation carrier density recombination dynamics of InGaN/GaN quantum well structures: Possible relevance to efficiency droop
Davies MJ, Badcock TJ, Dawson P, Kappers MJ, Oliver RA and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 102 (2) 
14-01-2013
bullet iconCharacteristics and applications of InGaN micro-light emitting diodes on Si substrates
Tian P, McKendry JJD, Gong Z, Zhang S, Watson S, Zhu D, Watson IM, Gu E, Kelly AE, Humphreys CJ and Dawson MD
2013 IEEE Photonics Conference., 97-98.  
01-01-2013

2012

bullet iconThe significance of Bragg's law in electron diffraction and microscopy, and Bragg's second law
Humphreys CJ
Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 69 (1), 45-50.  
05-12-2012
bullet iconProperties of trench defects in InGaN/GaN quantum well structures
Sahonta S, Kappers MJ, Zhu D, Puchtler TJ, Zhu T, Bennett SE, Humphreys CJ and Oliver RA
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 210 (1), 195-198.  
21-11-2012
bullet iconMorphological, structural, and emission characterization of trench defects in InGaN/GaN quantum well structures
Massabuau FC-P, Sahonta S-L, Trinh-Xuan L, Rhode S, Puchtler TJ, Kappers MJ, Humphreys CJ and Oliver RA
Applied Physics Letters, Aip Publishing vol. 101 (21) 
19-11-2012
bullet iconLow-cost high-efficiency GaN LEDs on 6-inch Si
Humphreys C
Solid-State and Organic Lighting, SOLED 2012
11-11-2012
bullet iconCharacterisation of defects in p-GaN by admittance spectroscopy
Elsherif OS, Vernon-Parry KD, Evans-Freeman JH, Airey RJ, Kappers M and Humphreys CJ
Physica B Condensed Matter. vol. 407 (15), 2960-2963.  
01-08-2012
bullet iconRecombination mechanisms in heteroepitaxial non-polar InGaN/GaN quantum wells
Badcock TJ, Hao R, Moram MA, Kappers MJ, Dawson P, Oliver RA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 112 (1) 
01-07-2012
bullet iconThe consequences of high injected carrier densities on carrier localization and efficiency droop in InGaN/GaN quantum well structures
Hammersley S, Watson-Parris D, Dawson P, Godfrey MJ, Badcock TJ, Kappers MJ, McAleese C, Oliver RA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 111 (8) 
15-04-2012
bullet iconAnalysis of Defect-Related Localized Emission Processes in InGaN/GaN-Based LEDs
Meneghini M, Vaccari S, Trivellin N, Zhu D, Humphreys C, Butendheich R, Leirer C, Hahn B, Meneghesso G and Zanoni E
Ieee Transactions On Electron Devices, Institute of Electrical and Electronics Engineers (Ieee) vol. 59 (5), 1416-1422.  
08-03-2012
bullet iconAtom probe tomography characterisation of a laser diode structure grown by molecular beam epitaxy
Bennett SE, Smeeton TM, Saxey DW, Smith GDW, Hooper SE, Heffernan J, Humphreys CJ and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 111 (5) 
01-03-2012
bullet iconExciton confinement in narrow non‐polar InGaN/GaN quantum wells grown on r‐plane sapphire
Badcock TJ, Kappers MJ, Moram MA, Hao R, Dawson P and Humphreys CJ
Physica Status Solidi (B), Wiley vol. 249 (3), 494-497.  
16-02-2012
bullet iconDetermination of the composition and thickness of semi-polar and non-polar III-nitride films and quantum wells using X-ray scattering
Vickers ME, Hollander JL, McAleese C, Kappers MJ, Moram MA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 111 (4) 
15-02-2012
bullet iconMeasurement of the Al content in AlGaN epitaxial layers by combined energy‐dispersive X‐ray and electron energy‐loss spectroscopy in a transmission electron microscope
Amari H, Kappers MJ, Humphreys CJ, Chèze C and Walther T
Physica Status Solidi (C), Wiley vol. 9 (3‐4), 1079-1082.  
14-02-2012
bullet iconStudies of efficiency droop in GaN based LEDs
Phillips WA, Thrush EJ, Zhang Y and Humphreys CJ
physica status solidi (c). vol. 9 (3‐4), 765-769.  
26-01-2012
bullet iconElectron holography of an in‐situ biased GaN‐based LED
Liu LZ, McAleese C, Rao DVS, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 9 (3‐4), 704-707.  
26-01-2012
bullet iconOn the origin of blue‐green emission from heteroepitaxial nonpolar a‐plane InGaN quantum wells
Kappers MJ, Badcock TJ, Hao R, Moram MA, Hammersley S, Dawson P and Humphreys CJ
physica status solidi (c). vol. 9 (3‐4), 465-468.  
26-01-2012
bullet iconStructure and chemistry of the Si(111)/AlN interface
Radtke G, Couillard M, Botton GA, Zhu D and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 100 (1) 
02-01-2012
bullet iconLow-cost high-efficiency GaN LEDs on 6-inch Si
Humphreys C
Renewable Energy and the Environment Optics and Photonics Congress
01-01-2012
bullet iconCharacterization of defects in Mg doped GaN epitaxial layers using conductance measurements
Elsherif OS, Vernon-Parry KD, Dharmadasa IM, Evans-Freeman JH, Airey RJ, Kappers MJ and Humphreys CJ
Thin Solid Films, Elsevier vol. 520 (7), 3064-3070.  
01-01-2012

2011

bullet iconModification of carrier localization in basal‐plane stacking faults: The effect of Si‐doping in a‐plane GaN
Badcock TJ, Kappers MJ, Moram MA, Dawson P and Humphreys CJ
Physica Status Solidi (B), Wiley vol. 249 (3), 498-502.  
27-12-2011
bullet iconDefect reduction processes in heteroepitaxial non-polar a-plane GaN films
Hao R, Kappers MJ, Moram MA and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 337 (1), 81-86.  
01-12-2011
bullet iconGrowth, microstructure and morphology of epitaxial ScGaN films
Knoll SM, Zhang S, Joyce TB, Kappers MJ, Humphreys CJ and Moram MA
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 209 (1), 33-40.  
24-11-2011
bullet iconHigh‐efficiency InGaN/GaN quantum well structures on large area silicon substrates
Zhu D, McAleese C, Häberlen M, Kappers MJ, Hylton N, Dawson P, Radtke G, Couillard M, Botton GA, Sahonta S and Humphreys CJ
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 209 (1), 13-16.  
21-11-2011
bullet iconAccurate calibration for the quantification of the Al content in AlGaN epitaxial layers by energy-dispersive X-ray spectroscopy in a Transmission Electron Microscope
Amari H, Lari L, Zhang HY, Geelhaar L, Chèze C, Kappers MJ, McAleese C, Humphreys CJ and Walther T
Journal of Physics Conference Series. vol. 326 (1) 
09-11-2011
bullet iconStrain-induced effects on the electronic structure and N K-edge ELNES of wurtzite AlN and AlxGa1−xN
Petrov M, Holec D, Lymperakis L, Neugebauer J and Humphreys CJ
Journal of Physics Conference Series. vol. 326 (1) 
09-11-2011
bullet iconResponse to “Comment on ‘The effects of Si doping on dislocation movement and tensile stress in GaN films’” [J. Appl. Phys. 109, 073509 (2011)]
Moram MA, Kappers MJ, Massabuau F, Oliver RA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 110 (9) 
01-11-2011
bullet iconStructural Characterisation of Improved GaN Epilayers Grown on a Ge(111) Substrate
Zhang Y, Fu W-Y, Humphreys C and Lieten R
Applied Physics Express, Iop Publishing vol. 4 (9) 
26-08-2011
bullet iconThe Effect of Dislocation Density and Surface Morphology on the Optical Properties of InGaN/GaN Quantum Wells Grown on r-Plane Sapphire Substrates
Badcock TJ, Hao R, Moram MA, Kappers MJ, Dawson P and Humphreys CJ
Japanese Journal of Applied Physics, Iop Publishing vol. 50 (8R) 
01-08-2011
bullet iconThe Effect of Dislocation Density and Surface Morphology on the Optical Properties of InGaN/GaN Quantum Wells Grown on r -Plane Sapphire Substrates
Badcock TJ, Hao R, Moram MA, Kappers MJ, Dawson P and Humphreys CJ
Japanese Journal of Applied Physics, Iop Publishing vol. 50 (8R) 
01-08-2011
bullet iconAtom probe tomography assessment of the impact of electron beam exposure on InxGa1−xN/GaN quantum wells
Bennett SE, Saxey DW, Kappers MJ, Barnard JS, Humphreys CJ, Smith GD and Oliver RA
Applied Physics Letters, Aip Publishing vol. 99 (2) 
11-07-2011
bullet iconStudy of efficiency droop and carrier localisation in an InGaN/GaN quantum well structure
Hammersley S, Badcock TJ, Watson‐Parris D, Godfrey MJ, Dawson P, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 8 (7‐8), 2194-2196.  
20-06-2011
bullet iconProperties of surface‐pit related emission in a ‐plane InGaN/GaN quantum wells grown on r ‐plane sapphire
Badcock TJ, Hao R, Moram MA, Dawson P, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 8 (7‐8), 2179-2181.  
07-06-2011
bullet iconDislocation Climb in c-Plane AlN Films
Fu WY, Kappers MJ, Zhang Y, Humphreys CJ and Moram MA
Applied Physics Express, Iop Publishing vol. 4 (6) 
01-06-2011
bullet iconThe effect of indium concentration on the optical properties of a‐plane InGaN/GaN quantum wells grown on r‐plane sapphire substrates
Badcock TJ, Hao R, Moram MA, Dawson P, Kappers MJ and Humphreys CJ
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 208 (7), 1529-1531.  
01-06-2011
bullet iconTowards predictive modeling of near-edge structures in electron energy-loss spectra of AlN-based ternary alloys
Holec D, Rachbauer R, Kiener D, Cherns PD, Costa PMFJ, McAleese C, Mayrhofer PH and Humphreys CJ
Physical Review B, American Physical Society (Aps) vol. 83 (16) 
15-04-2011
bullet iconThe effects of Si doping on dislocation movement and tensile stress in GaN films
Moram MA, Kappers MJ, Massabuau F, Oliver RA and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 109 (7) 
01-04-2011
bullet iconThe Mystery of the Last Supper
Humphreys CJ
 
28-03-2011
bullet iconCarrier localization mechanisms in InxGa1-xN/GaN quantum wells
Watson-Parris D, Godfrey MJ, Dawson P, Oliver RA, Galtrey MJ, Kappers MJ and Humphreys CJ
Physical Review B, American Physical Society (Aps) vol. 83 (11) 
15-03-2011
bullet iconLighting
Zhu D and Humphreys CJ
In Fundamentals of Materials For Energy and Environmental Sustainability, Cambridge University Press (Cup) 474-490.  
01-01-2011
bullet iconA quantitative model for doping contrast in the scanning electron microscope using calculated potential distributions and Monte Carlo simulations
Chee AKW, Broom RF, Humphreys CJ and Bosch EGT
Journal of Applied Physics, Aip Publishing vol. 109 (1) 
01-01-2011
bullet iconEfficiency measurement of GaN-based quantum well and light-emitting diode structures grown on silicon substrates
Zhu D, McAleese C, Häberlen M, Salcianu C, Thrush T, Kappers M, Phillips A, Lane P, Kane M, Wallis D, Martin T, Astles M, Hylton N, Dawson P and Humphreys C
Journal of Applied Physics, Aip Publishing vol. 109 (1) 
01-01-2011

2010

bullet iconDislocation movement in GaN films
Moram MA, Sadler TC, Häberlen M, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 97 (26) 
27-12-2010
bullet iconScanning transmission electron microscopy investigation of the Si(111)/AlN interface grown by metalorganic vapor phase epitaxy
Radtke G, Couillard M, Botton GA, Zhu D and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 97 (25) 
20-12-2010
bullet iconInclined dislocation arrays in AlGaN/AlGaN quantum well structures emitting at 290 nm
Chang TY, Moram MA, McAleese C, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 108 (12) 
15-12-2010
bullet iconAtom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice
Bennett SE, Ulfig RM, Clifton PH, Kappers MJ, Barnard JS, Humphreys CJ and Oliver RA
Ultramicroscopy, Elsevier vol. 111 (3), 207-211.  
01-12-2010
bullet iconThe effects of annealing on non-polar (112¯0) a-plane GaN films
Hao R, Zhu T, Häberlen M, Chang TY, Kappers MJ, Oliver RA, Humphreys CJ and Moram MA
Journal of Crystal Growth, Elsevier vol. 312 (23), 3536-3543.  
01-11-2010
bullet iconElectronic and optical properties of nonpolar a-plane GaN quantum wells
Schulz S, Badcock TJ, Moram MA, Dawson P, Kappers MJ, Humphreys CJ and O’Reilly EP
Physical Review B, American Physical Society (Aps) vol. 82 (12) 
15-09-2010
bullet iconMicrostructural origins of localization in InGaN quantum wells
Oliver RA, Bennett SE, Zhu T, Beesley DJ, Kappers MJ, Saxey DW, Cerezo A and Humphreys CJ
Journal of Physics D, Iop Publishing vol. 43 (35) 
19-08-2010
bullet iconA Direct Method for Charge Collection Probability Computation Using the Reciprocity Theorem
Kurniawan O, Tan CC, Ong VKS, Li E and Humphreys CJ
Ieee Transactions On Electron Devices, Institute of Electrical and Electronics Engineers (Ieee) vol. 57 (10), 2455-2461.  
09-08-2010
bullet iconLow temperature photoluminescence and cathodoluminescence studies of nonpolar GaN grown using epitaxial lateral overgrowth
Häberlen M, Badcock TJ, Moram MA, Hollander JL, Kappers MJ, Dawson P, Humphreys CJ and Oliver RA
Journal of Applied Physics, Aip Publishing vol. 108 (3) 
01-08-2010
bullet iconLow dislocation density nonpolar (11‐20) GaN films achieved using scandium nitride interlayers
Moram MA, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 7 (7‐8), 1778-1780.  
01-07-2010
bullet iconEnergy filtered scanning electron microscopy: applications to characterisation of semiconductors
Rodenburg C, Jepson MAE, Inkson BJ, Bosch EGT and Humphreys CJ
Journal of Physics Conference Series. vol. 241 (1) 
01-07-2010
bullet iconAtom probe extended to AlGaN: three‐dimensional imaging of a Mg‐doped AlGaN/GaN superlattice
Bennett SE, Clifton PH, Ulfig RM, Kappers MJ, Barnard JS, Humphreys CJ and Oliver RA
physica status solidi (c). vol. 7 (7‐8), 1781-1783.  
01-07-2010
bullet iconInGaN/GaN LEDs grown on Si(111): dependence of device performance on threading dislocation density and emission wavelength
Zhu D, McAleese C, Häberlen M, Salcianu C, Thrush T, Kappers M, Phillips A, Lane P, Kane M, Wallis D, Martin T, Astles M and Humphreys C
physica status solidi (c). vol. 7 (7‐8), 2168-2170.  
01-07-2010
bullet iconEnergy landscape and carrier wave‐functions in InGaN/GaN quantum wells
Watson‐Parris D, Godfrey MJ, Oliver RA, Dawson P, Galtrey MJ, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 7 (7‐8), 2255-2258.  
01-07-2010
bullet iconQ‐factor measurements on planar nitride cavities
Collins DP, Holmes MJ, Taylor RA, Oliver RA, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 7 (7‐8), 1866-1868.  
01-07-2010
bullet iconEffect of overgrowth conditions on the optical properties of lateral epitaxially overgrown a ‐plane GaN
Badcock TJ, Häberlen M, Kappers MJ, Moram MA, Dawson P, Humphreys CJ and Oliver RA
physica status solidi (c). vol. 7 (7‐8), 2088-2090.  
01-07-2010
bullet iconCarrier dynamics in non‐polar GaN/AlGaN quantum wells intersected by basal‐plane stacking faults
Badcock TJ, Hammersley S, Kappers MJ, Humphreys CJ and Dawson P
physica status solidi (c). vol. 7 (7‐8), 1894-1896.  
01-07-2010
bullet iconCharacterising the degree of polarisation anisotropy in an a ‐plane GaN film
Badcock TJ, Schulz S, Moram MA, Kappers MJ, Dawson P, O'Reilly EP and Humphreys CJ
physica status solidi (c). vol. 7 (7‐8), 1897-1899.  
01-07-2010
bullet iconLooking Inside the Fascinating Nanoworld Controlling Light Emission from InGaN/GaN Quantum Well Devices
Humphreys C, Oliver R, Kappers M, Bennett , Parris D, Dawson P, Godfrey M, Clifton P, Larson D, Ulfig R, Saxey D and Cerezo A
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 16 (S2), 1890-1891.  
01-07-2010
bullet iconDislocation reduction in GaN grown on Si(111) using a strain‐driven 3D GaN interlayer
Häberlen M, Zhu D, McAleese C, Zhu T, Kappers MJ and Humphreys CJ
physica status solidi (b). vol. 247 (7), 1753-1756.  
08-06-2010
bullet iconImaging dislocations in gallium nitride across broad areas using atomic force microscopy
Bennett SE, Holec D, Kappers MJ, Humphreys CJ and Oliver RA
Review of Scientific Instruments, Aip Publishing vol. 81 (6) 
01-06-2010
bullet iconCombined structure‐factor phase measurement and theoretical calculations for mapping of chemical bonds in GaN
Jiang B, Zuo JM, Holec D, Humphreys CJ, Spackman M and Spence JCH
Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 66 (4), 446-450.  
07-05-2010
bullet iconProgress towards quantitative dopant profiling in the SEM
Chee KWA, Bosch EGT and Humphreys CJ
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconLattice distortions in GaN thin films on (0001) sapphire
Rao DVS, Beanland R, Kappers MJ, Zhu D and Humphreys CJ
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconDislocation reduction in MOVPE grown GaN layers on (111)Si using SiNx and AlGaN layers
Haeberlen M, Zhu D, McAleese C, Kappers MJ and Humphreys CJ
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconScanning capacitance microscopy studies of GaN grown by epitaxial layer overgrowth
Oliver RA, Bennett SE, Sumner J, Kappers MJ and Humphreys CJ
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconSite-selective dopant profiling of p-n junction specimens in the dual-beam FIB/SEM system
Chee KWA, Beanland R, Midgley PA and Humphreys CJ
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconThe role of rough surfaces in quantitative ADF imaging of gallium nitride-based materials
Barnard JS, Bennett SE, Oliver RA, Kappers MJ and Humphreys CJ
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconMg dopant distribution in an AlGaN/GaN p-type superlattice assessed using atom probe tomography, TEM and SIMS
Bennett SE, Clifton PH, Ulfig RM, Kappers MJ, Barnard JS, Humphreys CJ and Oliver RA
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconProgress towards site-specific dopant profiling in the scanning electron microscope
Jepson MAE, Inkson BJ, Beanland R, Chee AKW, Humphreys CJ and Rodenburg C
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconReduction of the dislocation density in HVPE-grown GaN epi-layers by an in situ SiNx treatment
Ashraf H, Rao DVS, Gogova D, Siche D, Fornari R, Humphreys CJ and Hageman PR
Journal of Crystal Growth, Elsevier vol. 312 (4), 595-600.  
01-02-2010
bullet iconEnergy filtered scanning electron microscopy: Applications to dopant contrast
Rodenburg C, Jepson MAE, Inkson BJ, Bosch E, Chee AKW and Humphreys CJ
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconBasal-plane stacking faults in non-polar GaN studied by off-axis electron holography
Liu LZ-Y, Rao DVS, Kappers MJ, Humphreys CJ and Geiger D
Journal of Physics Conference Series. vol. 209 (1) 
01-02-2010
bullet iconMeasuring dislocation densities in nonpolar a-plane GaN films using atomic force microscopy
Moram MA, Johnston CF, Kappers MJ and Humphreys CJ
Journal of Physics D, Iop Publishing vol. 43 (5) 
21-01-2010
bullet iconLow dislocation density GaN growth on high-temperature AlN buffer layers on (0001) sapphire
Kappers MJ, Moram MA, Rao DVS, McAleese C and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 312 (3), 363-367.  
01-01-2010

2009

bullet iconCavity Enhancement of Single Quantum Dot Emission in the Blue
Taylor RA, Jarjour AF, Collins DP, Holmes MJ, Oliver RA, Kappers MJ and Humphreys CJ
Discover Nano, Springer Nature vol. 5 (3) 
27-12-2009
bullet iconStructural properties of wurtzitelike ScGaN films grown by NH3-molecular beam epitaxy
Moram MA, Zhang Y, Joyce TB, Holec D, Chalker PR, Mayrhofer PH, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 106 (11) 
01-12-2009
bullet iconScanning capacitance microscopy studies of unintentional doping in epitaxial lateral overgrowth GaN
Sumner J, Oliver RA, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 106 (10) 
15-11-2009
bullet iconThe Spatial Distribution of Threading Dislocations in Gallium Nitride Films
Moram MA, Oliver RA, Kappers MJ and Humphreys CJ
Advanced Materials, Wiley vol. 21 (38‐39), 3941-3944.  
16-10-2009
bullet iconCarrier distribution in InGaN/GaN tricolor multiple quantum well light emitting diodes
Charash R, Maaskant PP, Lewis L, McAleese C, Kappers MJ, Humphreys CJ and Corbett B
Applied Physics Letters, Aip Publishing vol. 95 (15) 
12-10-2009
bullet iconOn the origin of threading dislocations in GaN films
Moram MA, Ghedia CS, Rao DVS, Barnard JS, Zhang Y, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 106 (7) 
01-10-2009
bullet iconMorphological changes of InGaN epilayers during annealing assessed by spectral analysis of atomic force microscopy images
Oliver RA, Sumner J, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 106 (5) 
01-09-2009
bullet iconInvestigating stacking faults in nonpolar gallium nitride films using X-ray diffraction
Moram MA, Johnston CF, Kappers MJ and Humphreys CJ
Physica B Condensed Matter, Elsevier vol. 404 (16), 2189-2191.  
01-08-2009
bullet iconAtom Probe Tomography Studies of GaN-Based Semiconductor Materials
Bennett , Oliver R, Saxey D, Cerezo A, Clifton P, Ulfig R, Kappers M and Humphreys C
Microscopy and Microanalysis. vol. 15 (S2), 280-281.  
01-07-2009
bullet iconHighly conductive modulation doped composition graded p-AlGaN/(AlN)/GaN multiheterostructures grown by metalorganic vapor phase epitaxy
Hertkorn J, Thapa SB, Wunderer T, Scholz F, Wu ZH, Wei QY, Ponce FA, Moram MA, Humphreys CJ, Vierheilig C and Schwarz UT
Journal of Applied Physics, Aip Publishing vol. 106 (1) 
01-07-2009
bullet iconThe effects of film surface roughness on x-ray diffraction of nonpolar gallium nitride films
Moram MA, Johnston CF, Kappers MJ and Humphreys CJ
Journal of Physics D, Iop Publishing vol. 42 (13) 
16-06-2009
bullet iconOptical polarization anisotropy of a-plane GaN/AlGaN multiple quantum well structures grown on r-plane sapphire substrates
Badcock TJ, Dawson P, Kappers MJ, McAleese C, Hollander JL, Johnston CF, Rao DVS, Sanchez AM and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 105 (12) 
15-06-2009
bullet iconLattice distortions in GaN on sapphire using the CBED–HOLZ technique
Rao DVS, McLaughlin K, Kappers MJ and Humphreys CJ
Ultramicroscopy, Elsevier vol. 109 (10), 1250-1255.  
12-06-2009
bullet iconDefect reduction in nonpolar and semipolar GaN using scandium nitride interlayers
Moram MA, Johnston CF, Kappers MJ and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 311 (12), 3239-3242.  
01-06-2009
bullet iconAssessment of defect reduction methods for nonpolar a-plane GaN grown on r-plane sapphire
Johnston CF, Kappers MJ, Moram MA, Hollander JL and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 311 (12), 3295-3299.  
01-06-2009
bullet iconDefect reduction in non‐polar (11$ \bar 2 $0) GaN grown on (1$ \bar 1 $02) sapphire
Johnston CF, Kappers MJ, Moram MA, Hollander JL and Humphreys CJ
physica status solidi (a) – applications and materials science. vol. 206 (6), 1190-1193.  
01-06-2009
bullet iconUnderstanding x-ray diffraction of nonpolar gallium nitride films
Moram MA, Johnston CF, Hollander JL, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 105 (11) 
01-06-2009
bullet iconPerformance and degradation characteristics of blue–violet laser diodes grown by molecular beam epitaxy
Tan WS, Kauer M, Hooper SE, Smeeton TM, Bousquet V, Rossetti M, Heffernan J, Xiu H and Humphreys CJ
physica status solidi (a) – applications and materials science. vol. 206 (6), 1205-1210.  
01-06-2009
bullet iconTwo-photon autocorrelation measurements on a single InGaN/GaN quantum dot
Collins D, Jarjour A, Hadjipanayi M, Taylor R, Oliver R, Kappers M, Humphreys C and Tahraoui A
Nanotechnology, Iop Publishing vol. 20 (24) 
27-05-2009
bullet iconOptical and microstructural properties of semi‐polar (11‐22) InGaN/GaN quantum well structures
Hylton NP, Dawson P, Johnston CF, Kappers MJ, Hollander JL, McAleese C and Humphreys CJ
physica status solidi (c). vol. 6 (S2), s727-s730.  
26-05-2009
bullet iconOptical polarisation anisotropy in a ‐plane GaN/AlGaN multiple quantum well structures
Badcock TJ, Dawson P, Kappers MJ, McAleese C, Hollander JL, Johnston CF, Rao DVS, Sanchez AM and Humphreys CJ
physica status solidi (c). vol. 6 (S2), s523-s526.  
26-05-2009
bullet iconDefect reduction in (112¯2) semipolar GaN grown on m-plane sapphire using ScN interlayers
Johnston CF, Moram MA, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 94 (16) 
20-04-2009
bullet iconMicrostructural evolution of nonpolar (11-20) GaN grown on (1-102) sapphire using a 3D-2D method
Johnston CF, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 105 (7) 
01-04-2009
bullet iconNon‐linear excitation and correlation studies of single InGaN quantum dots
Collins DP, Jarjour AF, Taylor RA, Hadjipanayi M, Oliver RA, Kappers MJ, Humphreys CJ and Tahraoui A
physica status solidi (c). vol. 6 (4), 864-867.  
01-04-2009
bullet iconHANSIS software tool for the automated analysis of HOLZ lines
Holec D, Rao DVS and Humphreys CJ
Ultramicroscopy, Elsevier vol. 109 (7), 837-844.  
24-03-2009
bullet iconGrowth of ScN epitaxial films by plasma-assisted molecular beam epitaxy
Hall JL, Moram MA, Sanchez A, Novikov SV, Kent AJ, Foxon CT, Humphreys CJ and Campion RP
Journal of Crystal Growth, Elsevier vol. 311 (7), 2054-2057.  
01-03-2009
bullet iconGaN-based LEDs grown on 6-inch diameter Si (111) substrates by MOVPE
Zhu D, McAleese C, McLaughlin KK, Häberlen M, Salcianu CO, Thrush EJ, Kappers MJ, Phillips WA, Lane P, Wallis DJ, Martin T, Astles M, Thomas S, Pakes A, Heuken M and Humphreys CJ
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIII. vol. 7231 
03-02-2009
bullet iconCoherent terahertz acoustic vibrations in polar and semipolar gallium nitride-based superlattices
Moss DM, Akimov AV, Kent AJ, Glavin BA, Kappers MJ, Hollander JL, Moram MA and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 94 (1) 
05-01-2009

2008

bullet iconEquilibrium critical thickness for misfit dislocations in III-nitrides
Holec D, Zhang Y, Rao DVS, Kappers MJ, McAleese C and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 104 (12) 
15-12-2008
bullet iconElectrically driven single InGaN/GaN quantum dot emission
Jarjour AF, Taylor RA, Oliver RA, Kappers MJ, Humphreys CJ and Tahraoui A
Applied Physics Letters, Aip Publishing vol. 93 (23) 
08-12-2008
bullet iconA theoretical study of ELNES spectra of AlxGa1-xN using Wien2k and Telnes programs
Holec D, Costa PMFJ, Cherns PD and Humphreys CJ
Computational Materials Science. vol. 44 (1), 91-96.  
01-11-2008
bullet iconProperties of non-polar a-plane GaN/AlGaN quantum wells
Kappers MJ, Hollander JL, Johnston CF, McAleese C, Rao DVS, Sanchez AM, Humphreys CJ, Badcock TJ and Dawson P
Journal of Crystal Growth. vol. 310 (23), 4983-4986.  
01-11-2008
bullet iconThe effect of oxygen incorporation in sputtered scandium nitride films
Moram MA, Barber ZH and Humphreys CJ
Thin Solid Films, Elsevier vol. 516 (23), 8569-8572.  
01-10-2008
bullet iconOptical properties of GaN/AlGaN quantum wells grown on nonpolar substrates
Badcock TJ, Dawson P, Kappers MJ, McAleese C, Hollander JL, Johnston CF, Rao DVS, Sanchez AM and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 93 (10) 
08-09-2008
bullet iconCharacterisation of non-polar (11-20) gallium nitride using TEM techniques
Johnston CF, Kappers MJ, Barnard JS and Humphreys CJ
Journal of Physics Conference Series. vol. 126 (1) 
01-08-2008
bullet iconHigh resolution dopant profiling in the SEM, image widths and surface band-bending
Chee KWA, Rodenburg C and Humphreys CJ
Journal of Physics Conference Series. vol. 126 (1) 
01-08-2008
bullet iconInsights into the growth mechanism of InxGa1−xN epitaxial nanostructures formed using a silane predose
Oliver RA, Van der Laak NK, Kappers MJ and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 310 (15), 3459-3465.  
01-07-2008
bullet iconThree-dimensional atom probe analysis of green- and blue-emitting InxGa1−xN∕GaN multiple quantum well structures
Galtrey MJ, Oliver RA, Kappers MJ, Humphreys CJ, Clifton PH, Larson D, Saxey DW and Cerezo A
Journal of Applied Physics, Aip Publishing vol. 104 (1) 
01-07-2008
bullet iconHigh Resolution Laplace Deep Level Transient Spectroscopy Studies of Shallow and Deep Levels in n-GaN
Emiroglu D, Evans-Freeman J, Kappers MJ, McAleese C and Humphreys CJ
2008 Conference on Optoelectronic and Microelectronic Materials and Devices., 30-33.  
01-07-2008
bullet iconHigh resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems
Oliver RA, Galtrey MJ and Humphreys CJ
Materials Science and Technology, Sage Publications vol. 24 (6), 675-681.  
01-06-2008
bullet iconThe effect of wafer curvature on x-ray rocking curves from gallium nitride films
Moram MA, Vickers ME, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 103 (9) 
01-05-2008
bullet iconMorphological study of non‐polar (11‐20) GaN grown on r‐plane (1‐102) sapphire
Johnston CF, Kappers MJ, Barnard JS and Humphreys CJ
physica status solidi (c). vol. 5 (6), 1786-1788.  
01-05-2008
bullet iconAssessment of scanning spreading resistance microscopy for application to n‐type GaN
Sumner J, Oliver RA, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 5 (6), 1652-1654.  
01-05-2008
bullet iconPalladium‐based on‐wafer electroluminescence studies of GaN‐based LED structures
Salcianu CO, Thrush EJ, Plumb RG, Boyd AR, Rockenfeller O, Schmitz D, Heuken M and Humphreys CJ
physica status solidi (c). vol. 5 (6), 2219-2221.  
01-05-2008
bullet iconGross well‐width fluctuations in InGaN quantum wells
Oliver RA, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 5 (6), 1475-1481.  
01-05-2008
bullet iconVery low dislocation density, resistive GaN films obtained using transition metal nitride interlayers
Moram MA, Kappers MJ, Zhang Y, Barber ZH and Humphreys CJ
physica status solidi (a) – applications and materials science. vol. 205 (5), 1064-1066.  
01-05-2008
bullet iconDegradation of III‐nitride laser diodes grown by molecular beam epitaxy
Xiu H, Thrush EJ, Kauer M, Smeeton TM, Hooper SE, Heffernan J and Humphreys CJ
physica status solidi (c). vol. 5 (6), 2204-2206.  
01-05-2008
bullet iconStructural features in GaN grown on a Ge(111) substrate
Zhang Y, McAleese C, Xiu H, Humphreys CJ, Lieten RR, Degroote S and Borghs G
physica status solidi (c). vol. 5 (6), 1802-1804.  
01-05-2008
bullet iconGrowth of epitaxial thin films of scandium nitride on 100-oriented silicon
Moram MA, Novikov SV, Kent AJ, Nörenberg C, Foxon CT and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 310 (11), 2746-2750.  
01-05-2008
bullet iconHigh brightness near‐ultraviolet resonant LEDs
Corbett B, Zhu D, Roycroft B, Maaskant P, Akhter M, McAleese C, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 5 (6), 2056-2058.  
01-05-2008
bullet iconOrigin of additional threading dislocations in AlGaN grown on GaN using AlN as an interlayer
Datta R, McAleese C, Cherns P, Rayment FDG and Humphreys CJ
physica status solidi (c). vol. 5 (6), 1743-1745.  
01-05-2008
bullet iconHigh resolution Laplace deep level transient spectroscopy studies of electron and hole traps in n‐type GaN
Emiroglu D, Evans‐Freeman J, Kappers MJ, McAleese C and Humphreys CJ
physica status solidi (c). vol. 5 (6), 1482-1484.  
01-05-2008
bullet iconExperimental and theoretical study of the quantum-confined Stark effect in a single InGaN/GaN quantum dot under applied vertical electric field
Jarjour AF, Oliver RA, Tahraoui A, Kappers MJ, Taylor RA and Humphreys CJ
Superlattices and Microstructures. vol. 43 (5-6), 431-435.  
01-05-2008
bullet iconEffects of resonant LO phonon assisted excitation on the photoluminescence spectra of InGaN/GaN quantum wells
Dawson P, Hylton NP, Kappers MJ, McAleese C and Humphreys CJ
physica status solidi (c). vol. 5 (6), 2270-2273.  
01-05-2008
bullet iconUnintentional doping in GaN assessed by scanning capacitance microscopy
Sumner J, Bakshi SD, Oliver RA, Kappers MJ and Humphreys CJ
physica status solidi (b). vol. 245 (5), 896-898.  
28-04-2008
bullet iconAtom probe reveals the structure of Inx Ga1–x N based quantum wells in three dimensions
Galtrey MJ, Oliver RA, Kappers MJ, McAleese C, Zhu D, Humphreys CJ, Clifton PH, Larsen D and Cerezo A
physica status solidi (b). vol. 245 (5), 861-867.  
28-04-2008
bullet iconDegradation of InGaN∕GaN laser diodes analyzed by microphotoluminescence and microelectroluminescence mappings
Rossetti M, Smeeton TM, Tan W-S, Kauer M, Hooper SE, Heffernan J, Xiu H and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 92 (15) 
14-04-2008
bullet iconSolid-State Lighting
Humphreys CJ
Mrs Bulletin, Springer Nature vol. 33 (4), 459-470.  
01-04-2008
bullet iconImprovements in a-plane GaN crystal quality by a two-step growth process
Hollander JL, Kappers MJ, McAleese C and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 92 (10) 
10-03-2008
bullet iconThe origin and reduction of dislocations in Gallium Nitride
Oliver RA, Kappers MJ, McAleese C, Datta R, Sumner J and Humphreys CJ
Journal of Materials Science: Materials in Electronics. vol. 19 (Suppl 1), 208-214.  
05-03-2008
bullet iconAssessment of the performance of scanning capacitance microscopy for n-type gallium nitride
Sumner J, Oliver RA, Kappers MJ and Humphreys CJ
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, American Vacuum Society vol. 26 (2), 611-617.  
01-03-2008
bullet iconControlled Integration of Nanocrystals in Inverted Hexagonal Nano‐Pits at the Surface of Light‐Emitting Heterostructures (Adv. Mater. 5/2008)
de Sousa Pereira SM, Martins MA, Trindade T, Watson IM, Zhu D and Humphreys CJ
Advanced Materials, Wiley vol. 20 (5) 
29-02-2008
bullet iconControlled Integration of Nanocrystals in Inverted Hexagonal Nano‐Pits at the Surface of Light‐Emitting Heterostructures
de Sousa Pereira SM, Martins MA, Trindade T, Watson IM, Zhu D and Humphreys CJ
Advanced Materials, Wiley vol. 20 (5), 1038-1043.  
08-02-2008
bullet iconGrowth and assessment of InGaN quantum dots in a microcavity: A blue single photon source
Oliver RA, Jarjour AF, Taylor RA, Tahraoui A, Zhang Y, Kappers MJ and Humphreys CJ
Materials Science and Engineering B. vol. 147 (2-3), 108-113.  
01-02-2008
bullet iconCompositional inhomogeneity of a high-efficiency InxGa1−xN based multiple quantum well ultraviolet emitter studied by three dimensional atom probe
Galtrey MJ, Oliver RA, Kappers MJ, McAleese C, Zhu D, Humphreys CJ, Clifton PH, Larson D and Cerezo A
Applied Physics Letters, Aip Publishing vol. 92 (4) 
28-01-2008
bullet iconDegradation of GaN-based quantum well light-emitting diodes
Zhao LX, Thrush EJ, Humphreys CJ and Phillips WA
Journal of Applied Physics, Aip Publishing vol. 103 (2) 
15-01-2008
bullet iconCalibration and Applications of Scanning Capacitance Microscopy: n-Type GaN
Sumner J, Oliver RA, Kappers MJ and Humphreys CJ
Springer Proceedings in Physics. vol. 120, 463-466.  
01-01-2008
bullet iconStrain Relaxation in an AlGaN/GaN Quantum Well System
Cherns PD, McAleese C, Kappers MJ and Humphreys CJ
Springer Proceedings in Physics. vol. 120, 25-28.  
01-01-2008
bullet iconQuantitative Dopant Profiling in the SEM Including Surface States
Chee KWA, Rodenburg C and Humphreys CJ
Springer Proceedings in Physics. vol. 120, 407-410.  
01-01-2008
bullet iconAn Initial Exploration of GaN Grown on a Ge-(111) Substrate
Zhang Y, McAleese C, Xiu H, Humphreys CJ, Lieten RR, Degroote S and Borghs G
Springer Proceedings in Physics. vol. 120, 61-64.  
01-01-2008
bullet iconThe Puzzle of Exciton Localisation in GaN-Based Structures: TEM, AFM and 3D APFIM Hold the Key
Humphreys CJ, Galtrey MJ, Laak NVD, Oliver RA, Kappers MJ, Barnard JS, Graham DM and Dawson P
Springer Proceedings in Physics. vol. 120, 3-12.  
01-01-2008
bullet iconThe role of strain in controlling the surface morphology of AlxGa1−xN following in situ treatment with SiH4 and NH3
Ketteniss N, Oliver RA, McAleese C, Kappers MJ, Zhang Y and Humphreys CJ
Applied Surface Science, Elsevier vol. 254 (7), 2124-2130.  
01-01-2008
bullet iconThree-Dimensional Atom Probe Characterisation of III-Nitride Quantum Well Structures
Galtrey MJ, Oliver RA, Kappers MJ, Humphreys CJ, Stokes DJ, Clifton PH and Cerezo A
Springer Proceedings in Physics. vol. 120, 161-164.  
01-01-2008
bullet iconEBIC Characterisation of Diffusion and Recombination of Minority Carriers in GaN-Based LEDs
Moldovan* G, Ong VKS, Kurniawan O, Kazemian P, Edwards PR and Humphreys C
Springer Proceedings in Physics. vol. 120, 485-488.  
01-01-2008
bullet iconThe atomic structure of GaN-based quantum wells and interfaces
Humphreys CJ, Galtrey MJ, Oliver RA, Kappers MJ, Zhu D, McAleese C, van der Laak NK, Graham DM, Dawson P, Cerezo A and Clifton PH
In Emc 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, Springer Nature 41-42.  
01-01-2008

2007

bullet iconCalculations of Equilibrium Critical Thickness for Non-Polar Wurtzite InGaN/GaN Systems
Holec D and Humphreys CJ
 
06-12-2007
bullet iconEpitaxial lateral overgrowth of off-basal GaN thin-film growth orientations
Hollander JL, Kappers MJ and Humphreys CJ
Physica B Condensed Matter. vol. 401, 307-310.  
01-12-2007
bullet iconInterlayer methods for reducing the dislocation density in gallium nitride
Kappers MJ, Moram MA, Zhang Y, Vickers ME, Barber ZH and Humphreys CJ
Physica B Condensed Matter. vol. 401, 296-301.  
01-12-2007
bullet iconAtom probe tomography today
Cerezo A, Clifton PH, Galtrey MJ, Humphreys CJ, Kelly TF, Larson DJ, Lozano-Perez S, Marquis EA, Oliver RA, Sha G, Thompson K, Zandbergen M and Alvis RL
Materials Today, Elsevier vol. 10 (12), 36-42.  
01-12-2007
bullet iconDeep electronic states associated with a metastable hole trap in n-type GaN
Emiroglu D, Evans-Freeman JH, Kappers MJ, McAleese C and Humphreys CJ
Physica B Condensed Matter, Elsevier vol. 401, 311-314.  
01-12-2007
bullet iconAdvantages and disadvantages of using YAG: Ce nanophosphors encapsulated on blue-emitting LED chips as backlights for displays
Withnall R, Silver J, Ireland TG, Lipman AL, Fern GR, McAleese C, Humphreys C and Phillips WA
SID Conference Record of the International Display Research Conference., 179-182.  
01-12-2007
bullet iconChapter 42
Humphreys CJ
In Turning Points in Solid-State, Materials and Surface Science, Royal Society of Chemistry (Rsc) 698-710.  
30-11-2007
bullet iconControl of the Oscillator Strength of the Exciton in a Single InGaN-GaN Quantum Dot
Jarjour AF, Oliver RA, Tahraoui A, Kappers MJ, Humphreys CJ and Taylor RA
Physical Review Letters, American Physical Society (Aps) vol. 99 (19) 
09-11-2007
bullet iconExcitation energy dependence of the photoluminescence spectrum of an InxGa1−xN∕GaN single quantum well structure
Hylton NP, Dawson P, Kappers MJ, McAleese C and Humphreys CJ
Physical Review B, American Physical Society (Aps) vol. 76 (20) 
05-11-2007
bullet iconObservation of long-range compositional fluctuations in glasses: Implications for atomic and electronic structure
Jiang N, Qiu J, Humphreys CJ and Spence JCH
Micron, Elsevier vol. 39 (6), 698-702.  
22-10-2007
bullet iconElectron energy loss near edge structure (ELNES) spectra of AlN and AlGaN: A theoretical study using the Wien2k and Telnes programs
Holec D, Costa PMFJ, Cherns PD and Humphreys CJ
Micron, Elsevier vol. 39 (6), 690-697.  
22-10-2007
bullet iconResponse to “Comment on ‘Three-dimensional atom probe studies of an InxGa1−xN∕GaN multiple quantum well structure: assessment of possible indium clustering’” [Appl. Phys. Lett. 91, 176101 (2007)]
Galtrey MJ, Oliver RA, Kappers MJ, Humphreys CJ, Clifton PH, Cerezo A and Smith GDW
Applied Physics Letters, Aip Publishing vol. 91 (17) 
22-10-2007
bullet iconGrowth of dislocation-free GaN islands on Si(1 1 1) using a scandium nitride buffer layer
Moram MA, Kappers MJ, Joyce TB, Chalker PR, Barber ZH and Humphreys CJ
Journal of Crystal Growth vol. 308 (2), 302-308.  
15-10-2007
bullet iconDislocation reduction in gallium nitride films using scandium nitride interlayers
Moram MA, Zhang Y, Kappers MJ, Barber ZH and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 91 (15) 
08-10-2007
bullet iconGrowth of dislocation-free GaN islands on Si(111) using a scandium nitride buffer layer
Moram MA, Kappers MJ, Joyce TB, Chalker PR, Barber ZH and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 308 (2), 302-308.  
01-10-2007
bullet iconEnhanced efficiency of near-UV emitting LEDs for solid state lighting applications
Zhu D, Corbett B, Roycroft B, Maaskant P, McAleese C, Akhter M, Kappers MJ and Humphreys CJ
Manufacturing LEDs for Lighting and Displays. vol. 6797 
25-09-2007
bullet iconMisoriented domains in (0001)-GaN/(111)-Ge grown by molecular beam epitaxy
Zhang Y, McAleese C, Xiu H, Humphreys CJ, Lieten RR, Degroote B and Borghs G
Applied Physics Letters, Aip Publishing vol. 91 (9) 
27-08-2007
bullet icon3D Atom Probe Analysis of Quantum Well and Quantum Dot Materials
Cerezo A, Chang L, Clifton P, Galtrey M, Gerstl S, Humphreys C, Mueller M, Oliver R, Smith G and Wu Y
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 13 (S02), 1608-1609.  
01-08-2007
bullet iconCavity-enhanced blue single-photon emission from a single InGaN∕GaN quantum dot
Jarjour AF, Taylor RA, Oliver RA, Kappers MJ, Humphreys CJ and Tahraoui A
Applied Physics Letters, Aip Publishing vol. 91 (5) 
30-07-2007
bullet iconAccurate experimental determination of the Poisson’s ratio of GaN using high-resolution x-ray diffraction
Moram MA, Barber ZH and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 102 (2) 
15-07-2007
bullet iconCharacterization of InGaN quantum wells with gross fluctuations in width
van der Laak NK, Oliver RA, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 102 (1) 
01-07-2007
bullet iconPractical issues in carrier‐contrast imaging of GaN structures
Sumner J, Oliver RA, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 4 (7), 2576-2580.  
01-06-2007
bullet iconCritical thickness calculations for InGaN/GaN
Holec D, Costa PMFJ, Kappers MJ and Humphreys CJ
Journal of Crystal Growth. vol. 303 (1), 314-317.  
01-05-2007
bullet iconDoes In form In-rich clusters in InGaN quantum wells?
Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 87 (13), 1971-1982.  
01-05-2007
bullet iconAtom probe provides evidence to question InGaN cluster theory
Galtrey M, Oliver R and Humphreys C
Compound Semiconductor vol. 13 (4), 27-30.  
01-05-2007
bullet iconResonant Photoluminescence Spectroscopy of InGaN/GaN Single Quantum Well Structures
Graham DM, Dawson P, Godfrey MJ, Kappers MJ and Humphreys CJ
AIP Conference Proceedings. vol. 893 (1), 433-434.  
10-04-2007
bullet iconOptically Detected Extended X‐Ray Absorption Fine Structure Study of InGaN/GaN Single Quantum Wells
Rigopoulos N, Hamilton B, Davies GJ, Towlson BM, Poolton NRJ, Dawson P, Graham DM, Kappers MJ, Humphreys CJ and Carlson S
AIP Conference Proceedings. vol. 893 (1), 1503-1504.  
10-04-2007
bullet iconOptical Studies of Non‐linear Absorption in Single InGaN/GaN Quantum Dots
Jarjour AF, Taylor RA, Martin RW, Watson IM, Oliver RA, Briggs GAD, Kappers MJ and Humphreys CJ
AIP Conference Proceedings. vol. 893 (1), 953-954.  
10-04-2007
bullet iconHigh Photoluminescence Efficiency III‐Nitride Based Quantum Well Structures Emitting at 380 nm
Graham DM, Dawson P, Zhu D, Kappers MJ, McAleese C, Hylton NP, Chabrol GR and Humphreys CJ
AIP Conference Proceedings. vol. 893 (1), 347-348.  
10-04-2007
bullet iconMaterials challenges for devices based on single, self-assembled InGaN quantum dots
Oliver RA, Jarjour AF, Tahraoui A, Kappers MJ, Taylor RA and Humphreys CJ
Journal of Physics Conference Series. vol. 61 (1) 
01-04-2007
bullet iconRole of gross well-width fluctuations in bright, green-emitting single InGaN∕GaN quantum well structures
van der Laak NK, Oliver RA, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 90 (12) 
19-03-2007
bullet iconAnisotropic strain relaxation in a-plane GaN quantum dots
Founta S, Coraux J, Jalabert D, Bougerol C, Rol F, Mariette H, Renevier H, Daudin B, Oliver RA, Humphreys CJ, Noakes TCQ and Bailey P
Journal of Applied Physics, Aip Publishing vol. 101 (6) 
15-03-2007
bullet iconGrowth and characterisation of semi-polar (1l2¯2) InGaN/GaN MQW structures
Kappers MJ, Hollander JL, McAleese C, Johnston CF, Broom RF, Barnard JS, Vickers ME and Humphreys CJ
Journal of Crystal Growth. vol. 300 (1), 155-159.  
01-03-2007
bullet iconThreading dislocation reduction in (0001) GaN thin films using SiNx interlayers
Kappers MJ, Datta R, Oliver RA, Rayment FDG, Vickers ME and Humphreys CJ
Journal of Crystal Growth. vol. 300 (1), 70-74.  
01-03-2007
bullet iconThree-dimensional atom probe studies of an InxGa1−xN∕GaN multiple quantum well structure: Assessment of possible indium clustering
Galtrey MJ, Oliver RA, Kappers MJ, Humphreys CJ, Stokes DJ, Clifton PH and Cerezo A
Applied Physics Letters, Aip Publishing vol. 90 (6) 
05-02-2007
bullet iconCompositional contrast in AlxGa1−xN/GaN heterostructures using scanning spreading resistance microscopy
Fraser IS, Oliver RA, Sumner J, McAleese C, Kappers MJ and Humphreys CJ
Applied Surface Science, Elsevier vol. 253 (8), 3937-3944.  
01-02-2007
bullet iconHigh photoluminescence quantum efficiency InGaN multiple quantum well structures emitting at 380nm
Graham DM, Dawson P, Chabrol GR, Hylton NP, Zhu D, Kappers MJ, McAleese C and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 101 (3) 
01-02-2007
bullet iconGrowth of low dislocation density GaN using transition metal nitride masking layers
Moram MA, Kappers MJ, Barber ZH and Humphreys CJ
Journal of Crystal Growth. vol. 298, 268-271.  
01-01-2007
bullet iconOptical and micro-structural properties of high photoluminescence efficiency InGaN/AlInGaN quantum well structures
Zhu D, Kappers MJ, McAleese C, Graham DM, Chabrol GR, Hylton NP, Dawson P, Thrush EJ and Humphreys CJ
Journal of Crystal Growth. vol. 298, 504-507.  
01-01-2007
bullet iconHigh photoluminescence efficiency III-nitride based quantum well structures emitting at 380 nm High photoluminescence efficiency III-nitride based quantum well structures emitting at 380 nm
Graham DM, Dawson P, Zhu D, Kappers MJ, McAleese C, Hylton NP, Chabro GR and Humphreys CJ
PHYSICS OF SEMICONDUCTORS, PTS A AND B. vol. 893, 347-+.  
01-01-2007
bullet iconThe Effect of Surface States on Secondary Electron (SE) Dopant Contrast from Silicon p-n Junctions
Chee AKW, Rodenburg C and Humphreys CJ
Mrs Advances, Springer Nature vol. 1026 
01-01-2007

2006

bullet iconStudy of defects in p-type layers in III-nitride laser diode structures grown by molecular beam epitaxy
Huixin X, Costa PMFJ, Kauer M, Smeeton TM, Hooper SE, Heffernan J and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 955, 46-52.  
01-12-2006
bullet iconA method of accurately determining the positions of the edges of depletion regions in semiconductor junctions
Ong VKS, Kurniawan O, Moldovan G and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 100 (11) 
01-12-2006
bullet iconResonant excitation photoluminescence studies of InGaN∕GaN single quantum well structures
Graham DM, Dawson P, Godfrey MJ, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 89 (21) 
20-11-2006
bullet iconLow-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices
Moldovan G, Kazemian P, Edwards PR, Ong VKS, Kurniawan O and Humphreys CJ
Ultramicroscopy, Elsevier vol. 107 (4-5), 382-389.  
07-11-2006
bullet iconImaging dislocation cores – the way forward
Spence⊥ JCH, Kolar HR, Hembree G, Humphreys CJ, Barnard J, Datta R, Koch C, Ross FM and Justo JF
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 86 (29-31), 4781-4796.  
11-10-2006
bullet iconMicrostructure of epitaxial scandium nitride films grown on silicon
Moram MA, Joyce TB, Chalker PR, Barber ZH and Humphreys CJ
Applied Surface Science, Elsevier vol. 252 (24), 8385-8387.  
01-10-2006
bullet iconHigh resolution quantitative two-dimensional dopant mapping using energy-filtered secondary electron imaging
Kazemian P, Mentink SAM, Rodenburg C and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 100 (5) 
01-09-2006
bullet iconQuantitative secondary electron energy filtering in a scanning electron microscope and its applications
Kazemian P, Mentink SAM, Rodenburg C and Humphreys CJ
Ultramicroscopy, Elsevier vol. 107 (2-3), 140-150.  
26-07-2006
bullet iconYoung’s modulus, Poisson’s ratio, and residual stress and strain in (111)-oriented scandium nitride thin films on silicon
Moram MA, Barber ZH, Humphreys CJ, Joyce TB and Chalker PR
Journal of Applied Physics, Aip Publishing vol. 100 (2) 
15-07-2006
bullet iconInsights into the origin of threading dislocations in GaN∕Al2O3 from atomic force microscopy
Oliver RA, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 89 (1) 
03-07-2006
bullet iconMechanisms of bending of threading dislocations in MOVPE‐grown GaN on (0001) sapphire
Datta R and Humphreys CJ
physica status solidi (c). vol. 3 (6), 1750-1753.  
01-06-2006
bullet iconThree methods for the growth of InGaN nanostructures by MOVPE
Oliver RA, Kappers MJ, van der Laak NK and Humphreys CJ
physica status solidi (c). vol. 3 (6), 1552-1556.  
01-06-2006
bullet iconTowards a better understanding of nano‐islands formed during atmospheric pressure MOVPE
van der Laak NK, Oliver RA, Barnard JS, Cherns PD, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 3 (6), 1544-1547.  
01-06-2006
bullet iconTemperature current‐voltage characterisation of MOCVD grown InGaN/GaN MQW LEDs
Moldovan G, Phillips A, Thrush EJ and Humphreys CJ
physica status solidi (c). vol. 3 (6), 2145-2148.  
01-06-2006
bullet iconThe effect of Si on the growth mode of GaN
von Pezold J, Oliver RA, Kappers MJ, Bristowe PD and Humphreys CJ
physica status solidi (c). vol. 3 (6), 1570-1574.  
01-06-2006
bullet iconThe effect of a Mg‐doped GaN cap layer on the optical properties of InGaN/AlGaN multiple quantum well structures
Graham DM, Dawson P, Zhang Y, Costa PMFJ, Kappers MJ, Humphreys CJ and Thrush EJ
physica status solidi (c). vol. 3 (6), 2005-2008.  
01-06-2006
bullet iconResonant photoluminescence excitation studies of InGaN/GaN single quantum wells
Graham DM, Dawson P, Godfrey MJ, Kappers MJ, Barnard JS, Humphreys CJ and Thrush EJ
physica status solidi (c). vol. 3 (6), 2001-2004.  
01-06-2006
bullet iconHigh quantum efficiency InGaN/GaN structures emitting at 540 nm
Graham DM, Dawson P, Godfrey MJ, Kappers MJ, Costa PMFJ, Vickers ME, Datta R, Humphreys CJ and Thrush EJ
physica status solidi (c). vol. 3 (6), 1970-1973.  
01-06-2006
bullet iconElectric fields in AlGaN/GaN quantum well structures
McAleese C, Costa PMFJ, Graham DM, Xiu H, Barnard JS, Kappers MJ, Dawson P, Godfrey MJ and Humphreys CJ
physica status solidi (b). vol. 243 (7), 1551-1559.  
01-06-2006
bullet iconEffects of KOH etching on the properties of Ga-polar n-GaN surfaces
Moldovan G, Roe MJ, Harrison I, Kappers M, Humphreys CJ and Brown PD
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 86 (16), 2315-2327.  
01-06-2006
bullet iconSite-specific dopant profiling in a scanning electron microscope using focused ion beam prepared specimens
Kazemian P, Twitchett AC, Humphreys CJ and Rodenburg C
Applied Physics Letters, Aip Publishing vol. 88 (21) 
22-05-2006
bullet iconA TEM investigation of crack reduction in AlGaN/GaN heterostructures using an AlN interlayer
Cherns PD, McAleese C, Barnard JS, Kappers MJ and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 892, 697-702.  
15-05-2006
bullet iconMicrostructure and strain-free lattice parameters of ScxGa 1-xN films
Moram MA, Joyce TB, Chalker PR, Barber ZH and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 892, 723-727.  
15-05-2006
bullet iconQuantum well network structures: Investigating long-range thickness fluctuations in single InGaN/GaN quantum wells
Van Der Laak NK, Oliver RA, Kappers MJ and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 892, 831-836.  
15-05-2006
bullet iconThe mean inner potential of GaN measured from nanowires using off-axis electron holography
Wong ASW, Ho GW, Dunin-Borkowski R, Kasama T, Oliver RA, Costa PMFJ and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 892, 209-214.  
15-05-2006
bullet iconMisfit dislocations in green-emitting InGaN/GaN quantum well structures
Costa PMFJ, Datta R, Kappers MJ, Vickers ME and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 892, 639-643.  
15-05-2006
bullet iconSiH4 exposure of GaN surfaces: A useful tool for highlighting dislocations
Oliver RA, Kappers MJ, Sumner J, Datta R and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 892, 631-636.  
15-05-2006
bullet iconProgress in MOVPE growth of crack‐free AlGaN based Bragg reflectors on Si(111)
Charles MB, Zhang Y, Kappers MJ and Humphreys CJ
physica status solidi (a) – applications and materials science. vol. 203 (7), 1618-1621.  
01-05-2006
bullet iconA comparative study of near‐UV emitting InGaN quantum wells with AlGaN and AlInGaN barriers
Zhu D, Kappers MJ, Costa PMFJ, McAleese C, Rayment FDG, Chabrol GR, Graham DM, Dawson P, Thrush EJ, Mullins JT and Humphreys CJ
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 203 (7), 1819-1823.  
01-05-2006
bullet iconSensitisation of erbium luminescence in erbium-implanted alumina
Kenyon AJ, Chryssou CE, Smeeton TM, Humphreys CJ and Hole DE
Optical Materials. vol. 28 (6-7), 655-659.  
01-05-2006
bullet iconMisfit dislocations in In‐rich InGaN/GaN quantum well structures
Costa PMFJ, Datta R, Kappers MJ, Vickers ME, Humphreys CJ, Graham DM, Dawson P, Godfrey MJ, Thrush EJ and Mullins JT
physica status solidi (a) – applications and materials science. vol. 203 (7), 1729-1732.  
01-05-2006
bullet iconTwo-photon absorption from single InGaN/GaN quantum dots
Jarjour AF, Green AM, Parker TJ, Taylor RA, Oliver RA, Briggs GAD, Kappers MJ, Humphreys CJ, Martin RW and Watson IM
Physica E Low-Dimensional Systems and Nanostructures, Elsevier vol. 32 (1-2), 119-122.  
01-05-2006
bullet iconThe impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy
Smeeton TM, Humphreys CJ, Barnard JS and Kappers MJ
Journal of Materials Science. vol. 41 (9), 2729-2737.  
17-04-2006
bullet iconHighlighting threading dislocations in MOVPE-grown GaN using an in situ treatment with SiH4 and NH3
Oliver RA, Kappers MJ, Sumner J, Datta R and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 289 (2), 506-514.  
01-04-2006
bullet iconSiH4 exposure of GaN surfaces:: A useful tool for highlighting dislocations
Oliver RA, Kappers MJ, Sumner J, Datta R and Humphreys CJ
GAN, AIN, INN AND RELATED MATERIALS. vol. 892, 631-+.  
01-01-2006
bullet iconGrowth and characterization of semi-polar (11-22) GaN with in-situ SiNx interlayers
Hollander J, McAleese C, Kappers M and Humphreys C
MRS Advances. vol. 955 
01-01-2006
bullet iconPerspectives on Electronic and Optoelectronic Materials
Smeeton T and Humphreys C
In Springer Handbook of Electronic and Photonic Materials, Springer Nature 3-15.  
01-01-2006
bullet iconStudy of Defects in p-type Layers in III-nitride Laser Diode Structures Grown by Molecular Beam Epitaxy
Xiu H, Costa PM, Kauer M, Smeeton TM, Hooper SE, Heffernan J and Humphreys CJ
Mrs Advances, Springer Nature vol. 955 
01-01-2006

2005

bullet iconQuantum Well Network Structures: Investigating Long-range Thickness Fluctuations in Single InGaN/GaN Quantum Wells
van der Laak NK, Oliver RA, Kappers MJ and Humphreys CJ
Mrs Advances, Springer Nature vol. 892 (1) 
01-12-2005
bullet iconMicrostructure and Strain-Free Lattice Parameters of SCxGa1-xN Films
Moram MA, Joyce TB, Chalker PR, Barber ZH and Humphreys CJ
Mrs Advances, Springer Nature vol. 892 (1) 
01-12-2005
bullet iconA TEM Investigation of Crack Reduction in AlGaN/GaN Heterostructures Using an AlN Interlayer
Cherns PD, McAleese C, Barnard JS, Kappers MJ and Humphreys CJ
Mrs Advances, Springer Nature vol. 892 (1) 
01-12-2005
bullet iconDetermination of relative internal quantum efficiency in InGaN∕GaN quantum wells
Martinez CE, Stanton NM, Kent AJ, Graham DM, Dawson P, Kappers MJ and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 98 (5) 
01-09-2005
bullet iconReduction of Threading Dislocations in GaN grown on 'c' plane sapphire by MOVPE
Datta R, Kappers MJ, Barnard JS and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 831, 405-410.  
25-08-2005
bullet iconGrowth of uncracked Al0.80Ga0.20/GaN DBR on Si(111)
Charles MB, Kappers MJ and Humphreys CJ
Materials Research Society Symposium Proceedings. vol. 831, 155-159.  
25-08-2005
bullet iconQuantum-confined Stark effect in a single InGaN quantum dot under a lateral electric field
Robinson JW, Rice JH, Lee KH, Na JH, Taylor RA, Hasko DG, Oliver RA, Kappers MJ, Humphreys CJ and Briggs GAD
Applied Physics Letters, Aip Publishing vol. 86 (21) 
16-05-2005
bullet iconIn-plane imperfections in GaN studied by x-ray diffraction
Vickers ME, Kappers MJ, Datta R, McAleese C, Smeeton TM, Rayment FDG and Humphreys CJ
Journal of Physics D. vol. 38 (10A) 
06-05-2005
bullet iconScience and the Miracles of Exodus
Humphreys C
Europhysics News, Edp Sciences vol. 36 (3), 93-96.  
01-05-2005
bullet iconOptical and microstructural studies of InGaN∕GaN single-quantum-well structures
Graham DM, Soltani-Vala A, Dawson P, Godfrey MJ, Smeeton TM, Barnard JS, Kappers MJ, Humphreys CJ and Thrush EJ
Journal of Applied Physics, Aip Publishing vol. 97 (10) 
29-04-2005
bullet iconTime-resolved dynamics in single InGaN quantum dots (Invited Paper)
Taylor RA, Robinson JW, Rice JH, Lee KH, Jarjour A, Na JH, Yasin S, Oliver RA, Kappers MJ, Humphreys CJ, Briggs GAD, Williams DP, O'Reilly EP, Andreev AD and Arakawa Y
Ultrafast Phenomena in Semiconductors and Nanostructure Materials IX. vol. 5725, 296-308.  
13-04-2005
bullet iconThe effect of AlGaN and SiN interlayers on GaN/Si(111)
Charles MB, Kappers MJ and Humphreys CJ
physica status solidi (c). vol. 2 (3), 956-959.  
01-02-2005
bullet iconReduction of threading dislocation density using in-situ SiNx interlayers
Datta R, Kappers MJ, Barnard JS and Humphreys CJ
Springer Proceedings in Physics. vol. 107, 59-62.  
01-01-2005
bullet iconEvolution of InGaN/GaN nanostructures and wetting layers during annealing
Oliver RA, van der Laak NK, Kappers MJ and Humphreys CJ
Springer Proceedings in Physics. vol. 107, 29-32.  
01-01-2005
bullet iconInGaN-GaN quantum wells: their luminescent and nano-structural properties
Barnard JS, Graham DM, Smeeton TM, Kappers MJ, Dawson P, Godfrey M and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS. vol. 107, 25-28.  
01-01-2005
bullet iconSelf-catalytic growth of gallium nitride nanoneedles under Garich conditions
Wong ASW, Ho GW, Costa PMFJ, Oliver RA and Humphreys CJ
Springer Proceedings in Physics. vol. 107, 287-290.  
01-01-2005
bullet iconA TEM Study of A1N Interlayer Defects in AlGaN/GaN Heterostructures
Cherns PD, McAleese C, Kappers MJ and Humphreys CJ
Springer Proceedings in Physics. vol. 107, 55-58.  
01-01-2005
bullet iconStranski-Krastanov growth for InGaN/GaN: wetting layer thickness changes
van der Laak NK, Oliver RA, Kappers MJ, McAleese C and Humphreys CJ
Springer Proceedings in Physics. vol. 107, 13-16.  
01-01-2005
bullet iconDetermining the site occupancy of Ru in the L12 phase of a Ni-base superalloy using ALCHEMI
Ofori AP, Rossouw CJ and Humphreys CJ
Acta Materialia, Elsevier vol. 53 (1), 97-110.  
01-01-2005
bullet iconSimulation of the Quantum-Confined Stark Effect in a Single InGaN Quantum Dot
Lee KH, Robinson WJ, Rice HJ, Na JH, Taylor AR, Oliver RA, Kappers MJ and Humphreys CJ
NUSOD '05. Proceedings of the 5th International Conference on Numerical Simulation of Optoelectronic Devices, 2005.., 5-6.  
01-01-2005
bullet iconMisfit dislocations in green-emitting InGaN/GaN quantum well structures
Costa P, Datta R, Kappers M, Vickers M and Humphreys C
Mrs Advances, Springer Nature vol. 892 (1) 
01-01-2005
bullet iconSiH4 exposure of GaN surfaces: A useful tool for highlighting dislocations
Oliver RA, Kappers MJ, Sumner J, Datta R and Humphreys CJ
Mrs Advances, Springer Nature vol. 892 (1) 
01-01-2005
bullet iconThe mean inner potential of GaN measured from nanowires using off-axis electron holography
Wong ASW, Ho GW, Dunin-Borkowski R, Kasama T, Oliver RA, Costa PMFJ and Humphreys CJ
Mrs Advances, Springer Nature vol. 892 (1) 
01-01-2005

2004

bullet iconGrowth modes in heteroepitaxy of InGaN on GaN
Oliver RA, Kappers MJ, Humphreys CJ and Briggs GAD
Journal of Applied Physics, Aip Publishing vol. 97 (1) 
16-12-2004
bullet iconStrain effects of AlN interlayers for MOVPE growth of crack-free AlGaN and AlN/GaN multilayers on GaN
McAleese C, Kappers MJ, Rayment FDG, Cherns P and Humphreys CJ
Journal of Crystal Growth. vol. 272 (1-4), 475-480.  
01-12-2004
bullet iconThe influence of ammonia on the growth mode in InGaN/GaN heteroepitaxy
Oliver RA, Kappers MJ, Humphreys CJ and Briggs GAD
Journal of Crystal Growth. vol. 272 (1-4), 393-399.  
01-12-2004
bullet iconBroadband sensitization of 1.53μm Er3+ luminescence in erbium-implanted alumina
Chryssou CE, Kenyon AJ, Smeeton TM, Humphreys CJ and Hole DE
Applied Physics Letters, Aip Publishing vol. 85 (22), 5200-5202.  
29-11-2004
bullet iconRevealing all types of threading dislocations in GaN with improved contrast in a single plan view image
Datta R, Kappers MJ, Barnard JS and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 85 (16), 3411-3413.  
18-10-2004
bullet iconGrowth and characterisation of GaN with reduced dislocation density
Datta R, Kappers MJ, Vickers ME, Barnard JS and Humphreys CJ
Superlattices and Microstructures. vol. 36 (4-6), 393-401.  
01-10-2004
bullet iconEffects of oxygen plasma treatment on the formation of ohmic contacts to GaN and AlGaN
Yan J, Kappers MJ, Crossley A, McAleese C, Phillips WA and Humphreys CJ
physica status solidi (b). vol. 241 (12), 2820-2824.  
10-09-2004
bullet iconPhotoluminescence Studies of Exciton Recombination and Dephasing in Single Ingan Quantum Dots
Rice JH, Robinson JW, Smith JD, Jarjour A, Taylor RA, Oliver RA, Briggs GAD, Kappers MJ, Yasin S and Humphreys CJ
Ieee Transactions On Nanotechnology, Institute of Electrical and Electronics Engineers (Ieee) vol. 3 (3), 343-347.  
01-09-2004
bullet iconEffects of oxygen plasma treatments on the formation of ohmic contacts to GaN
Yan J, Kappers MJ, Barber ZH and Humphreys CJ
Applied Surface Science. vol. 234 (1-4), 328-332.  
01-07-2004
bullet iconEffect of experimental parameters on doping contrast of Si p?n junctions in a FEG-SEM
KAZEMIAN P
Microelectronic Engineering. vol. 73-74, 948-953.  
01-06-2004
bullet iconTemporal variation in photoluminescence from single InGaN quantum dots
Rice JH, Robinson JW, Jarjour A, Taylor RA, Oliver RA, Briggs GAD, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 84 (20), 4110-4112.  
17-05-2004
bullet iconCan a Materials Scientist Move Mount Sinai?
Humphreys C
Mrs Bulletin, Springer Nature vol. 29 (4), 222-223.  
01-04-2004
bullet iconApplication of the Taguchi method for assessment of surface treatment procedures for Ti/n-type GaN contacts
Moldovan G, Harrison I, Humphreys CJ, Kappers M and Brown PD
Materials Science and Technology, Sage Publications vol. 20 (4), 533-538.  
01-04-2004
bullet iconMapping the potential within a nanoscale undoped GaAs region using a scanning electron microscope
Kaestner B, Schönjahn C and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 84 (12), 2109-2111.  
22-03-2004
bullet iconDynamics of single InGaN quantum dots
Taylor RA, Robinson JW, Rice JH, Jarjour A, Smith JD, Oliver RA, Briggs GAD, Kappers MJ, Humphreys CJ and Arakawa Y
Physica E Low-dimensional Systems and Nanostructures. vol. 21 (2-4), 285-289.  
01-03-2004
bullet iconResonance and current instabilities in AlN/GaN resonant tunnelling diodes
Belyaev AE, Makarovsky O, Walker DJ, Eaves L, Foxon CT, Novikov SV, Zhao LX, Dykeman RI, Danylyuk SV, Vitusevich SA, Kappers MJ, Barnard JS and Humphreys CJ
Physica E Low-dimensional Systems and Nanostructures. vol. 21 (2-4), 752-755.  
01-03-2004
bullet iconInGaN quantum dots grown by MOVPE via a droplet epitaxy route
Rice JH, Oliver RA, Robinson JW, Smith JD, Taylor RA, Briggs GAD, Kappers MJ, Humphreys CJ and Yasin S
Physica E Low-dimensional Systems and Nanostructures. vol. 21 (2-4), 546-550.  
01-03-2004
bullet iconTime‐integrated and time‐resolved photoluminescence studies of InGaN quantum dots
Robinson JW, Rice JH, Jarjour A, Smith JD, Taylor RA, Oliver RA, Briggs GAD, Kappers MJ, Humphreys CJ, Yasin S and Arakawa Y
physica status solidi (c). vol. 1 (3), 568-572.  
01-02-2004
bullet iconElectrophoretic manipulation of single DNA molecules in nanofabricated capillaries
Campbell LC, Wilkinson MJ, Manz A, Camilleri P and Humphreys CJ
Lab On a Chip, Royal Society of Chemistry (Rsc) vol. 4 (3), 225-229.  
01-01-2004
bullet iconA TEM Study of the Effect of Platinum Group Metals in Advanced Single Crystal Nickel-Base Superalloys
Ofori AP, Humpherys CJ, Tin S and Jones CN
Superalloys 2004 (Tenth International Symposium)., 787-794.  
01-01-2004
bullet iconSolidification Characteristics of Advanced Nickel-Base Single Crystal Superalloys
Hobbs RA, Tin S, Rae CMF, Broomfield RW and Humphreys CJ
Superalloys 2004 (Tenth International Symposium)., 819-825.  
01-01-2004
bullet iconImproving Thermal Stability of LiMn2 O 4 Thin Films by In Situ Coating of α ­ MnO2 Using High-Pressure and High-Temperature Sputtering
Chen GS, Chen G-S, Hsiao HH, Louh RF and Humphreys CJ
Electrochemical and Solid-State Letters, The Electrochemical Society vol. 7 (8), a235-a238.  
01-01-2004
bullet iconEffect of experimental parameters on doping contrast of Si p-n junctions in a FEG-SEM
Kazemian P, Rodenburg C and Humphreys CJ
Microelectronic Engineering. vol. 73-74, 948-953.  
01-01-2004
bullet iconReduction of Threading Dislocations in GaN grown on ‘c’ plane sapphire by MOVPE
Datta R, Kappers MJ, Barnard JS and Humphreys CJ
Mrs Advances, Springer Nature vol. 831 
01-01-2004
bullet iconGrowth of Uncracked Al0.80Ga0.20N/GaN DBR on Si(111)
Charles MB, Kappers MJ and Humphreys CJ
Mrs Advances, Springer Nature vol. 831 (1), 377-381.  
01-01-2004

2003

bullet iconElectron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope
Smeeton TM, Kappers MJ, Barnard JS, Vickers ME and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 83 (26), 5419-5421.  
29-12-2003
bullet iconPositron-sensitive vacancy-type centres in the nitrides: 1D-ACAR data
Arutyunov NY, Emtsev VV, Mikhailin AV and Humphreys CJ
Physica B Condensed Matter. vol. 340, 412-415.  
01-12-2003
bullet iconGrowth of InGaN quantum dots on GaN by MOVPE, employing a growth temperature nitrogen anneal
Oliver RA, Kappers MJ, Rice JH, Smith JD, Taylor RA, Humphreys CJ and Briggs GAD
physica status solidi (c). (7), 2515-2519.  
24-11-2003
bullet iconCurrent–voltage instabilities in GaN/AlGaN resonant tunnelling structures
Foxon CT, Novikov SV, Belyaev AE, Zhao LX, Makarovsky O, Walker DJ, Eaves L, Dykeman RI, Danylyuk SV, Vitusevich SA, Kappers MJ, Barnard JS and Humphreys CJ
physica status solidi (c). (7), 2389-2392.  
24-11-2003
bullet iconAnalysis of InGaN/GaN single quantum wells by X‐ray scattering and transmission electron microscopy
Smeeton TM, Kappers MJ, Barnard JS, Vickers ME and Humphreys CJ
physica status solidi (b). vol. 240 (2), 297-300.  
01-11-2003
bullet iconExciton localization in InGaN/GaN single quantum well structures
Graham DM, Vala AS, Dawson P, Godfrey MJ, Kappers MJ, Smeeton TM, Barnard JS, Humphreys CJ and Thrush EJ
physica status solidi (b). vol. 240 (2), 344-347.  
01-11-2003
bullet iconComment on “AlN/GaN double-barrier resonant tunneling diodes grown by rf-plasma-assisted molecular-beam epitaxy” [Appl. Phys. Lett. 81, 1729 (2002)]
Belyaev AE, Foxon CT, Novikov SV, Makarovsky O, Eaves L, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 83 (17), 3626-3627.  
27-10-2003
bullet iconTime-resolved dynamics in single InGaN quantum dots
Robinson JW, Rice JH, Jarjour A, Smith JD, Taylor RA, Oliver RA, Briggs GAD, Kappers MJ, Humphreys CJ and Arakawa Y
Applied Physics Letters, Aip Publishing vol. 83 (13), 2674-2676.  
29-09-2003
bullet iconBlue emission from As-doped GaN films grown by molecular beam epitaxy on GaN templates
Novikov SV, Zhao LX, Winser AJ, Kappers MJ, Barnard JS, Harrison I, Humphreys CJ and Foxon CT
Journal of Crystal Growth, Elsevier vol. 256 (3-4), 237-242.  
01-09-2003
bullet iconDetermination of the indium content and layer thicknesses in InGaN/GaN quantum wells by x-ray scattering
Vickers ME, Kappers MJ, Smeeton TM, Thrush EJ, Barnard JS and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 94 (3), 1565-1574.  
01-08-2003
bullet iconInGaN quantum dots grown by metalorganic vapor phase epitaxy employing a post-growth nitrogen anneal
Oliver RA, Briggs GAD, Kappers MJ, Humphreys CJ, Yasin S, Rice JH, Smith JD and Taylor RA
Applied Physics Letters, Aip Publishing vol. 83 (4), 755-757.  
28-07-2003
bullet iconOptimizing and quantifying dopant mapping using a scanning electron microscope with a through-the-lens detector
Schönjahn C, Broom RF, Humphreys CJ, Howie A and Mentink SAM
Applied Physics Letters, Aip Publishing vol. 83 (2), 293-295.  
14-07-2003
bullet iconDetailed interpretation of electron transport in n-GaN
Mavroidis C, Harris JJ, Kappers MJ, Humphreys CJ and Bougrioua Z
Journal of Applied Physics, Aip Publishing vol. 93 (11), 9095-9103.  
01-06-2003
bullet iconCarrier leakage in InGaN quantum well light-emitting diodes emitting at 480 nm
Pope IA, Smowton PM, Blood P, Thomson JD, Kappers MJ and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 82 (17), 2755-2757.  
28-04-2003
bullet iconElectron energy‐loss near edge structure (ELNES) of InGaN quantum wells
Keast VJ, Kappers MJ and Humphreys CJ
Journal of Microscopy. vol. 210 (1), 89-93.  
01-04-2003
bullet iconArsenic incorporation in GaN during growth by molecular beam epitaxy
Foxon CT, Novikov SV, Li T, Campion RP, Winser AJ, Harrison I, Kappers MJ and Humphreys CJ
Journal of Crystal Growth. vol. 251 (1-4), 510-514.  
01-04-2003
bullet iconGaN/InGaN quantum wells grown in a close coupled showerhead reactor
Thrush EJ, Kappers MJ, Dawson P, Vickers ME, Barnard J, Graham D, Makaronidis G, Rayment FDG, Considine L and Humphreys CJ
Journal of Crystal Growth. vol. 248, 518-522.  
01-02-2003
bullet iconAnalysis of InGaN-GaN quantum well chemistry and interfaces by transmission electron microscopy and X-ray scattering
Smeeton TM, Kappers MJ, Barnard JS and Humphreys CJ
MRS Advances. vol. 798 
01-01-2003

2002

bullet iconEnergy-filtered imaging in a field-emission scanning electron microscope for dopant mapping in semiconductors
Schönjahn C, Humphreys CJ and Glick M
Journal of Applied Physics, Aip Publishing vol. 92 (12), 7667-7671.  
15-12-2002
bullet iconResponse to “Comment on ‘Effect of growth interruptions on the light emission and indium clustering of InGaN/GaN multiple quantum wells’ ” [Appl. Phys. Lett. 81, 3100 (2002)]
Cho HK, Lee JY, Sharma N, Humphreys CJ, Yang GM, Kim CS, Song JH and Yu PW
Applied Physics Letters, Aip Publishing vol. 81 (16), 3102-3103.  
14-10-2002
bullet iconElectronic structure of GaN and InxGa1-xN measured with electron energy-loss spectroscopy
Keast VJ, Scott AJ, Kappers MJ, Foxon CT and Humphreys CJ
Physical Review B, American Physical Society (Aps) vol. 66 (12) 
15-09-2002
bullet iconEnergy filtered imaging in a FEG-SEM for enhanced dopant contrast
Schönjahn C, Humphreys C and Glick M
Microscopy and Microanalysis. vol. 8 (S02), 718-719.  
01-08-2002
bullet iconGaN–InGaN Quantum Well and LED Structures Grown in a Close Coupled Showerhead (CCS) MOCVD Reactor
Thrush EJ, Kappers MJ, Dawson P, Graham D, Barnard JS, Vickers ME, Considine L, Mullins JT and Humphreys CJ
physica status solidi (a) – applications and materials science. vol. 192 (2), 354-359.  
12-07-2002
bullet iconDopant profiling with the scanning electron microscope—A study of Si
Elliott SL, Broom RF and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 91 (11), 9116-9122.  
01-06-2002
bullet iconCrystallization transformations in vacuum-deposited amorphous aluminum fluoride self-developing thin-film resists induced by electron-beam irradiation
Chen GS, Lee PY, Boothroyd CB and Humphreys CJ
Journal of Vacuum Science & Technology a Vacuum Surfaces and Films, American Vacuum Society vol. 20 (3), 986-990.  
01-05-2002
bullet iconLuminescence from erbium-doped silicon nanocrystals in silica: Excitation mechanisms
Kenyon AJ, Chryssou CE, Pitt CW, Shimizu-Iwayama T, Hole DE, Sharma N and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 91 (1), 367-374.  
01-01-2002
bullet iconColin Humphreys - A practical physicist having fun in the world of materials
Thomas SM and Humphreys C
Materials World vol. 10 (1), 11-11.  
01-01-2002
bullet iconChapter 2.9.1 Theory of Electron Scattering and Electron Diffraction
Humphreys CJ
In Scattering, Elsevier 1287-1303.  
01-01-2002

2001

bullet iconAnalysis of contacts and V‐defects in GaN device structures by transmission electron microscopy
Bright AN, Sharma N and Humphreys CJ
Microscopy, Oxford University Press (Oup) vol. 50 (6), 489-495.  
01-11-2001
bullet iconIdentification of interfacial layers in Ohmic contacts to n-type GaN and AlxGa1-xN/GaN heterostructures using high-resolution electron microscopy
Bright AN and Humphreys CJ
Philosophical Magazine B, Taylor & Francis vol. 81 (11), 1725-1744.  
01-11-2001
bullet iconEffect of growth interruptions on the light emission and indium clustering of InGaN/GaN multiple quantum wells
Cho HK, Lee JY, Sharma N, Humphreys CJ, Yang GM, Kim CS, Song JH and Yu PW
Applied Physics Letters, Aip Publishing vol. 79 (16), 2594-2596.  
15-10-2001
bullet iconMicrostructural characterization of InGaN/GaN multiple quantum wells with high indium composition
Cho HK, Lee JY, Kim CS, Yang GM, Sharma N and Humphreys C
Journal of Crystal Growth, Elsevier vol. 231 (4), 466-473.  
01-10-2001
bullet iconMaterial optimisation for AlGaN/GaN HFET applications
Bougrioua Z, Moerman I, Sharma N, Wallis RH, Cheyns J, Jacobs K, Thrush EJ, Considine L, Beanland R, Farvacque J-L and Humphreys C
Journal of Crystal Growth, Elsevier vol. 230 (3-4), 573-578.  
01-09-2001
bullet iconChemical mapping of InGaN MQWs
Sharma N, Tricker D, Thomas P, Bougrioua Z, Jacobs K, Cheyns J, Moerman I, Thrush T, Considine L, Boyd A and Humphreys C
Journal of Crystal Growth, Elsevier vol. 230 (3-4), 438-441.  
01-09-2001
bullet iconObservation of thermally activated conduction at a GaN–sapphire interface
Mavroidis C, Harris JJ, Kappers MJ, Sharma N, Humphreys CJ and Thrush EJ
Applied Physics Letters, Aip Publishing vol. 79 (8), 1121-1123.  
20-08-2001
bullet iconElectron Energy Loss Spectroscopy (EELS) of GaN Alloys and Quantum Wells
Keast VJ, Sharma N, Kappers M and Humphreys CJ
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 7 (S2), 1182-1183.  
01-08-2001
bullet iconAtomic Site Occupancy of Platinum Group Metals in the γ’ (Ll2) Phase of a γ-γ’ Complex Nickel Base Superalloy Using Alchemi (Atomic Location by Channnelling Enhanced Microanalysis)
Ofori AP and Humphreys CJ
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 7 (S2), 346-347.  
01-08-2001
bullet iconEffects of electron-beam exposure on a ruthenium nanocluster polymer
Thomas MDR, Ahmed H, Sanderson KM, Shephard DS, Johnson BFG, Ozkaya D, Sharma N and Humphreys C
Journal of Applied Physics, Aip Publishing vol. 90 (2), 947-952.  
15-07-2001
bullet iconLocal symmetry and bonding effects on electron energy-loss near-edge structures: Ab initio study of an NiAl grain boundary
Pankhurst DA, Botton GA and Humphreys CJ
Physical Review B, American Physical Society (Aps) vol. 63 (20) 
08-05-2001
bullet iconBroad-band and flashlamp pumping of 1.53 μm emission from erbium-doped silicon nanocrystals
Kenyon AJ, Chryssou CE, Pitt CW, Shimizu-Iwayama T, Hole DE, Sharma N and Humphreys CJ
Materials Science and Engineering B, Elsevier vol. 81 (1-3), 19-22.  
01-04-2001
bullet iconCorrelation of contact resistance with microstructure for Au/Ni/Al/Ti/AlGaN/GaN ohmic contacts using transmission electron microscopy
Bright AN, Thomas PJ, Weyland M, Tricker DM, Humphreys CJ and Davies R
Journal of Applied Physics, Aip Publishing vol. 89 (6), 3143-3150.  
15-03-2001
bullet iconA transmission electron microscopy study of microstructure evolution with increasing anneal temperature in Ti/Al ohmic contacts to n-GaN
Bright AN, Tricker DM, Humphreys CJ and Davies R
Journal of Electronic Materials, Springer Nature vol. 30 (3), l13-l16.  
01-03-2001
bullet iconIdentification of interfacial layers in Ohmic contacts to n-type GaN and AlxGa1-xN/GaN heterostructures using high-resolution electron microscopy
Bright AN and Humphreys CJ
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES. vol. 81 (11), 1725-1744.  
01-01-2001
bullet iconElectronic structure of GaN studied with electron energy loss spectroscopy and density functional theory
Keast VJ, Scott AJ, Kappers MJ and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 2001. (168), 441-444.  
01-01-2001
bullet iconThe chemical and electrical properties of InGaN quantum wells grown with interrupts: A comprehensive TEM case study
Barnard JS, Sharma N, Cho HK and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 2001. (168), 481-484.  
01-01-2001
bullet iconMicrostructure of semiconducting MnSi1.7 and β-FeSi2 layers grown by surfactant-mediated reactive deposition epitaxy
Tatsuoka H, koga T, Matsuda K, Nose Y, Souno Y, Kuwabara H, Brown PD and Humphreys CJ
Thin Solid Films, Elsevier vol. 381 (2), 231-235.  
01-01-2001
bullet iconMicrostructural aspects of the early stages of GaN growth by MOCVD.
Ramloll CS, Bougrioua Z, Barnard JS, Humphreys CJ and Moerman I
ELECTRON MICROSCOPY AND ANALYSIS 2001. (168), 469-472.  
01-01-2001
bullet iconChemical mapping of indium rich quantum dots in InGaN/GaN quantum wells
Sharma N, Cho HK, Lee JY and Humphreys CJ
Mrs Advances, Springer Nature vol. 667 
01-01-2001

2000

bullet iconComparative study of sputtered and spin-coatable aluminum oxide electron beam resists
Saifullah MSM, Kurihara K and Humphreys CJ
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, American Vacuum Society vol. 18 (6), 2737-2744.  
01-11-2000
bullet iconUltra-high temperature intermetallics for the third millennium
Fairbank GB, Humphreys CJ, Kelly A and Jones CN
Intermetallics. vol. 8 (9-11), 1091-1100.  
01-09-2000
bullet iconMicrostructural evolution and stability of (Fe1−xVx)3Al alloys in relation to the electronic structure
Botton GA, Nishino Y and Humphreys CJ
Intermetallics, Elsevier vol. 8 (9-11), 1209-1214.  
01-09-2000
bullet iconChemical mapping and formation of V-defects in InGaN multiple quantum wells
Sharma N, Thomas P, Tricker D and Humphreys C
Applied Physics Letters, Aip Publishing vol. 77 (9), 1274-1276.  
28-08-2000
bullet iconThe effect of annealing on the microstructure and tensile properties of a β/γ′ Ni–Al–Fe alloy
Pekarskaya E, Botton GA, Jones CN and Humphreys CJ
Intermetallics, Elsevier vol. 8 (8), 903-913.  
01-08-2000
bullet iconThe Effect of Local Symmetry on Atomic Resolution EELS Near-Edge Structures: Predictions for Grain Boundaries In NiAl
Pankhurst DA, Botton GA and Humphreys CJ
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 6 (S2), 186-187.  
01-08-2000
bullet iconFacing up to the future of materials science and technology
Humphreys C
Materials World vol. 8 (4), 11-13.  
01-01-2000
bullet iconOxbridge and the public schools
Humphreys C
Materials World vol. 8 (1), 2-3.  
01-01-2000
bullet iconTHE NUMBERS IN THE EXODUS FROM EGYPT: A FURTHER APPRAISAL
Humphreys C
Vetus Testamentum, Brill Academic Publishers vol. 50 (3), 323-328.  
01-01-2000

1999

bullet iconCharacterisation of Epitaxial Laterally Overgrown Gallium Nitride Using Transmission Electron Microscopy
Tricker DM, Jacobs K and Humphreys CJ
physica status solidi (b). vol. 216 (1), 633-637.  
01-11-1999
bullet iconElectrons seen in orbit
Humphreys CJ
Nature, Springer Nature vol. 401 (6748), 21-22.  
01-09-1999
bullet iconElectron energy loss spectroscopy studies of the amorphous to crystalline transition in FeF3
Saifullah MSM, Botton GA, Boothroyd CB and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 86 (5), 2499-2504.  
01-09-1999
bullet iconA transmission electron microscopy investigation of SiC films grown on SiC substrates by solid-source molecular beam epitaxy
Kaiser U, Khodos I, Brown PD, Chuvilin A, Albrecht M, Humphreys CJ, Fissel A and Richter W
Journal of Materials Research, Springer Nature vol. 14 (8), 3226-3236.  
01-08-1999
bullet iconMorphological and structural characteristics of homoepitaxial GaN grown by metalorganic chemical vapour deposition (MOCVD)
Weyher JL, Brown PD, Zauner ARA, Müller S, Boothroyd CB, Foord DT, Hageman PR, Humphreys CJ, Larsen PK, Grzegory I and Porowski S
Journal of Crystal Growth, Elsevier vol. 204 (4), 419-428.  
01-08-1999
bullet iconDetermining the bonding in intermetallics using electron energy loss spectroscopy and density functional theory2This paper was originally presented at the Kyoto Workshop on High Temperature Intermetallics in May 1998.2
Botton GA and Humphreys CJ
Intermetallics. vol. 7 (7), 829-833.  
01-07-1999
bullet iconThe effect of growth condition on the structure of 2H – AlN films deposited on Si(111) by plasma-assisted molecular beam epitaxy
Kaiser U, Brown PD, Khodos I, Humphreys CJ, Schenk HPD and Richter W
Journal of Materials Research, Springer Nature vol. 14 (5), 2036-2042.  
01-05-1999
bullet iconQuantitative analysis of ultrathin doping layers in semiconductors using high‐angle annular dark field images
LIU , PRESTON , BOOTHROYD and HUMPHREYS
Journal of Microscopy, Wiley vol. 194 (1), 171-182.  
01-04-1999
bullet iconEnergy‐filtered transmission electron microscopy of multilayers in semiconductors
LIU , BOOTHROYD and HUMPHREYS
Journal of Microscopy, Wiley vol. 194 (1), 58-70.  
01-04-1999
bullet iconExperimental and theoretical study of the detection limits in electron energy-loss spectroscopy
Natusch MKH, Humphreys CJ, Menon N and Krivanek OL
Micron. vol. 30 (2), 173-183.  
01-04-1999
bullet iconA two‐phase charge‐density real‐space‐pairing model of high‐Tc superconductivity
Humphreys CJ
Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 55 (2‐1), 228-233.  
01-03-1999
bullet iconA two-phase charge-density real-space-pairing model of high-Tc superconductivity
Humphreys CJ
Acta Crystallographica Section a: Foundations of Crystallography vol. 55 (2 PART I), 228-233.  
01-03-1999
bullet iconA quantitative study of compositional profiles of chemical vapour-deposited strained silicon–germanium/silicon layers by transmission electron microscopy
Walther T and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 197 (1-2), 113-128.  
01-02-1999
bullet iconTemperature and energy dependence of SEM dopant contrast
Elliott SL, Broom RF and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1999. (161), 87-90.  
01-01-1999
bullet iconProbing atomic bonding using fast electrons
Humphreys CJ and Botton GA
TOPICS IN ELECTRON DIFFRACTION AND MICROSCOPY OF MATERIALS., 65-78.  
01-01-1999
bullet iconConvergent Beam Electron Diffraction
Humphreys CJ
NATO Science Series E:., 325-337.  
01-01-1999
bullet iconAdvances in high resolution imaging and microanalysis of Si, GaAs and GaN
Humphreys CJ, Bright AN and Elliott SL
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS. (164), 1-10.  
01-01-1999
bullet iconComposition of grain boundaries and interfaces: A comparison of modern analytical techniques using a 300 kV FEGTEM
Keast VJ, Midgley PA, Lloyd SJ, Thomas PJ, Weyland M, Boothroyd CB and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1999. (161), 35-38.  
01-01-1999
bullet iconDislocations in a multiphase Ni-Al-Fe alloy
Pekarskaya E, Jones CN and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1999. (161), 463-466.  
01-01-1999
bullet iconA TEM assessment of GaN/SiC layers grown by MBE
Bright AN, Brown PD, Tricker DM, Jeffs N, Foxon CT and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS. (164), 415-418.  
01-01-1999
bullet iconCharacterisation of ohmic contacts to n-GaN using transmission electron microscopy
Bright AN, Tricker DM, Davies R, Beanland R, Thomas PJ, Lloyd SJ, Midgley PA and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1999. (161), 597-600.  
01-01-1999
bullet iconObtaining bonding information from EELS near-edge structures: grain-boundaries in NiAl
Pankhurst DA, Botton GA and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1999. (161), 67-70.  
01-01-1999
bullet iconFEG-SEM imaging of semiconductor dopant contrast
Elliott SL, Broom RF, Humphreys CJ, Thrush EJ, Considine L, Thomson DB and de Boer WB
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS. (164), 727-730.  
01-01-1999
bullet iconCharacterisation of silicon nanocrystals in silica and correlation with luminescence
Sharma N, Keast VJ, Iwayama TS, Boyd I and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1999. (161), 589-592.  
01-01-1999
bullet iconCompositional mapping of nanoscale metallic multilayers: a comparison of techniques
Keast VJ, Misra A, Kung H, Mitchell TE and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1999. (161), 211-214.  
01-01-1999
bullet iconStructure and Climb of Faulted Dipoles in GaAs
Yonenaga I, Lim S, Shindo D, Brown PD and Humphreys CJ
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 171 (1), 53-57.  
01-01-1999
bullet iconElectronic and Structural Properties of Partially Crystallized Silicon Produced by Solid‐Phase Crystallization of As‐Deposited Amorphous Silicon
Smith JP, Eccleston W, Brown PD and Humphreys CJ
Journal of The Electrochemical Society, The Electrochemical Society vol. 146 (1), 306-312.  
01-01-1999
bullet iconStudy of sample thickness dependence in electron-beam irradiation of self-developing inorganic materials
Chen GS and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 85 (1), 148-152.  
01-01-1999
bullet iconThe Effect of the Buffer Layer on the Structure, Mobility and Photoluminescence of MBE grown GaN
Sharma N, Tricker D, Keast V, Hooper S, Heffernan J, Barnes J, Kean A and Humphreys C
MRS Advances. vol. 595 
01-01-1999
bullet iconInversion domain nucleation in homoepitaxial GaN
Brown PD, Weyher JL, Boothroyd CB, Foord DT, Zauner ARA, Hageman PR, Larsen PK, Bockowski M and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS. (164), 381-384.  
01-01-1999
bullet iconGEOMETRY OF THREE BEAM PHASE DETERMINATION
Moodie AF, Etheridge J and Humphreys CJ
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. vol. 55, 24-24.  
01-01-1999
bullet iconDIRECT MEASUREMENT OF PHASE-INVARIANTS AND STRUCTURE AMPLITUDES FROM 3 BEAM CBED PATTERNS
Etheridge J, Moodie AF and Humphreys CJ
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. vol. 55, 24-24.  
01-01-1999
bullet iconTHE VALIDITY OF QUASI-KINEMATIC THEORY IN ELECTRON CRYSTALLOGRAPHY
Whitfield HJ, Moodie AF, Etheridge J and Humphreys CJ
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. vol. 55, 24-24.  
01-01-1999

1998

bullet iconAtomic Arrangement of a Z-Shape Faulted Dipole within Deformed GaAs
Lim S-H, Shindo D, Yonenaga I, Brown PD and Humphreys CJ
Physical Review Letters, American Physical Society (Aps) vol. 81 (24), 5350-5353.  
14-12-1998
bullet iconHigh-Quality Epitaxial MnSi(111) Layers Grown in the Presence of an Sb Flux
Matsuda K, Tatsuoka H, Matsunaga K, Isaji K, Kuwabara H, Brown PD, Xin Y, Dunin-Borkowski R and Humphreys CJ
Japanese Journal of Applied Physics, Iop Publishing vol. 37 (12R) 
01-12-1998
bullet iconStuff of dreams
Humphreys C
New Scientist vol. 157 (2126), 44-45.  
01-12-1998
bullet iconMicrowave dielectric properties of (Y2-xRx)BaCuO5 (R = rare-earth) solid solutions
Ogawa H, Watanabe M, Ohsato H and Humphreys C
Ieee International Symposium On Applications of Ferroelectrics, 517-520.  
01-12-1998
bullet iconClimb of dislocations in GaAs by irradiation
Yonenaga I, Brown PD and Humphreys CJ
Materials Science and Engineering A, Elsevier vol. 253 (1-2), 148-150.  
01-09-1998
bullet iconMicrowave Dielectric Properties of Y2Ba(Cu1-xZnx)O5 Solid Solutions
Watanabe M, Ogawa H, Ohsato H and Humphreys C
Japanese Journal of Applied Physics. vol. 37 (9S) 
01-09-1998
bullet iconElectron-beam-induced damage in amorphous SiO2 and the direct fabrication of silicon nanostructures
Chen GS, Boothroyd CB and Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 78 (2), 491-506.  
01-08-1998
bullet iconEffect of molybdenum substitution on phase stability and high-temperature strength of Fe3 Al alloys
Nishino Y, Inkson BJ, Ogawa T and Humphreys CJ
Philosophical Magazine Letters, Taylor & Francis vol. 78 (2), 97-103.  
01-08-1998
bullet iconShaping the future of materials science
Humphreys C
Materials World vol. 6 (6), 352-355.  
01-06-1998
bullet iconInterfacial reaction and defect microstructure of epitaxial MnSb/Si(111) grown by hot-wall epitaxy
Tatsuoka H, Isaji K, Sugiura K, Kuwabara H, Brown PD, Xin Y and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 83 (10), 5504-5508.  
15-05-1998
bullet iconElectron-energy-loss spectra and the structural stability of nickel oxide: An LSDA+U study
Dudarev SL, Botton GA, Savrasov SY, Humphreys CJ and Sutton AP
Physical Review B, American Physical Society (Aps) vol. 57 (3), 1505-1509.  
15-01-1998
bullet iconThe ultimate detection limits of electron energy-loss spectroscopy
Natusch MKH, Botton GA, Humphreys CJ and Krivanek OL
ELECTRON., 476-483.  
01-01-1998
bullet iconA microstructural model of high-Tc superconductivity
Humphreys CJ
ELECTRON., 124-134.  
01-01-1998
bullet iconThe Coulomb interaction and the direct measurement of structural phase
Moodie AF, Etheridge J and Humphreys CJ
ELECTRON., 235-246.  
01-01-1998
bullet iconLocal electronic structure of defects in GaN from spatially resolved electron energy-loss spectroscopy
Natusch MKH, Botton GA and Humphreys CJ
GROWTH AND PROCESSING OF ELECTRONIC MATERIALS., 30-36.  
01-01-1998
bullet iconElectron Microscopy, Electrical Activity, Artefacts and the Assessment of Semiconductor Epitaxial Growth
Brown PD and Humphreys CJ
MRS Advances. vol. 523 
01-01-1998
bullet iconDetection limits in electron energy-loss spectroscopy and energy-filtered imaging
Natusch MKH, Botton GA, Krivanek OL and Humphreys CJ
ELECTRON MICROSCOPY 1998, VOL 3., 651-652.  
01-01-1998
bullet iconExperimental investigation of the effect of defocus on beam diameter in focused ion beam milling
Campbell LCI and Humphreys CJ
ELECTRON MICROSCOPY 1998, VOL 3., 157-158.  
01-01-1998
bullet iconA simple and efficient way to obtain more information about interband transitions from an electron energy-loss spectrum in the low-loss region
Natusch MKH, Botton GA and Humphreys CJ
ELECTRON MICROSCOPY 1998, VOL 3., 627-628.  
01-01-1998
bullet iconA TEM study of a GaN/InGaN superlattice structure grown by MBE
Tricker DM, Bright AN, Brown PD, Korakakis D, Cheng TS, Foxon CT and Humphreys CJ
ELECTRON MICROSCOPY 1998, VOL 3., 393-394.  
01-01-1998
bullet iconA joint theoretical and experimental investigation of bonding character at a grain boundary in the B2 compound NiAl
Pankhurst DA, Botton GA and Humphreys CJ
ELECTRON MICROSCOPY 1998, VOL 2., 643-644.  
01-01-1998
bullet iconCharacterisation of a Gatan Imaging Filter mounted on a dedicated STEM
Natusch MKH, Botton GA, Krivanek OL and Humphreys CJ
ELECTRON MICROSCOPY 1998, VOL 1., 95-96.  
01-01-1998
bullet iconIrradiation damage of inorganic resists on a silicon substrate
Saifullah MSM, Boothroyd CB, Botton GA and Humphreys CJ
ELECTRON., 531-537.  
01-01-1998
bullet iconThe Compton scattering distribution from InP by electron spectroscopic diffraction
Liu CP, Boothroyd CB and Humphreys CJ
ELECTRON., 456-463.  
01-01-1998
bullet iconEnergy-Filtered Transmission Electron Microscopy of Multilayers in Semiconductors
Liu CP, Boothroyd CB and Humphreys CJ
MRS Advances. vol. 523 
01-01-1998
bullet iconDirect measurement of structure amplitudes from three beam interactions
Etheridge J, Moodie AF and Humphreys CJ
ELECTRON MICROSCOPY 1998, VOL 3., 737-738.  
01-01-1998
bullet iconEvidence for charged defects in wurtzite GaN from spatially resolved electron energy-loss spectroscopy
Natusch MKH, Botton GA and Humphreys CJ
ELECTRON MICROSCOPY 1998, VOL 3., 391-392.  
01-01-1998
bullet iconElectronic Structure, Charge Transfer and Bonding in Intermetallics Using EELS and Density Functional Theory
Humphreys CJ, Botton GA, Pankhurst DA, Keast VJ and Temmerman WM
Mrs Advances, Springer Nature vol. 552 
01-01-1998
bullet iconComparative Study of the Microstructure and Tensile Properties of Ni-Al Alloys with Fe and Cr Additions
Pekarskaya E, Humphreys CJ and Jones CN
Mrs Advances, Springer Nature vol. 552 
01-01-1998
bullet iconMicrowave dielectric properties of Y2Ba(Cu1-xZnx)O5 solid solutions
Watanabe M, Ogawa H, Ohsato H and Humphreys C
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers vol. 37 (9 PART B), 5360-5363.  
01-01-1998
bullet iconRHEED for the rapid structural assessment of epitaxial GaN and metallisation layers
Bright A, Brown PD, Tricker D and Humphreys C
ELECTRON MICROSCOPY 1998, VOL 3., 439-440.  
01-01-1998
bullet iconHigh-quality epitaxial MnSi(111) layers grown in the presence of an Sb flux
Matsuda K, Tatsuoka H, Matsunaga K, Isaji K, Kuwabara H, Brown PD, Xin Y, Dunin-Borkowski R and Humphreys CJ
Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers vol. 37 (12A), 6556-6561.  
01-01-1998
bullet iconA TEM study of substrate pitting during the MBE growth of GaN on GaAs and GaP substrates
Tricker DM, Brown PD, Cheng TS, Foxon CT and Humphreys CJ
Applied Surface Science. vol. 123, 22-27.  
01-01-1998
bullet iconThe Number of People in the Exodus from Egypt: Decoding Mathematically the Very Large Numbers in Numbers I and XXVI
Humphreys C
Vetus Testamentum, Brill Academic Publishers vol. 48 (2), 196-213.  
01-01-1998

1997

bullet iconObservation of 3-Fold Periodicity in 3C-SiC Layers Grown by MBE
Kaiser U, Brown PD, Chuvilin A, Khodos II, Fissel A, Richter W, Preston A and Humphreys CJ
 
22-12-1997
bullet iconInvestigation of the proximity effect in amorphous AlF3 electron-beam resists
Chen GS and Humphreys CJ
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, American Vacuum Society vol. 15 (6), 1954-1960.  
01-11-1997
bullet iconBook Review: The Economic Laws of Scientific Research, Terence Kealey. Macmillan Press, Basingstoke and London, 1996. £47.50 (hardback). 0-333-56045-0
Humphreys C
European Review, Cambridge University Press (Cup) vol. 5 (4), 443-445.  
01-10-1997
bullet iconObservation of vertical and lateral Ge segregation in thin undulating SiGe layers on Si by electron energy-loss spectroscopy
Walther T, Humphreys CJ and Cullis AG
Applied Physics Letters, Aip Publishing vol. 71 (6), 809-811.  
11-08-1997
bullet iconAnalysis of EELS near edge structures to study the bonding character in intermetallic alloys
Botton GA and Humphreys CJ
Micron, Elsevier vol. 28 (4), 313-319.  
01-08-1997
bullet iconInterfaces and Defects in Opto-Electronic Semiconductor Films Studied by Atomic Resolution STEM
Xin Y, Wallis D, Browning N, Sivananthan S, Pennycook S and Humphreys C
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 3 (S2), 461-462.  
01-08-1997
bullet iconCharacterization of Ultrathin Doping Layers in Semiconductors
Liu C, Dunin-Borkowski R, Boothroyd C, Brown P and Humphreys C
Microscopy and Microanalysis, Oxford University Press (Oup) vol. 3 (4), 352-363.  
01-07-1997
bullet iconMicrostructural and electron spectroscopic characterization of carbon nanostructures and nanotubes produced using multimetal catalysts
Botton GA, Burnell G, Humphreys CJ, Yadav T and Withers JC
Journal of Physics and Chemistry of Solids, Elsevier vol. 58 (7), 1091-1102.  
01-07-1997
bullet iconDetermining directly from experiment the magnitude of the Burgers vector of glissile c-component dislocations in Ti Al
Wiezorek JMK, Humphreys CJ and Fraser HL
Philosophical Magazine Letters, Taylor & Francis vol. 75 (5), 281-290.  
01-05-1997
bullet iconDomain boundaries in epitaxial wurtzite GaN
Xin Y, Brown PD, Humphreys CJ, Cheng TS and Foxon CT
Applied Physics Letters, Aip Publishing vol. 70 (10), 1308-1310.  
10-03-1997
bullet iconMicrostructural characterisation of GaN(As) films grown on (001) GaP by molecular beam epitaxy
Xin Y, Brown PD, Dunin-Borkowski RE, Humphreys CJ, Cheng TS and Foxon CT
Journal of Crystal Growth, Elsevier vol. 171 (3-4), 321-332.  
01-02-1997
bullet iconA Combined Tem/Rheed, Sem/Cl Study Of Epitaxial Gan
Brown PD, Tricker DM, Xin Y, Chengt TS, Foxont CT, Evanst D, Galloway SA, Brock J and Humphreys CJ
MRS Advances. vol. 482 
01-01-1997
bullet iconThe effects of surface relaxation and ion thinning on δ-doped semiconductor cross-sections
Liu CP, Brown PD, Boothroyd CB and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997. (157), 483-486.  
01-01-1997
bullet iconDeveloping a methodology for the electron energy-loss spectroscopy of defects in GaN
Natusch MKH, Botton GA and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997. (157), 213-216.  
01-01-1997
bullet iconLocal Electronic Structure Of Defects In Gan From Spatially Resolved Electron Energy-Loss Spectroscopy
Natusch MKH, Botton GA, Broom RF, Brown PD, Tricker DM and Humphreys CJ
MRS Advances. vol. 482 
01-01-1997
bullet iconDiffusion and Surface Segregation in Thin SiGe/Si Layers Studied by Scanning Transmission Electron Microscopy
Walther T, Humphreys CJ and Robbins DJ
 
01-01-1997
bullet iconProbing the effect of defects on band structure in GaN
Tricker DM, Natusch MKH, Boothroyd CB, Xin Y, Brown PD, Cheng TS, Foxon CT and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997. (157), 217-220.  
01-01-1997
bullet iconDomain boundaries in epitaxial GaN grown on {(111)over-bar}B GaAs and GaP by molecular beam epitaxy
Xin Y, Brown PD, Cheng TS, Foxon CT and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997. (157), 95-98.  
01-01-1997
bullet iconStructural and electronic properties of partially crystallised silicon
Brown PD, Smith JP, Eccleston W and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997. (157), 427-430.  
01-01-1997
bullet iconElectron Energy Loss Spectroscopy as a Tool to Probe the Electronic Structure in Intermetallic Alloys
Botton GA, Guo G-Y, Temmerman WM and Humphreys CJ
 
01-01-1997
bullet iconA Tem Study of the Microstructural Evolution of MBE-Grown GaN
Tricker DM, Brown PD, Martin G, Lu J, Westwood DI, Hill P, Haworth L, MacDonald JE, Cheng TS, Foxon CT and Humphreys CJ
MRS Advances. vol. 482 (1), 187-192.  
01-01-1997
bullet iconThe characterisation of ultrathin doping layers in semiconductors using high-angle annular dark-field imaging
Liu CP, Boothroyd CB, Brown PD and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997. (157), 67-70.  
01-01-1997
bullet iconStructural characterisation of MnSb/GaAs and MnSb/Si heterostructures grown by hot-wall epitaxy
Tatsuoka H, Brown PD, Xin Y, Isaji K, Kuwabara H, Nakanishi Y, Nakamura T, Fujiyasu H and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997. (157), 59-62.  
01-01-1997
bullet iconMicrostructural investigations of silicon carbide and aluminium nitride MBE layers on silicon substrates
Kaiser U, Brown PD, Jinschek J, Adamik M, Humphreys CJ, Karmann S, Fissel A, Pfennighaus K and Richter W
EUROPEAN JOURNAL OF CELL BIOLOGY. vol. 74, 120-120.  
01-01-1997
bullet iconA study of interdiffusion and germanium segregation in low-pressure chemical vapour deposition of SiGe/Si quantum wells
Walther T, Humphreys CJ, Cullis AG and Robbins DJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1997. (157), 47-54.  
01-01-1997
bullet iconGrowth of GaN layers on GaAs and GaP (111) and (001) substrates by molecular beam epitaxy
Cheng TS, Foxon CT, Ren GB, Jeffs NJ, Orton JW, Novikov SV, Xin Y, Brown PD, Humphreys CJ and Halliwell M
COMPOUND SEMICONDUCTORS 1996. (155), 259-262.  
01-01-1997

1996

bullet iconScanning transmission electron beam induced conductivity investigation of a Si/Si1− x Ge x /Si heterostructure
Brown PD and Humphreys CJ
Journal of Applied Physics, Aip Publishing vol. 80 (4), 2527-2529.  
15-08-1996
bullet iconDirect determination of phase from three-beam convergent-beam diffraction patterns of centrosymmetric crystals
Etheridge J, Moodie AF and Humphreys CJ
Acta Crystallographica Section A: Foundations and advances. vol. 52 (a1), c54-c54.  
08-08-1996
bullet iconMissed opportunities for high-temperature superconductivity
Harrowell RV
Physics World, Iop Publishing vol. 9 (8), 15-15.  
01-08-1996
bullet iconExperimental and theoretical study of the electronic structure of Fe, Co, and Ni aluminides with the B2 structure
Botton GA, Guo GY, Temmerman WM and Humphreys CJ
Physical Review B, American Physical Society (Aps) vol. 54 (3), 1682-1691.  
15-07-1996
bullet iconElectron-beam induced crystallization transition in self-developing amorphous AlF3 resists
Chen GS, Boothroyd CB and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 69 (2), 170-172.  
08-07-1996
bullet iconThe Symmetry of Three‐Beam Scattering Equations: Inversion of Three‐Beam Diffraction Patterns from Centrosymmetric Crystals
Moodie AF, Etheridge J and Humphreys CJ
Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 52 (4), 596-605.  
01-07-1996
bullet iconHigh-resolution electron microscopy study of the junction between a coherent {111} and an incoherent {121} twin boundary in TiAl
Inkson BJ and Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 73 (6), 1647-1661.  
01-06-1996
bullet iconDislocations at 120° order interfaces in TiAl
Inkson BJ and Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 73 (5), 1333-1345.  
01-05-1996
bullet iconEffect of a doping impurity on the formation of structural defects in CdTe irradiated by electrons and ions
Loginov YY, Brown PD and Humphreys CJ
Physics of The Solid State vol. 38 (4), 692-697.  
01-04-1996
bullet iconFormation of structural defects in CdTe and CdZnTe heteroepitaxial layers grown on GaAs
Loginov YY, Brown PD and Humphreys CJ
Physics of The Solid State vol. 38 (2), 272-277.  
01-02-1996
bullet iconMisfit control in NiTi/Ni2TiAlβ/β′ alloys
Peters MA and Humphreys CJ
STRUCTURAL INTERMETALLICS 1997., 605-612.  
01-01-1996
bullet iconTEM and PL characterisation of MBE-grown epitaxial GaN/GaAs
Xin Y, Brown PD, Boothroyd CB, Preston AR, Humphreys CJ, Cheng TS, Foxon CT, Andrianov AV and Orton JW
MRS Advances. vol. 423 (1), 311-316.  
01-01-1996
bullet iconAtom positions in the R-phase unit cell in TiNi shape memory alloy
Chen Q, Knowles KM, Humphreys CJ and Wu XF
Journal of Materials Science, Springer Nature vol. 31 (16), 4227-4231.  
01-01-1996
bullet iconDefect Formation in ZnTe and (Cd,Zn)Te Epitaxial Layers Grown on (001) GaAs
Loginov YY, Brown PD and Humphreys CJ
Inorganic Materials vol. 32 (1), 22-25.  
01-01-1996
bullet iconGrowth of GaN films on (001) and (111) GaAs surfaces by a modified MBE method
Cheng TS, Foxon CT, Jeffs NJ, Hughes OH, Ren BG, Xin Y, Brown PD, Humphreys CJ, Andranov AV, Lacklison DE, Orton JW and Halliwell M
Mrs Internet Journal of Nitride Semiconductor Research, Springer Nature vol. 1 (1) 
01-01-1996

1995

bullet iconOn the dissociation of prism plane superdislocations in Ti3Al
Wiezorek JMK, Court SA and Humphreys CJ
Philosophical Magazine Letters, Taylor & Francis vol. 72 (6), 393-403.  
01-12-1995
bullet iconThe microstructure of MnSb grown on (001) GaAs by hot wall epitaxy
Xin Y, Brown PD, Boothroyd CB, Humphreys CJ, Tatsuoka H, Kuwabara H, Oshita M, Nakamura T, Fujiyasu H and Nakanishi Y
Journal of Crystal Growth, Elsevier vol. 156 (3), 155-162.  
01-11-1995
bullet iconA Correlation between Compositional Fluctuations and Surface Undulations in Strained Layer Epitaxy
Walther T, Humphreys CJ, Cullis AG and Robbins DJ
, Trans Tech Publications vol. 196-201, 505-510.  
01-11-1995
bullet iconTEM Investigation of Point Defect Interactions in II-VI Compounds
Loginov YY, Brown PD and Humphreys CJ
 
01-11-1995
bullet iconDetection of random alloy fluctuations in high-resolution transmission electron micrographs of AlGaAs
Walther T, Humphreys CJ, Grimshaw MP and Churchill AC
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 72 (4), 1015-1030.  
01-10-1995
bullet iconMeasurement of low-order structure factors for silicon from zone-axis CBED patterns
Saunders M, Bird DM, Zaluzec NJ, Burgess WG, Preston AR and Humphreys CJ
Ultramicroscopy, Elsevier vol. 60 (2), 311-323.  
01-09-1995
bullet iconOn the hierarchy of planar fault energies in TiAl
Wiezorek JMK and Humphreys CJ
Scripta Metallurgica Et Materialia, Elsevier vol. 33 (3), 451-458.  
01-08-1995
bullet iconMicrotwin nucleation and propagation in heteroepitaxial II-VI compounds on (001)-oriented GaAs substrates
Brown PD, Loginov YY, Stobbs WM and Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 72 (1), 39-57.  
01-07-1995
bullet iconHREM studies of the (001) surface of YBa2Cu4O8
Xin Y, Zhou W and Humphreys CJ
Physica C: Superconductivity and Its Applications, Elsevier vol. 249 (3-4), 319-332.  
01-07-1995
bullet iconHigh-resolution electron microscopy observation of a 1/2(112) superdislocation in TiAl
Inkson BJ and Humphreys CJ
Philosophical Magazine Letters, Taylor & Francis vol. 71 (6), 307-312.  
01-06-1995
bullet iconBoride morphology in A (Fe, V, B) Ti-alloy containing B2-phase
Inkson BJ, Boothroyd CB and Humphreys CJ
Acta Metallurgica Et Materialia, Elsevier vol. 43 (4), 1429-1438.  
01-04-1995
bullet iconAssessment of semiconductor epitaxial growth by transmission electron microscopy
Brown PD and Humphreys CJ
Materials Science and Technology, Sage Publications vol. 11 (1), 54-65.  
01-01-1995
bullet iconEELS Studies of B2-Type Transition Metal Aluminides: Experiment and Theory
Bottonm GA, Guo GY, Temmerman WM, Szotek Z, Humphreys CJ, Wango Y, Stocks GM, Nicholson DMC and Shelton WA
MRS Advances. vol. 408 
01-01-1995
bullet iconElectron Beam Induced Crystallisation in Iron (III) Fluoride
Saifullah MSM, Boothroyd CB, Botton GA and Humphreys CJ
MRS Advances. vol. 398 
01-01-1995
bullet iconThe dependence of the rate of electron beam damage in amorphous aluminium oxide on beam current density
Morgan CJ and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 579-582.  
01-01-1995
bullet iconThe precipitation of beta' Ni2TiAl from Al-doped beta Ni-Ti alloys
Peters MA, Botton GA and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 451-454.  
01-01-1995
bullet iconThe role of plasmon scattering in the quantitative contrast analysis of high-resolution lattice images of GaAs
Walther T, Schaublin RE, DuninBorkowski RE, Boothroyd CB, Humphreys CJ and Stobbs WM
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 195-198.  
01-01-1995
bullet iconThe limitations of pattern recognition and displacement measurement techniques for evaluating HREM images of strained semiconductor interfaces
Walther T and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 103-106.  
01-01-1995
bullet iconSTEBIC of Si/Si1-xGex/Si and high voltage REBIC of CdTe
Brown PD and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1995. vol. 146, 701-704.  
01-01-1995
bullet iconA contribution to the quantitative comparison of experimental high-resolution electron micrographs and image simulations
Walther T, Hetherington CJD and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1995. vol. 146, 53-56.  
01-01-1995
bullet iconHREM observation of omega-phase in an industrial TiAl alloy
Inkson BJ and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 547-550.  
01-01-1995
bullet iconSTEBIC of Si/Si1-xGex/Si heterostructures
Brown PD and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 285-288.  
01-01-1995
bullet iconStrain relaxation induced local crystal tilts at Si/SiGe interfaces in cross-sectional transmission electron microscope specimens
Walther T, Boothroyd CB and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1995. vol. 146, 11-16.  
01-01-1995
bullet iconA comparative study of electron beam damage in crystalline and amorphous aluminium oxide.
Morgan CJ, Boothroyd CB and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 567-570.  
01-01-1995
bullet iconThe proximity effect for electron beam lithography of aluminium oxide.
Morgan CJ and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 575-578.  
01-01-1995
bullet iconFaulted dipoles in Indium-doped GaAs
Yonenaga I, Brown PD, Burgess WG and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1995. vol. 146, 87-90.  
01-01-1995
bullet iconRelaxation of (001)Si/Si1-xGex/Si heterostructures
Xin Y, Brown PD, Schaublin RE and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1995. vol. 146, 183-186.  
01-01-1995
bullet iconElectron beam nanolithography of FeF3 using a scanning transmission electron microscope
Saifullah MSM, Boothroyd CB, Morgan CJ and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 325-328.  
01-01-1995
bullet iconDislocation configurations in low lattice-mismatched Si/SiGe/(001)Si heterostructures
Xin Y, Brown PD and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 87-90.  
01-01-1995
bullet iconThe bonding character of intermetallic alloys using EELS
Botton GA, Guo GY and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 535-538.  
01-01-1995
bullet iconArtefacts within ion beam milled semiconductors
Brown PD, Loginov YY, Boothroyd CB and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 393-396.  
01-01-1995
bullet iconPoint defect interactions in doped II-VI compounds under ion and electron beam irradiation
Loginov YY, Brown PD and Humphreys CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1995. vol. 146, 431-434.  
01-01-1995
bullet iconColumn approximation effects on partial dislocation weak beam images
Wiezorek JMK, Preston AR and Humphreys CJ
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 455-458.  
01-01-1995
bullet iconA Model for Estimating the Stress Induced During Oxidation of Sharp Silicon Structures
Morgan CJ and Humphreys CJ
MRS Advances. vol. 389 
01-01-1995
bullet iconA TEM study of dislocation decoration in gamma-TiAl
Wiezorek JMK, Botton G, Humphreys CJ and Fraser HL
ELECTRON MICROSCOPY AND ANALYSIS 1995. vol. 147, 515-518.  
01-01-1995
bullet iconA FRAMEWORK FOR THE FUTURE
CAMPBELL J and HUMPHREYS C
Materials World vol. 3 (6), 286-287.  
01-01-1995

1994

bullet iconDislocation nucleation and propagation in semiconductor heterostructures
Cherns D, Mylonas S, Chou CT, Wu J, Ashenford DE, Lunn B, Perovic DD and Humphreys CJ
Scanning Microscopy. vol. 8 (4), 841-848.  
01-12-1994
bullet iconInterpretation of the {100} fringes in lattice images from the centre of carbon nanotubes
Cullen SL, Boothroyd CB and Humphreys CJ
Ultramicroscopy. vol. 56 (1-3), 127-134.  
01-11-1994
bullet iconFamines and cataclysmic volcanism
WHITE RS and HUMPHREYS CJ
Geology Today, Wiley vol. 10 (5), 181-185.  
01-09-1994
bullet iconBenefits of energy filtering for advanced convergent beam electron diffraction patterns
Burgess WG, Preston AR, Botton GA, Zaluzec NJ and Humphreys CJ
Ultramicroscopy, Elsevier vol. 55 (3), 276-283.  
01-09-1994
bullet iconTransmission electron microscopy investigations of II–VI/GaAs heterostructures
Brown PD, Loginov YY, Mullins JT, Durose K, Brinkman AW and Humphreys CJ
Journal of Crystal Growth, Elsevier vol. 138 (1-4), 538-544.  
01-04-1994
bullet iconBurgers vector determination of decorated dislocations in γ-TiAl by diffraction contrast and large-angle convergent-beam electron diffraction
Wiezorek JMK, Preston AR, Court SA, Fraser HL and Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 69 (2), 285-299.  
01-02-1994
bullet iconStebic Revisited
Brown PD and Humphreys CJ
MRS Advances. vol. 354 
01-01-1994
bullet iconAn Hrem Investigation of a {121}L10 Boundary in Tial
Inkson BJ and Humphreys CJ
MRS Advances. vol. 364 
01-01-1994
bullet iconQuantifying The Effects Of Amorphous Layers on Image Contrast Using Energy Filtered Transmission Electron Microscopy
Boothroyd CB, Dunin-borkowski RE, Stobbs WM and Humphreys CJ
MRS Advances. vol. 354 
01-01-1994
bullet iconElectron beam damage in amorphous AlF3. A study of mass loss vs time
ALLEN RM, CHEN GS and HUMPHREYS CJ
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B., 1307-1308.  
01-01-1994
bullet iconA study of proximity effects in AlF3 electron beam resists
CHEN GS, MORGAN CJ and HUMPHREYS CJ
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B., 1305-1306.  
01-01-1994
bullet iconAn HREM study of 1/6<112> intrinsic dipole formation in a Ti-Al alloy
INKSON BJ and HUMPHREYS CJ
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B., 83-84.  
01-01-1994
bullet iconEELS near edge structures in B2 intermetallics: A systematic series
BOTTON GA and HUMPHREYS CJ
ELECTRON MICROSCOPY 1994, VOL 1., 631-632.  
01-01-1994
bullet iconMomentum transfer dependence of the low energy loss distribution of carbon nanotubes
CULLEN SL, BOTTON G and HUMPHREYS CJ
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B., 311-312.  
01-01-1994
bullet iconThe effect of thin crystal strain relaxation on high-resolution images of Si/Si0.8Ge0.2 quantum wells
WALTHER T, BOOTHROYD CB, HUMPHREYS CJ and CULLIS AG
ELECTRON MICROSCOPY 1994, VOL 1., 365-366.  
01-01-1994
bullet iconDefect anisotropy in (001) oriented sphalerite heteroepitaxial layers
BROWN PD and HUMPHREYS CJ
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B., 149-150.  
01-01-1994
bullet iconFrom carbon socks to web-like wires: The microstructure of multi-metal filled carbon nanostructures by TEM and EELS
BOTTON GA, BURNELL G, HUMPHREYS CJ, YADAV T and WITHERS JC
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B., 321-322.  
01-01-1994
bullet iconExperimental Tem and Image Simulation of Dislocations in Ti3A1
Wiezorek JMK, Court SA and
Humphreys CJ
MRS Advances. vol. 364 
01-01-1994
bullet iconStructure factor determination in germanium by zone axis CBED
BURGESS W, SAUNDERS M, BIRD DM, PRESTON AR, ZALUZEC NJ and HUMPHREYS CJ
ELECTRON MICROSCOPY 1994, VOL 1., 849-850.  
01-01-1994
bullet iconHrem Lattice Image Simulations of Circular Cross-Sectional Multishell Carbon Nanotubes
Cullen SL, Morgan CJ, Boothroyd CB and Humphreys CJ
MRS Advances. vol. 359 
01-01-1994
bullet iconControl of Point Defects in Semiconductors
Loginov YY, Brown PD and Humphreys CJ
MRS Advances. vol. 373 
01-01-1994

1993

bullet iconMeasuring the height of steps on MgO cubes using Fresnel contrast in a scanning transmission electron microscope
Boothroyd CB and Humphreys CJ
Ultramicroscopy. vol. 52 (3-4), 318-324.  
01-12-1993
bullet iconEvolution and religion
White RS and Humphreys C
Nature, Springer Nature vol. 366 (6453), 296-296.  
01-12-1993
bullet iconBoron segregation in a (Fe, V, B) TiAl based alloy
INKSON BJ, BOOTHROYD CB and HUMPHREYS CJ
The European Physical Journal Special Topics. vol. 03 (C7) 
01-11-1993
bullet iconMicrostructure of A γ−α2−β TiAl alloy containing iron and vanadium
Inkson BJ, Boothroyd CB and Humphreys CJ
Acta Metallurgica Et Materialia, Elsevier vol. 41 (10), 2867-2876.  
01-10-1993
bullet iconNovel fabrication method for nanometer-scale silicon dots and wires
Chen GS, Boothroyd CB and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 62 (16), 1949-1951.  
19-04-1993
bullet iconDETERMINATION OF STACKING-FAULT ENERGIES OF THE INTERMETALLIC TI-52AT-PERCENT AL
WIEZOREK JMK and HUMPHREYS CJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 445-448.  
01-01-1993
bullet iconHIGH-RESOLUTION PROFILE IMAGING OF (HG, MN)TE
BROWN PD, KIRKLAND A and HUMPHREYS CJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 209-212.  
01-01-1993
bullet iconINVESTIGATIONS OF STRUCTURE AND DEGRADATION OF CARBON NANOTUBES BY EELS AND HREM
CULLEN SL, BOTTON G, KIRKLAND AI, BROWN PD and HUMPHREYS CJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 79-82.  
01-01-1993
bullet iconELECTRON-INDUCED CRYSTALLIZATION IN ALUMINUM TRIFLUORIDE
CHEN GS, BOOTHROYD CB and HUMPHREYS CJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 369-372.  
01-01-1993
bullet iconDIRECT ELECTRON-BEAM FABRICATION OF NANOMETER-SCALE SILICON COLUMNS
CHEN GS, BOOTHROYD CB and HUMPHREYS CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1993. (134), 503-508.  
01-01-1993
bullet iconELECTRON-MICROSCOPE INVESTIGATIONS OF HETEROSTRUCTURES, NANOSTRUCTURES AND MISFIT DISLOCATIONS
HUMPHREYS CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1993. (134), 441-448.  
01-01-1993
bullet iconBoron segregation in a (Fe, V, B) TiAl based alloy
Inkson BJ, Boothroyd CB and Humphreys CJ
Journal De Physique. vol. 3 (7 pt 1), 397-402.  
01-01-1993
bullet iconTHE EFFECT OF THE IMAGING ELECTRON-BEAM ON INP/INGAAS MQW STRUCTURES
BROWN PD, BITHELL EG, HUMPHREYS CJ, SKEVINGTON PJ, PERRIN SD and DAVIES GJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1993. (134), 493-496.  
01-01-1993
bullet iconTHE EFFECT OF GROWTH INTERRUPTS ON CBE GROWN INP
BROWN PD, BITHELL EG, HUMPHREYS CJ, SKEVINGTON PJ, CANNARD PJ and DAVIES GJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1993. (134), 373-376.  
01-01-1993
bullet iconAN HREM INVESTIGATION OF THE DIAMOND HEXAGONAL PHASE IN A SILICON CONE FROM A VACUUM MICROELECTRONIC DEVICE
MORGAN CJ, KIRKLAND AI and HUMPHREYS CJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 267-270.  
01-01-1993
bullet iconDEBYE-WALLER FACTOR DETERMINATION FROM LACBED PATTERNS
PRESTON AR, BURGESS WG, PICKUP CJ and HUMPHREYS CJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 145-148.  
01-01-1993
bullet iconACCURATE STRUCTURE FACTOR REFINEMENT FROM ZONE-AXIS CBED PATTERNS
SAUNDERS M, BIRD DM, ZALUZEC NJ, BURGESS WG and HUMPHREYS CJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 125-128.  
01-01-1993
bullet iconA STUDY OF SAMPLE THICKNESS DEPENDENCE IN ELECTRON-BEAM HOLE-DRILLING OF INORGANIC MATERIALS
ALLEN RM, LLOYD SJ and HUMPHREYS CJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 87-90.  
01-01-1993
bullet iconSTRUCTURE FACTOR DETERMINATION BY ZONE-AXIS CBED
BURGESS WG, SAUNDERS M, BIRD D, BOTTON G, PRESTON AR, HUMPHREYS CJ and ZALUZEC NJ
ELECTRON MICROSCOPY AND ANALYSIS 1993. (138), 137-140.  
01-01-1993

1992

bullet iconThe Jewish Calendar, A Lunar Eclipse and the Date of Christ’s Crucifixion
Humphreys CJ and Waddington WG
Tyndale Bulletin, Tyndale House vol. 43 (2) 
01-11-1992
bullet iconULTIMATE LIMITS OF LITHOGRAPHY
MORGAN C, CHEN GS, BOOTHROYD C, BAILEY S and HUMPHREYS C
Physics World vol. 5 (11), 28-32.  
01-01-1992

1991

bullet iconTEM study of nitrogen enhanced oxygen precipitation in nitrogen-doped Czochralski-grown silicon
Zhou X, Preston AR and Humphreys CJ
Institute of Physics Conference Series. (117), 211-216.  
01-12-1991
bullet iconElectron beam damage in AlF3
Chen GS, Boothroyd CB and Humphreys CJ
Institute of Physics Conference Series. vol. 119, 325-328.  
01-12-1991
bullet iconElectron beam nanolithography of sputtered amorphous Al2O3 and the proximity effect
Morgan CJ, Bailey SJ, Preston AR and Humphreys CJ
Institute of Physics Conference Series. vol. 119, 503-506.  
01-12-1991
bullet icon100 keV electron beam damage of metals, ceramics and semiconductors - implications for microanalysis and nanolithography
Humphreys CJ, Bullough TJ, Devenish RW and Maher DM
Institute of Physics Conference Series. vol. 119, 319-324.  
01-12-1991
bullet iconState of British science
HUMPHREYS C
Nature, Springer Nature vol. 351 (6327), 513-513.  
01-06-1991
bullet iconThe origin of dislocations in multilayers
Humphreys CJ, Maher DM, Eaglesham DJ, Kvam EP and Salisbury IG
Journal De Physique III, Edp Sciences vol. 1 (6), 1119-1130.  
01-06-1991
bullet iconTHE STAR OF BETHLEHEM - A COMET IN 5 BC - AND THE DATE OF THE BIRTH OF CHRIST
HUMPHREYS CJ
Quarterly Journal of The Royal Astronomical Society vol. 32 (4), 389-407.  
01-01-1991
bullet iconTEM STUDY OF NITROGEN ENHANCED OXYGEN PRECIPITATION IN NITROGEN-DOPED CZOCHRALSKI-GROWN SILICON
ZHOU X, PRESTON AR and HUMPHREYS CJ
MICROSCOPY OF SEMICONDUCTING MATERIALS 1991. vol. 117, 211-216.  
01-01-1991
bullet icon100 keV electron beam damage of metals and oxides
Humphreys C
Micron, Elsevier vol. 22 (1-2), 147-148.  
01-01-1991
bullet iconCeramic Superconductors
Humphreys CJ
In Concise Encyclopedia of Advanced Ceramic Materials, Elsevier 67-73.  
01-01-1991

1990

bullet iconCrucifixion date
HUMPHREYS C and WADDINGTON WG
Nature, Springer Nature vol. 348 (6303), 684-684.  
01-12-1990
bullet iconVariation of dislocation morphology with strain in GexSi1−x epilayers on (100)Si
Kvam EP, Maher DM and Humphreys CJ
Journal of Materials Research, Springer Nature vol. 5 (9), 1900-1907.  
01-09-1990
bullet iconThe interaction of electron beams with solids - Some new effects
Humphreys CJ, Bullough TJ, Devenish RW, Maher DM and Turner PS
Microscopy and Microanalysis, Cambridge University Press (Cup) vol. 48 (4), 788-789.  
01-08-1990
bullet iconNanometre hole formation in MgO using electron beams
Turner PS, Bullough TJ, Devenish RW, Maher DM and Humphreys CJ
Philosophical Magazine Letters, Taylor & Francis vol. 61 (4), 181-193.  
01-04-1990
bullet iconOn the microstructural evolution of sintered Bi-Sr-Ca-Cu-O high-Tc superconductors
Zhang JG, McCartney DG and Humphreys CJ
Superconductor Science and Technology, Iop Publishing vol. 3 (4) 
01-04-1990

1989

bullet iconBook Review: Transmission Electron Microscopy. By L. Reimer
Humphreys CJ
Angewandte Chemie International Edition, Wiley vol. 28 (12), 1763-1764.  
01-12-1989
bullet iconTransmission Electron Microscopy. By L. Reimer. Springer Series in Optical Sciences, Springer‐Verlag, Second Edition, 1989, xiii, 547 pp., paperback, DM 128. – ISBN 3‐540‐50499‐0
Humphreys CJ
Angewandte Chemie, Wiley vol. 101 (12), 1803-1804.  
01-12-1989
bullet iconControlling crystal growth
Humphreys C
Nature, Springer Nature vol. 341 (6244), 689-689.  
01-10-1989
bullet iconMaterials Science and Engineering in Britain
Humphreys C
Angewandte Chemie International Edition, Wiley vol. 28 (8), 1077-1078.  
01-08-1989
bullet iconDislocation nucleation near the critical thickness in GeSi/Si strained layers
Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ and Bean JC
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 59 (5), 1059-1073.  
01-05-1989
bullet iconNanolithography using field emission and conventional thermionic electron sources
Devenish RW, Eaglesham DJ, Maher DM and Humphreys CJ
Ultramicroscopy, Elsevier vol. 28 (1-4), 324-329.  
01-04-1989
bullet iconRadiation effects
Humphreys CJ
Ultramicroscopy, Elsevier vol. 28 (1-4), 357-358.  
01-04-1989
bullet iconCompositional modulations in Ge x Si1− x heteroepitaxial layers
Fraser HL, Maher DM, Knoell RV, Eaglesham DJ, Humphreys CJ and Bean JC
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, American Vacuum Society vol. 7 (2), 210-213.  
01-03-1989
bullet iconTetragonal and monoclinic forms of Ge x Si1− x epitaxial layers
Eaglesham DJ, Maher DM, Fraser HL, Humphreys CJ and Bean JC
Applied Physics Letters, Aip Publishing vol. 54 (3), 222-224.  
16-01-1989
bullet iconNew Source of Dislocations in GexSi1-x/Si(100) Strained Epitaxial Layers
Eaglesham DJ, Maher DM, Kvam EP, Bean JC and Humphreys CJ
Physical Review Letters, American Physical Society (Aps) vol. 62 (2), 187-190.  
09-01-1989
bullet iconMaterials science and engineering in Britain
Humphreys C
Advanced Materials, Wiley vol. 1 (8‐9), 249-250.  
01-01-1989
bullet iconDislocation Behaviour in GexSi1-x Epilayers on (001)Si
Kvam EP, Maher DM and Humphreys CJ
Mrs Advances, Springer Nature vol. 160 
01-01-1989
bullet iconElectron Beam Induced Nanometre Hole Formation and Surface Modification in Al, Si And MgO
Bullough TJ, Humphreys CJ and Devenish RW
Mrs Advances, Springer Nature vol. 157 
01-01-1989
bullet iconStrains and Misfit Dislocations at Interfaces
Humphreys CJ, Eaglesham DJ, Maher DM, Fraser HL and Salisbury I
In Evaluation of Advanced Semiconductor Materials by Electron Microscopy, Springer Nature 203-216.  
01-01-1989

1988

bullet iconHigh temperature superconducting ceramics
Eaglesham DJ, Humphreys CJ, Alford NM, Clegg WJ, Harmer MA and Birchall JD
Materials Science and Engineering B, Elsevier vol. 1 (3-4), 229-235.  
01-12-1988
bullet iconX-ray topography of the coherency breakdown in Ge x Si1− x /Si(100)
Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ, Green GS, Tanner BK and Bean JC
Applied Physics Letters, Aip Publishing vol. 53 (21), 2083-2085.  
21-11-1988
bullet iconConvergent-beam imaging—a transmission electron microscopy technique for investigating small localized distortions in crystals
Humphreys CJ, Maher DM, Fraser HL and Eaglesham DJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 58 (5), 787-798.  
01-11-1988
bullet iconChemInform Abstract: Silica‐Supported Fe‐Pd Bimetallic Particles ‐ Formation from Mixed‐Metal Clusters and Catalytic Activity.
BRAUNSTEIN P, DEVENISH R, GALLEZOT P, HEATON BT, HUMPHREYS CJ, KERVENNAL J, MULLEY S and RIES M
Cheminform, Wiley vol. 19 (42), no-no.  
18-10-1988
bullet iconPlasma Anodisation of Silicon for Advanced VLSI
Taylor S, Eccleston W, Ringnalda J, Maher DM, Eaglesham DJ, Humphreys CJ and Godfrey DJ
Journal De Physique Archives, Edp Sciences vol. 49 (C4) 
01-09-1988
bullet iconSilica‐Supported FePd Bimetallic Particles: Formation from Mixed‐Metal Clusters and Catalytic Activity
Braunstein P, Devenish R, Gallezot P, Heaton BT, Humphreys CJ, Kervennal J, Mulley S and Ries M
Angewandte Chemie International Edition, Wiley vol. 27 (7), 927-929.  
01-07-1988
bullet iconFe‐Pd‐Bimetallpartikel auf SiO2‐Trägern – Bildung aus Heterometallclustern und katalytische Aktivität
Braunstein P, Devenish R, Gallezot P, Heaton BT, Humphreys CJ, Kervennal J, Mulley S and Ries M
Angewandte Chemie, Wiley vol. 100 (7), 972-973.  
01-07-1988
bullet iconPlasma anodisation of silicon for advanced VLSI
Taylor S, Eccleston W, Ringnalda J, Maher DM, Eaglesham DJ, Humphreys CJ and Godfrey DJ
European Solid-State Device Research Conference., C4393-C4396.  
01-01-1988
bullet iconCBED and CBIM from semiconductors and superconductors
Humphreys CJ, Eaglesham DJ, Maher DM and Fraser HL
Ultramicroscopy, Elsevier vol. 26 (1-2), 13-23.  
01-01-1988
bullet iconErratum: Limits on quantitative information from high-resolution electron microscopy of YBa2Cu3O7superconductors
Huxford NP, Eaglesham DJ and Humphreys CJ
Nature, Springer Nature vol. 331 (6153), 286-286.  
01-01-1988
bullet iconDislocation Nucleation in GeSi/Si(100) Strained Epilayers
Eaglesham DJ, Kvam EP, Maher DM, Humphreys CJ and Bean JC
Mrs Advances, Springer Nature vol. 138 
01-01-1988

1987

bullet iconLimits on quantitative information from high-resolution electron microscopy of YBa2Cu3O7 superconductors
Huxford NP, Eaglesham DJ and Humphreys CJ
Nature, Springer Nature vol. 329 (6142), 812-813.  
01-10-1987
bullet iconNew phases in the superconducting Y:Ba:Cu:O system
Eaglesham DJ, Humphreys CJ, Alford NM, Clegg WJ, Harmer MA and Birchall JD
Applied Physics Letters, Aip Publishing vol. 51 (6), 457-459.  
10-08-1987
bullet iconTHE ORTHORHOMBIC AND TETRAGONAL PHASES OF Y 1 Ba 2 Cu 3 O 9-y
Eaglesham DJ, Humphreys CJ, Clegg WJ, Harmer MA, AIford NM and Birchall JD
Advanced Ceramic Materials, Wiley vol. 2 (3B), 662-667.  
01-07-1987
bullet iconErratum: White lines in the L2,3 electron-energy-loss and x-ray absorption spectra of 3d transition metals [Phys. Rev. B 34, 1467 (1986)]
Waddington W, Rez P, Grant I and Humphreys C
Physical Review B, American Physical Society (Aps) vol. 35 (10), 5297-5297.  
01-04-1987
bullet iconDetection and measurement of local distortions in a semiconductor layered structure by convergent-beam electron diffraction
Maher DM, Fraser HL, Humphreys CJ, Knoell RV and Bean JC
Applied Physics Letters, Aip Publishing vol. 50 (10), 574-576.  
09-03-1987
bullet iconElectron energy-loss spectroscopy studies of nanometre-scale structures in alumina produced by intense electron-beam irradiation
Berger SD, Salisbury IG, Milne RH, Imeson D and Humphreys CJ
Philosophical Magazine B, Taylor & Francis vol. 55 (3), 341-358.  
01-03-1987
bullet iconAnalytical electron microscopy of [Ni 38 Pt 6 (CO) 48 H] 5–
Heaton BT, Ingallina P, Devenish R, Humphreys CJ, Ceriotti A, Longoni G and Marchionna M
Chemical Communications, Royal Society of Chemistry (Rsc) (10), 765-766.  
01-01-1987
bullet iconThe Nucleation and Propagation of Misfit Dislocations aear the Critical Thickness in Ge-Si Strained Epilayers
Kvam EP, Eaglesham DJ, Maher DM, Humphreys CJ, Bean JC, Green GS and Tanner BK
Mrs Advances, Springer Nature vol. 104 
01-01-1987
bullet iconHigh Resolution Electron Microscopy and Convergent Beam Electron Diffraction of Semiconductor Quantum Well Structures
Humphreys CJ
In Thin Film Growth Techniques For Low-Dimensional Structures, Springer Nature 459-469.  
01-01-1987

1986

bullet iconSTEM/EDX MICOANALYSIS OF COMPOSITIONAL FLUCTUATIONS IN SEMICONDUCTOR MULTI-QUANTUM-WELL STRUCTURES.
Bullock JF, Titchmarsh JM and Humphreys CJ
Semiconductor Science and Technology vol. 1 (6), 342-345.  
01-12-1986
bullet iconSTEM/EDX microanalysis of compositional fluctuations in semiconductor multi-quantum-well structures
Bullock JF, Titchmarsh JM and Humphreys CJ
Semiconductor Science and Technology, Iop Publishing vol. 1 (6) 
01-12-1986
bullet iconWhite lines in the L2,3 electron-energy-loss and x-ray absorption spectra of 3d transition metals
Waddington WG, Rez P, Grant IP and Humphreys CJ
Physical Review B, American Physical Society (Aps) vol. 34 (3), 1467-1473.  
01-08-1986
bullet iconElectron‐beam damage observed in the fast proton conductor ammonium/hydronium β''‐alumina: a high‐resolution electron microscope (HREM) study
Petford AK and Humphreys CJ
Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, International Union of Crystallography (Iucr) vol. 42 (3), 224-229.  
01-06-1986
bullet iconCompositional Studies of Semiconductor Alloys by Bright Field Electron Microscope Imaging of Wedged Crystals
Eaglesham DJ, Hetherington CJD and Humphreys CJ
Mrs Advances, Springer Nature vol. 77 
01-01-1986

1985

bullet iconCRYSTALLINE EFFECTS IN THE ANALYSIS OF SEMICONDUCTOR MATERIALS USING AUGER ELECTRONS OR X-RAYS.
Bullock JF, Humphreys CJ, Mace AJW, Bishop HE and Titchmarsh JM
Institute of Physics Conference Series. (76), 405-410.  
01-12-1985
bullet iconDETECTION OF LOCAL STRAINS IN STRAINED LAYER SUPERLATTICES.
Fraser HL, Maher DM, Humphreys CJ, Hetherington CJD, Knoell RV and Bean JC
Institute of Physics Conference Series. (76), 307-312.  
01-12-1985
bullet iconGeometric and electronic structure of a semiconductor superlattice
Davies RA, Kelly MJ, Kerr TM, Hetherington CJD and Humphreys CJ
Nature, Springer Nature vol. 317 (6036), 418-419.  
01-10-1985
bullet iconSurface physics: Hopping atoms in crystal growth
Humphreys CJ
Nature, Springer Nature vol. 317 (6032), 16-16.  
01-09-1985
bullet iconStructure of the Al/Al2O3 interface
Timsit RS, Waddington WG, Humphreys CJ and Hutchison JL
Applied Physics Letters, Aip Publishing vol. 46 (9), 830-832.  
01-05-1985
bullet iconExamination of the Al/Al2O3 interface by high-resolution electron microscopy
Timsit RS, Waddington WG, Humphreys CJ and Hutchison JL
Ultramicroscopy, Elsevier vol. 18 (1-4), 387-394.  
01-01-1985

1984

bullet iconNanometer scale electron beam lithography in inorganic materials
Salisbury IG, Timsit RS, Berger SD and Humphreys CJ
Applied Physics Letters, Aip Publishing vol. 45 (12), 1289-1291.  
15-12-1984
bullet iconMICRO-84: Electron microscopy 50 years on
Humphreys CJ
Nature, Springer Nature vol. 311 (5981), 12-12.  
01-09-1984
bullet iconThe atomic structure of the NiSi2-(001)Si interface
Cherns D, Hetherington CJD and Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 49 (1), 165-177.  
01-07-1984
bullet iconCrytallography: Defects in reduced oxides
Humphreys CJ
Nature, Springer Nature vol. 309 (5966), 310-310.  
01-05-1984
bullet iconCHANNELLING RADIATION IN ELECTRON MICROSCOPY.
Spence JCH and Humphreys CJ
Optik (Jena) vol. 66 (3), 225-242.  
01-01-1984
bullet iconThe energy dependence of axial coherent bremsstrahlung at low accelerating voltages
Butler JH, Spence JCH, Reese G, Humphreys CJ and Doole RC
Radiation Effects and Defects in Solids, Taylor & Francis vol. 84 (3-4), 245-256.  
01-01-1984

1983

bullet iconHigh resolution electron microscopy of silver β- and β″ -aluminas
Hull R, Petford AK, Humphreys CJ and Smith DJ
Solid State Ionics, Elsevier vol. 9, 181-186.  
01-12-1983
bullet iconHIGH VOLTAGE ELECTRON MICROSCOPY - PRESENT ACHIEVEMENTS AND FUTURE PROSPECTS.
Humphreys CJ
Lawrence Berkeley Laboratory (Report) LBL., 1-4.  
01-12-1983
bullet iconDating the Crucifixion
Humphreys CJ and Waddington WG
Nature, Springer Nature vol. 306 (5945), 743-746.  
01-12-1983
bullet iconATOMIC STRUCTURE OF THE NiSi//2/(001) Si INTERFACE.
Hetherington CJD, Cherns D and Humphreys CJ
Institute of Physics Conference Series. (67), 89-94.  
01-12-1983
bullet iconA high‐resolution electron microscopic study of defects in sodium β′″‐alumina
Hull R, Smith DJ and Humphreys CJ
Journal of Microscopy, Wiley vol. 130 (2), 203-214.  
01-05-1983
bullet iconElectron beam writing on a 20-Å scale in metal β-aluminas
Mochel ME, Humphreys CJ, Eades JA, Mochel JM and Petford AM
Applied Physics Letters, Aip Publishing vol. 42 (4), 392-394.  
15-02-1983

1981

bullet iconFundamental concepts of stem imaging
Humphreys CJ
Ultramicroscopy, Elsevier vol. 7 (1), 7-12.  
01-01-1981
bullet iconRESOLUTION AND ILLUMINATION COHERENCE IN ELECTRON MICROSCOPY.
Humphreys CJ and Spence JCH
Optik (Jena) vol. 58 (2), 125-142.  
01-01-1981

1980

bullet iconA multiple scattering transport theory for electron
Spencer JP and Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 42 (4), 433-451.  
01-10-1980
bullet iconThe critical‐voltage effect in convergent‐beam high‐voltage electron diffraction
Sellar JR, Imeson D and Humphreys CJ
Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 36 (4), 686-696.  
01-07-1980
bullet iconThe combined convergent beam/critical voltage technique in high voltage electron microscopy
Sellar JR, Imeson D and Humphreys CJ
Micron (1969), Elsevier vol. 11 (3-4), 241-242.  
01-01-1980

1979

bullet iconThe scattering of fast electrons by crystals
Humphreys CJ
Reports On Progress in Physics, Iop Publishing vol. 42 (11) 
01-11-1979
bullet iconA theoretical study of temperature distributions during Czochralski crystal growth
Buckley-golder IM and Humphreys CJ
The Philosophical Magazine a Journal of Theoretical Experimental and Applied Physics, Taylor & Francis vol. 39 (1), 41-57.  
01-01-1979

1977

bullet iconAdditional image peaks in the high resolution imaging of dislocations
Humphreys CJ, Drummond RA, Hart-davis A and Butler EP
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 35 (6), 1543-1555.  
01-06-1977
bullet iconThe distribution of intensity in electron diffraction patterns due to phonon scattering
Rez P, Humphreys CJ and Whelan MJ
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 35 (1), 81-96.  
01-01-1977
bullet iconHIGH RESOLUTION IMAGING OF DEFECTS.
Humphreys CJ and Drummond RA
Inst Phys Conf Ser. (36), 241-246.  
01-01-1977

1976

bullet iconDISTRIBUTION OF PHONON SCATTERED ELECTRONS IN HIGH ENERGY ELECTRON DIFFRACTION PATTERNS.
Rez P, Humphreys CJ and Whelan MJ
 
01-01-1976
bullet iconSPURIOUS PEAKS IN WEAK-BEAM IMAGES.
Humphreys CJ and Hart-Davis A
 
01-01-1976

1974

bullet iconA theoretical model for the energy dependence of electron channelling patterns in scanning electron microscopy
Sandström R, Spencer JF and Humphreys CJ
Journal of Physics D, Iop Publishing vol. 7 (7) 
01-05-1974
bullet iconELECTRON CHANNELLING PATTERNS FROM DEFORMED CRYSTALS.
Spencer JP, Booker GR, Humphreys CJ and Joy DC
 
01-01-1974
bullet iconRecent applications of high voltage electron microscopy in various branches of science
Humphreys CJ
Microscope vol. 22 (2), 129-140.  
01-01-1974

1973

bullet iconSCANNING ELECTRON MICROSCOPY/1972. PROC I: 5TH ANNUAL SCANNING ELECTRON MICROSCOPE SYMPOSIUM, APR 1972; II: WORKSHOP ON BIOLOGICAL SPECIMEN PREPARATION FOR SCANNING ELECTRON MICROSCOPY, APR 1972.
Humphreys CJ, Spencer JP, Woolf RJ, Joy DC, Titchmarsh JM, Booker GR, Strojnik A, STickler R, Howell PGT, Boyde A, Brandis EK, Johari O and DeNee PB
 
01-01-1973

1972

bullet iconA dynamical theory for the contrast of perfect and imperfect crystals in the scanning electron microscope using backscattered electrons
Spencer JP, Humphreys CJ and Hirsch PB
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 26 (1), 193-213.  
01-07-1972
bullet iconThe optimum voltage in very high voltage electron microscopy
Humphreys CJ
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 25 (6), 1459-1472.  
01-06-1972
bullet iconThe critical voltage effect in high voltage electron microscopy
Lally JS, Humphreys CJ, Metherell AJF and Fisher RM
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 25 (2), 321-343.  
01-02-1972

1971

bullet iconMaximizing the penetration in high voltage electron microscopy
Humphreys CJ, Thomas LE, Lally JS and Fisher RM
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 23 (181), 87-114.  
01-01-1971
bullet iconBloch wave notation in many‐beam electron diffraction theory
Humphreys CJ and Fisher RM
Acta Crystallographica Section a: Foundations and Advances, International Union of Crystallography (Iucr) vol. 27 (1), 42-45.  
01-01-1971

1970

bullet iconKikuchi patterns in a high voltage electron microscope
Thomas LE and Humphreys CJ
Physica Status Solidi (a) – Applications and Materials Science, Wiley vol. 3 (3), 599-615.  
16-11-1970
bullet iconHigh resolution divergent-beam X-ray topography
Tanner BK and Humphreys CJ
Journal of Physics D, Iop Publishing vol. 3 (7) 
01-07-1970
bullet iconAspects of Bloch-Wave Channeling in High-Voltage Electron Microscopy
Humphreys CJ and Lally JS
Journal of Applied Physics, Aip Publishing vol. 41 (1), 232-235.  
01-01-1970
bullet iconRadiation damage of polymers in the million volt electron microscope
Thomas LE, Humphreys CJ, Duff WR and Grubb DT
Radiation Effects and Defects in Solids, Taylor & Francis vol. 3 (1), 89-91.  
01-01-1970

1969

bullet iconInelastic scattering of fast electrons by crystals
Humphreys CJ and Whelan MJ
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 20 (163), 165-172.  
01-07-1969

1968

bullet iconAbsorption parameters in electron diffraction theory
Humphreys CJ and Hirsch PB
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 18 (151), 115-122.  
01-07-1968

1967

bullet iconSome electron diffraction contrast effects at planar defects in crystals
Humphreys CJ, Howie A and Booker GR
The London Edinburgh and Dublin Philosophical Magazine and Journal of Science, Taylor & Francis vol. 15 (135), 507-522.  
01-03-1967

Grants of specific relevance to the Centre for Sustainable Engineering

solid heart iconGrants of specific relevance to the Centre for Sustainable Engineering
bullet iconParagraf PhD Studentship Contribution (Linked to WT 6349893)
Colin Humphreys
£70,155 Paragraf Paragraf Limited
01-01-2022 - 31-12-2025
bullet iconParagraf support fund - Rajveer Singh Rajaura (PhD Stipend Top-Up & Consumables Only)
Colin Humphreys
£33,540 Paragraf Paragraf Limited
01-08-2021 - 31-07-2025


bullet iconHS Barlow Charitable Trust PhD Studentship Contribution (Linked to WT 6767036)
Colin Humphreys
£45,000 HS Barlow Charitable Trust
01-01-2022 - 31-12-2024
bullet iconParagraf 6 weeks support fund - Zhichao Weng
Colin Humphreys
£43,907 Paragraf Paragraf Limited
01-01-2021 - 05-05-2021
bullet iconReplacing Indium Tin Oxide (ITO) with next-generation graphene in electronic devices
Colin Humphreys and William Gillin
£159,316 Innovate UK
01-01-2019 - 30-09-2020